A comparative study on radiation reliability of composite channel InP high electron mobility transistors
2006 ◽
Vol 21
(6)
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pp. 781-785
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2005 ◽
1997 ◽
Vol 15
(5)
◽
pp. 1773
◽
2008 ◽
Vol 47
(4)
◽
pp. 2828-2832
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