A multi-path gated ring oscillator based time-to-digital converter in 65 nm CMOS technology

2013 ◽  
Vol 34 (3) ◽  
pp. 035004 ◽  
Author(s):  
Chen Jiang ◽  
Yumei Huang ◽  
Zhiliang Hong
Keyword(s):  
Cmos Technology ◽  
Ring Oscillator ◽  
Digital Converter ◽  
Time To Digital Converter

scholarly journals Radiation Assessment of a 15.6ps Single-Shot Time-to-Digital Converter in Terms of TID

Electronics ◽  
2019 ◽  
Vol 8 (5) ◽  
pp. 558 ◽  
Author(s):  
Bjorn Van Bockel ◽  
Jeffrey Prinzie ◽  
Paul Leroux
Keyword(s):  
Complementary Metal Oxide Semiconductor ◽  
Cmos Technology ◽  
Ring Oscillator ◽  
Oxide Semiconductor ◽  
Single Shot ◽  
Digital Converter ◽  
Time To Digital Converter ◽  
Pvt Variations ◽  
Radiation Tolerant ◽  
Radiation Measurements

This article presents a radiation tolerant single-shot time-to-digital converter (TDC) with a resolution of 15.6 ps, fabricated in a 65 nm complementary metal oxide semiconductor (CMOS) technology. The TDC is based on a multipath pseudo differential ring oscillator with reduced phase delay, without the need for calibration or interpolation. The ring oscillator is placed inside a Phase Locked Loop (PLL) to compensate for Process, Voltage and Temperature (PVT) variations- and variations due to ionizing radiation. Measurements to evaluate the performance of the TDC in terms of the total ionizing dose (TID) were done. Two different samples were irradiated up to a dose of 2.2 MGy SiO 2 while still maintaining a resolution of 15.6 ps. The TDC has a differential non-linearity (DNL) and integral non-linearity (INL) of 0.22 LSB rms and 0.34 LSB rms respectively.

A Low-Power High-Linear Time-to-Digital Converter for Measuring R-R Intervals in ECG Signal Optimized by Neural Network and TLBO Algorithm

2018 ◽  
Vol 28 (02) ◽  
pp. 1950021
Author(s):  
B. Ghanavati ◽  
E. Abiri ◽  
M. R. Salehi ◽  
N. Azhdari
Keyword(s):  
Neural Network ◽  
Dynamic Range ◽  
Linear Time ◽  
Optimization Method ◽  
Cmos Technology ◽  
Time Interval ◽  
Digital Converter ◽  
Two Stage ◽  
Time To Digital Converter ◽  
Tlbo Algorithm

In this paper, a two-stage time interpolation time-to-digital converter (TDC) is proposed to achieve adequate resolution and wide dynamic range for measuring R-R intervals in QRS detection. The architecture is based on a coarse counter and a couple of two-stage interpolator circuit in order to improve the conversion linearity. The proposed TDC is modeled with the neural network, while the teacher–learner-based optimization algorithm (TLBO) is used to optimize the integral nonlinearity (INL) of the proposed TDC. The proposed optimization method shows a characteristic close to the ideal output of the TDC behavior over a wide input range. Using the achieved results of the TLBO algorithm simulation results using CADENCE VIRTUOSO and standard 180[Formula: see text]nm CMOS technology shows 1.2[Formula: see text]s dynamic range, 100[Formula: see text]ns resolution, 0.19[Formula: see text]mW power consumption and area of 0.16[Formula: see text]mm2. The proposed circuit can find application in biomedical engineering systems and other fields where long and accurate time interval measurement is needed.

A 9 Bit, 3.6 ps Resolution Pipeline Time-to-Digital Converter

2019 ◽  
Vol 29 (08) ◽  
pp. 2050124
Author(s):  
Farshad Goodarzi ◽  
Siroos Toofan
Keyword(s):  
Fine Structure ◽  
Delay Line ◽  
Supply Voltage ◽  
Cmos Technology ◽  
Digital Converter ◽  
Time Intervals ◽  
Wide Linear Range ◽  
Time To Digital Converter ◽  
Good Linearity ◽  
Time Amplifier

This paper describes a 9-bit time-to-digital converter (TDC) with 3.6 ps resolution. The resolution of 3.6 ps is achieved using coarse and fine structure. The structure of the proposed two-step pipeline TDC is composed of a 4-bit coarse TDC (CTDC) based on delay line and a 5-bit fine TDC (FTDC) based on an SAR-CD algorithm where a Time Amplifier (TA) is used between them. Since TA amplifies the time intervals in different stages of delay line to achieve accurate gain with wide linear range. Therefore, the TDC has good linearity. The proposed TDC has Differential Non-Linearity (DNL) and Integral Non-Linearity (INL) errors of 1.6 and 2.6 LSB, respectively. This TDC was designed in 0.18[Formula: see text][Formula: see text]m CMOS technology. Using a supply voltage of 1.8[Formula: see text]V, the proposed TDC consumes 1.88[Formula: see text]mW at 25 MS/s throughput.

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