scholarly journals Influence of adhesive bond line thickness on joint strength of composite aircraft structures

2021 ◽  
Vol 1925 (1) ◽  
pp. 012070
Author(s):  
V Kostin ◽  
F Nasonov ◽  
A Zinin
2009 ◽  
Vol 29 (7) ◽  
pp. 724-736 ◽  
Author(s):  
P. Davies ◽  
L. Sohier ◽  
J.-Y. Cognard ◽  
A. Bourmaud ◽  
D. Choqueuse ◽  
...  

Materials ◽  
2021 ◽  
Vol 14 (7) ◽  
pp. 1723
Author(s):  
Yu Sekiguchi ◽  
Chiaki Sato

With an increasing demand for adhesives, the durability of joints has become highly important. The fatigue resistance of adhesives has been investigated mainly for epoxies, but in recent years many other resins have been adopted for structural adhesives. Therefore, understanding the fatigue characteristics of these resins is also important. In this study, the cyclic fatigue behavior of a two-part acrylic-based adhesive used for structural bonding was investigated using a fracture-mechanics approach. Fatigue tests for mode I loading were conducted under displacement control using double cantilever beam specimens with varying bond-line thicknesses. When the fatigue crack growth rate per cycle, da/dN, reached 10−5 mm/cycle, the fatigue toughness reduced to 1/10 of the critical fracture energy. In addition, significant changes in the characteristics of fatigue crack growth were observed varying the bond-line thickness and loading conditions. However, the predominance of the adhesive thickness on the fatigue crack growth resistance was confirmed regardless of the initial loading conditions. The thicker the adhesive bond line, the greater the fatigue toughness.


Author(s):  
E. Graycochea Jr. ◽  
F. Gomez ◽  
R. Rodriguez ◽  
B. Bacquian

Improvement on the process and design is often a reliable way to resolve a problem especially in semiconductor industry. This paper presents a leadframe or semiconductor carrier merged with a stand-off design structure that will maintain a consistent bond line thickness (BLT) criteria for quad-flat no-leads (QFN) packages. Through package and process conceptualization, the stand-off design located on the leadframe underneath the silicon die corners would result to a steady and consistent BLT during die attach process. With the improved design, die tilt occurrence in die attach process would be mitigated.


Author(s):  
Senthil A. G. Singaravelu ◽  
Xuejiao Hu ◽  
Kenneth E. Goodson

Increasing power dissipation in today’s microprocessors demands thermal interface materials (TIMs) with lower thermal resistances. The TIM thermal resistance depends on the TIM thermal conductivity and the bond line thickness (BLT). Carbon Nanotubes (CNTs) have been proposed to improve the TIM thermal conductivity. However, the rheological properties of TIMs with CNT inclusions are not well understood. In this paper, the transient behavior of the BLT of the TIMs with CNT inclusions has been measured under controlled attachment pressures. The experimental results show that the impact of CNT inclusions on the BLT at low volume fractions (up to 2 vol%) is small; however, higher volume fraction of CNT inclusions (5 vol%) can cause huge increase in TIM thickness. Although thermal conductivities are higher for higher CNT fractions, a minimum TIM resistance exists at some optimum CNT fraction for a given attachment pressure.


2018 ◽  
Vol 109 ◽  
pp. 197-206 ◽  
Author(s):  
Francisco Sacchetti ◽  
Wouter J.B. Grouve ◽  
Laurent L. Warnet ◽  
Irene Fernandez Villegas

Sign in / Sign up

Export Citation Format

Share Document