A study of defect sub-structures in the Fe–Cr sigma phase by means of transmission electron microscopy

1962 ◽  
Vol 7 (78) ◽  
pp. 1025-1059 ◽  
Author(s):  
M. J. Marcinkowski ◽  
D. S. Miller
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Sigma Phase ◽  
Transmission Electron ◽  
Means Of Transmission

Structural Properties of Amorphous Silicon Produced by Electron Irradiation

1999 ◽  
Vol 557 ◽  
Author(s):  
J. Yamasaki ◽  
S. Takeda
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Distribution Function ◽  
Structural Properties ◽  
Electron Irradiation ◽  
Low Temperatures ◽  
Crystalline Silicon ◽  
Transmission Electron ◽  
Amorphous Si ◽  
Means Of Transmission

AbstractThe structural properties of the amorphous Si (a-Si), which was created from crystalline silicon by 2 MeV electron irradiation at low temperatures about 25 K, are examined in detail by means of transmission electron microscopy and transmission electron diffraction. The peak positions in the radial distribution function (RDF) of the a-Si correspond well to those of a-Si fabricated by other techniques. The electron-irradiation-induced a-Si returns to crystalline Si after annealing at 550°C.

Microstructure of Cr100−xAlx alloys (10 at% ≲x ≲ 33 at%) studied by means of transmission electron microscopy and diffraction. I. Microstructure of the β-phase

1981 ◽  
Vol 67 (1) ◽  
pp. 217-232 ◽  
Author(s):  
G. van Tendeloo ◽  
F. J. A. den Broeder ◽  
S. Amelinckx ◽  
R. de Ridder ◽  
J. van Landuyt ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Β Phase ◽  
Transmission Electron ◽  
Means Of Transmission

scholarly journals The Transport System of Nacre Components through the Surface Membrane of Gastropods

2016 ◽  
Vol 672 ◽  
pp. 103-112 ◽  
Author(s):  
Elena Macías-Sánchez ◽  
Antonio G. Checa ◽  
Marc G. Willinger
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Calcium Carbonate ◽  
Lamellar Structure ◽  
Surface Membrane ◽  
Organic Matrix ◽  
X Ray ◽  
Transmission Electron ◽  
Means Of Transmission ◽  
Electron Energy Loss

The surface membrane is a lamellar structure exclusive of gastropods that is formed during the shell secretion. It protects the surface of the growing nacre and it is located between the mantle epithelium and the mineralization compartment. At the mantle side of the surface membrane numerous vesicles provide material, and at the nacre side, the interlamellar membranes detach from the whole structure. Components of nacre (glycoproteins, polysaccharides and calcium carbonate) cross the structure to reach the mineralization compartment, but the mechanism by which this occurs is still unknown. In this paper we have investigated the ultrastructure of the surface membrane and the associated vesicle layer by means of Transmission Electron Microscopy. Electron Energy Loss Spectroscopy and Energy-dispersive X-ray Spectroscopy were used for elemental analysis. The analyses revealed the concentration of calcium in the studied structures: vesicles, surface membrane, and interlamellar membranes. We discuss the possible linkage of calcium to the organic matrix.

Mechanisms of misfit strain relaxation in epitaxially grown BLT (Bi4-xLaxTi3O12, x = 0.75) thin films

2003 ◽  
Vol 779 ◽  
Author(s):  
Hyung Seok Kim ◽  
Sang Ho Oh ◽  
Ju Hyung Suh ◽  
Chan Gyung Park
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Strain Relaxation ◽  
Lattice Misfit ◽  
Misfit Strain ◽  
Misfit Dislocations ◽  
Transmission Electron ◽  
Means Of Transmission ◽  
20 Nm

AbstractMechanisms of misfit strain relaxation in epitaxially grown Bi4-xLaxTi3O12 (BLT) thin films deposited on SrTiO3 (STO) and LaAlO3 (LAO) substrates have been investigated by means of transmission electron microscopy (TEM). The misfit strain of 20 nm thick BLT films grown on STO substrate was relaxed by forming misfit dislocations at the interface. However, cracks were observed in 100 nm thick BLT films grown on the same STO. It was confirmed that cracks were formed because of high misfit strain accumulated with increasing the thickness of BLT, that was not sufficiently relaxed by misfit dislocations. In the case of the BLT film grown on LAO substrate, the magnitude of lattice misfit between BLT and LAO was very small (~1/10) in comparison with the case of the BLT grown on STO. The relatively small misfit strain formed in layered structure of the BLT films on LAO, therefore, was easily relaxed by distorting the film, rather than forming misfit dislocations or cracks, resulting in misorientation regions in the BLT film.

Plasticity of decagonal Al73Ni10Co17 quasicrystals

2003 ◽  
Vol 805 ◽  
Author(s):  
Peter Schall ◽  
Michael Feuerbacher ◽  
Knut Urban
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Plastic Deformation ◽  
Deformation Mechanisms ◽  
Compression Tests ◽  
Compression Axis ◽  
Decagonal Quasicrystal ◽  
Transmission Electron ◽  
Axis Parallel ◽  
Means Of Transmission

ABSTRACTWe present a study of the deformation mechanism of decagonal Al73Ni10Co17 quasicrystals by means of transmission electron microscopy. We performed compression tests on single-quasicrystalline samples in three different orientations: with the compression axis parallel to, inclined by 45 ° and perpendicular to the tenfold axis of the decagonal quasicrystal. The deformed samples reveal characteristic orientation-dependent dislocation structures leading us to the conclusion that fundamentally different deformation mechanisms are involved in plastic deformation in the three deformation geometries. We explicitly identified the Burgers vectors of the dislocations as interatomic vectors in the structure of decagonal Al-Ni-Co.

Investigation of Multiply Twins in Mn2.02Co0.98O4Ceramic by Means of Transmission Electron Microscopy

2016 ◽  
Vol 99 (10) ◽  
pp. 3458-3466 ◽  
Author(s):  
Chengjian Ma ◽  
Yunfei Liu ◽  
Yinong Lyu
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Transmission Electron ◽  
Means Of Transmission

A novel mosaic-like structure in SrTiO3 thin films on a Pt(001) surface revealed by transmission electron microscopy

1996 ◽  
Vol 11 (11) ◽  
pp. 2777-2784 ◽  
Author(s):  
S. Takeno ◽  
S. Nakamura ◽  
K. Abe ◽  
S. Komatsu
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
High Resolution Imaging ◽  
Antiphase Boundaries ◽  
Growth Modes ◽  
Transmission Electron ◽  
Interfacial Structures ◽  
Resolution Imaging ◽  
Means Of Transmission

A novel mosaic-like structure in SrTiO3 thin films was discovered and characterized by means of transmission electron microscopy (TEM). The films were deposited on a (001) oriented Pt surface. The orientation relationship between SrTiO3 film and Pt substrate was determined, and four types of growth modes were revealed. These four growth modes formed four types of domains, respectively, and these domains and Pt formed peculiarly ordered interfacial structures, i.e., near coincidence site lattices. Antiphase boundaries between two adjacent domains were also observed by high-resolution imaging.

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