scholarly journals In vitro Evaluation of Structural Factors Favouring Bacterial Adhesion on Orthodontic Adhesive Resins

2021 ◽  
Author(s):  
Roberta Condò ◽  
Gianluca Mampieri ◽  
Guido Pasquantonio ◽  
Aldo Giancotti ◽  
Paola Pirelli ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Bacterial Adhesion ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Structural Factors ◽  
Adhesive Material ◽  
Internal Structures ◽  
Structural Nature ◽  
Beam Technique

Bacterial adhesion to the surface of the adhesive material is an important step in the formation of plaque and enamel demineralization. In order to correlate the material composition to the specific surface roughness of the resin and to the probable more favourable adhesion of bacteria, scanning electron microscopy, combined with focus ion bean micromachining, together with stylus profilometry analysis have been in vitro performed to reveal the structural nature of three orthodontic adhesive resins used for bracket bonding and, above all, to understand how compositional factors can influence specific pivotal properties such as material’s surface roughness and robustness. In particular, we speculated about the morphological features that determine an increase in the bacterial adhesion and we proposed focused ion beam technique as a valuable tool to compare the internal structures of the polymers and to determine the peculiar mechanical properties of the examined adhesive resins.

scholarly journals In Vitro Evaluation of Structural Factors Favouring Bacterial Adhesion on Orthodontic Adhesive Resins

Materials ◽  
2021 ◽  
Vol 14 (10) ◽  
pp. 2485
Author(s):  
Roberta Condò ◽  
Gianluca Mampieri ◽  
Guido Pasquantonio ◽  
Aldo Giancotti ◽  
Paola Pirelli ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Bacterial Adhesion ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Composite Resins ◽  
Structural Factors ◽  
Internal Structures ◽  
Orthodontic Materials ◽  
Combine Information

Bacterial adhesion to the surface of orthodontic materials is an important step in the formation and proliferation of plaque bacteria, which is responsible for enamel demineralization and periodontium pathologies. With the intent of investigating if adhesive resins used for bracket bonding are prone to bacteria colonization, the surface roughness of these materials has been analyzed, combining information with a novel methodology to observe the internal structures of orthodontic composites. Scanning electron microscopy, combined with focus ion bean micromachining and stylus profilometry analyses, were performed to evaluate the compositional factors that can influence specific pivotal properties facilitating the adhesion of bacteria to the surface, such as surface roughness and robustness of three orthodontic adhesive composite resins. To confirm these findings, contact angle measurements and bacteria incubation on resin slide have been performed, evaluating similarities and differences in the final achievement. In particular, the morphological features that determine an increase in the resins surface wettability and influence the bacterial adhesion are the subject of speculation. Finally, the focused ion beam technique has been proposed as a valuable tool to combine information coming from surface roughness with specific the internal structures of the polymers.

Machining of Acrylic Resin Using Monocrystalline Diamond Endmill with Cutting Edges Formed by Focused Ion Beam

2013 ◽  
Vol 7 (6) ◽  
pp. 638-643
Author(s):  
Tsunehisa Suzuki ◽  
◽  
Hiroshi Saito
Keyword(s):  
Surface Roughness ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Acrylic Resin ◽  
Rake Angle ◽  
Cutting Edge ◽  
Cutting Resistance ◽  
Depth Direction ◽  
Beam Technique ◽  
Monocrystalline Diamond

The cutting edge of a single-blade monocrystalline diamond endmill was formed using the Focused Ion Beam technique (FIB): the cutting edge was mechanically polished to a rake angle of -70° and then formed to a rake angle of 0° by FIB sputtering. The performance of the diamond endmill was evaluated for the machining of acryl resin. Grooves were cut into optical acrylic resin with the resulting endmill; characteristics such as the surface roughness, cutting resistance, and chip shape were evaluated. The improved sharpness of the cutting edge reduced the surface roughness and cutting force in the depth direction. The surface roughness did not fluctuate even under the conditions of a fast feed rate and deep cutting depth. A cutter mark was observed on the finished surface, and flowing chips were generated unlike the performance of the -70° rake angle cutter.

Ferroelectric nanostructures via a modified focused ion beam technique

2005 ◽  
Vol 17 (1) ◽  
pp. 338-343 ◽  
Author(s):  
V Nagarajan ◽  
A Stanishevsky ◽  
R Ramesh
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Beam Technique

Surface roughness of a Co-less WC micro-die fabricated by focused-ion-beam machining

2004 ◽  
Vol 84 (3) ◽  
pp. 149-155 ◽  
Author(s):  
Hiroyuki Hosokawa ◽  
Koji Shimojima ◽  
Mamoru Mabuchi
Keyword(s):  
Surface Roughness ◽  
Focused Ion Beam ◽  
Ion Beam

Assessment of Deformation using the Focused Ion Beam Technique

2000 ◽  
Vol 6 (S2) ◽  
pp. 530-531
Author(s):  
M.G. Burke ◽  
P.T. Duda ◽  
G. Botton ◽  
M. W. Phaneuf
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Site Specificity ◽  
Alloy 600 ◽  
The Past ◽  
Transmission Electron ◽  
Wide Range ◽  
Potential Applications ◽  
Beam Technique ◽  
Significant Attention

Focused Ion Beam (FIB) micromachining techniques have gained significant attention over the past few years as a promising method for the preparation of a variety of metallic and nonmetallic materials for subsequent characterization using transmission electron microscopy (TEM) The advantage of the FIB in terms of site specificity and speed for the preparation of uniform electron transparent sections has opened a wide range of potential applications in materials characterization. The ability to image the sample in the FIB can also provide important microstructural data for materials analysis. In this study, both conventionally electropolished and FIB-ed specimens were prepared in order to characterize the microstructure of a commercially-produced tube of Alloy 600 (approximately Ni-15 Cr-10 Fe- 0.05 C). The electropolished samples were prepared using a solution of 20% HClO4 - 80% CH3OH at ∼-40°C. The FIB sections were obtained from a cross-section of the tube that had been mechanically thinned to ∼100 μm. The section was thinned in a Micrion 2500 FIB system with a Ga ion beam at 50 kV accelerating voltage.

scholarly journals FIB-SEM Three-Dimensional Tomography for Characterization of Carbon-Based Materials

2019 ◽  
Vol 2019 ◽  
pp. 1-8 ◽  
Author(s):  
Nan Nan ◽  
Jingxin Wang
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Three Dimensional ◽  
3D Tomography ◽  
Tomography System ◽  
Internal Structures ◽  
Potential Applications ◽  
Scanning Electron ◽  
Carbon Based

A review on the recent advances of the three-dimensional (3D) characterization of carbon-based materials was conducted by focused ion beam-scanning electron microscope (FIB-SEM) tomography. Current studies and further potential applications of the FIB-SEM 3D tomography technique for carbon-based materials were discussed. The goal of this paper is to highlight the advances of FIB-SEM 3D reconstruction to reveal the high and accurate resolution of internal structures of carbon-based materials and provide suggestions for the adoption and improvement of the FIB-SEM tomography system for a broad carbon-based research to achieve the best examination performances and enhance the development of innovative carbon-based materials.

Sign in / Sign up

Export Citation Format

Share Document