High-resolution high-sensitivity elemental imaging by secondary ion mass spectrometry: from traditional 2D and 3D imaging to correlative microscopy

2015 ◽  
Vol 26 (43) ◽  
pp. 434001 ◽  
Author(s):  
T Wirtz ◽  
P Philipp ◽  
J-N Audinot ◽  
D Dowsett ◽  
S Eswara
2008 ◽  
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Author(s):  
Sutapa Ghosal ◽  
Stewart J. Fallon ◽  
Terrance J. Leighton ◽  
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Michael J. Kristo ◽  
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2014 ◽  
Vol 59 (2) ◽  
pp. 173-180 ◽  
Author(s):  
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Katie L. Moore ◽  
David Paterson ◽  
Martin D. de Jonge ◽  
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...  

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