Vertical MBE Growth of Si Fins on Sub-10 nm Patterned Substrate for High-Performance FinFET Technology

2021 ◽  
Author(s):  
Shuang Sun ◽  
JianHuan Wang ◽  
BaoTong Zhang ◽  
XiaoKang Li ◽  
QiFeng Cai ◽  
...  
1990 ◽  
Vol 198 ◽  
Author(s):  
R.J. Koestner ◽  
M.W. Goodwin ◽  
H.F. Schaake

ABSTRACTHgCdTe heterostructures consisting of a thin n-type widegap (250 meV or 5 μm cutoff) layer deposited on an n-type narrowgap (100-125 meV or 10-13 μm cutoff) layer offer the promise of very high performance metal-insulator-semiconductor (MIS) photocapacitors for long wavelength infrared (LWIR) detection. Molecular Beam Epitaxy (MBE) is a candidate growth technology for these two layer films due to its fine control in composition, thickness and doping concentration. The critical materials issues are reducing the defect content associated with twins in the grown layers, achieving low net donor concentrations in the widegap layer, and avoiding the formation of misfit dislocations at the HgCdTe heterointerface. This paper will report on our recent progress in these directions.


1998 ◽  
Vol 43-44 ◽  
pp. 409-414 ◽  
Author(s):  
Jiang Jian ◽  
Joe X Zhou ◽  
Zhantian Zhong ◽  
Chua Soo-Jin

1989 ◽  
Author(s):  
Y. C. Kao ◽  
A. C. Seabaugh ◽  
H. Y. Liu ◽  
T. S. Kim ◽  
M. A. Reed ◽  
...  

2005 ◽  
Vol 73 (2) ◽  
pp. 212-219 ◽  
Author(s):  
N. D. Machtay ◽  
R. V. Kukta

Self-assembly of strained epitaxial deposits (islands) grown on a substrate is a promising route to fabricate nanostructures of significance for electronic and optoelectronic devices. The challenge is to achieve specific island arrangements that are required for device functionality and high performance. This article investigates growth on a topographically patterned substrate as a means to control the arrangement of islands. By taking free energy to consist of elastic energy and surface energy, minimum energy configurations are calculated for islands on a raised substrate mesa. Configurations of one, two, and three islands at different positions on the mesa are considered to determine their relative energies as a function of mesa size, island size, mismatch strain between the island and substrate materials, surface energy, and elastic moduli. Insight is offered on the mechanisms responsible for certain physical observations such as a transition from the formation of multiple islands to a single island as mesa size is reduced.


IUCrJ ◽  
2021 ◽  
Vol 8 (3) ◽  
pp. 462-467
Author(s):  
Hoki Son ◽  
Ye-ji Choi ◽  
Soon-Ku Hong ◽  
Ji-Hyeon Park ◽  
Dae-Woo Jeon

The compound α-Ga2O3 is an ultra-wide-bandgap semiconductor and possesses outstanding properties such as a high breakdown voltage and symmetry compared with other phases. It has been studied for applications in high-performance power devices. However, it is difficult to obtain a high-quality thin films because α-Ga2O3 can only grow heteroepitaxially, which results in residual stress generation owing to lattice mismatch and thermal expansion between the substrate and α-Ga2O3. To overcome this, α-Ga2O3 was grown on a conical frustum-patterned sapphire substrate by halide vapor-phase epitaxy. The surface morphology was crack-free and flat. The α-Ga2O3 grown on a frustum-patterned substrate and a conventional sapphire substrate at 500°C exhibited full-width at half-maxima of 961 and 1539 arcsec, respectively, for 10–12 diffraction. For the former substrate, lateral growth on the pattern and threading dislocation bending towards the pattern suppressed the propagation of threading dislocations generated at the interface, which reduced the threading dislocation propagation to the surface by half compared with that on the latter conventional substrate. The results suggest that conical frustum-patterned sapphire substrates have the potential to produce high-quality α-Ga2O3 epilayers.


2015 ◽  
Vol 23 (3) ◽  
pp. 2720 ◽  
Author(s):  
L. H. Li ◽  
J. X. Zhu ◽  
L. Chen ◽  
A. G. Davies ◽  
E. H. Linfield

1992 ◽  
Vol 281 ◽  
Author(s):  
E. T. Croke ◽  
M. J. Harrell ◽  
M. E. Mierzwinski ◽  
J. D. Plummer

ABSTRACTThrough the use of low temperature Si molecular beam epitaxy (MBE), we have fabricated high performance Si1−x Gex/Si heterojunction bipolar transistors (HBTs) and bipolar inversion-channel field effect transistors (BICFETs). Our growth method employs a high temperature Si-assisted desorption followed by MBE growth at a temperature only slightly in excess of the critical temperature for two-dimensional layer-by-layer growth. [1] At this temperature, segregation of Sb has previously been shown to be kinetically limited. [2] In addition, significantly more strain can be frozen into such an epitaxial layer as compared with those grown at higher temperatures.[3] Secondary ion mass spectroscopy (SIMS) data verify the abruptness of the Sb doping profiles in our device structures. High resolution x-ray diffraction (HRXRD) data are consistent with planar, coherently strained Si1−x Gex layers in our HBTs. A gain of 2690 (3210) is observed in our BICFETs at 300 K (7 K).


2020 ◽  
Vol 53 (13) ◽  
pp. 135110
Author(s):  
Heming Yang ◽  
Yuanliao Zheng ◽  
Zhou Tang ◽  
Ning Li ◽  
Xiaohao Zhou ◽  
...  

1996 ◽  
Vol 421 ◽  
Author(s):  
R. D. Rajavel ◽  
O.K. Wu ◽  
J.E. Jensen ◽  
C.A. Cockrum ◽  
G.M. Venzor ◽  
...  

Abstractstructural, optical and electrical properties were evaluated. Significant progress has been made toward the growth of high performance HgCdTe devices by molecular beam epitaxy. Long wave infrared detectors operating at 9.9 μm at 78K exhibited a mean RoAo product of 1170 Ωcm2 at 0-fov. Very long wave infrared detectors operating at 14 μm at 78K exhibited a mean RoA product of 3.5 Ωcm2 at f/2 fov. These values represent the state-of-the- art for molecular beam epitaxially grown HgCdTe detectors.


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