scholarly journals Composition, structure and formation conditions of the Arydzhangsky Formation of the Maimecha-Kotuy District of the Siberian Trap Province

2022 ◽  
Vol 962 (1) ◽  
pp. 012059
Author(s):  
R V Shtokalo ◽  
N A Krivolutskaya ◽  
A A Konyshev ◽  
I T Rass ◽  
S I Demidova
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Relative Position ◽  
River Valley ◽  
Siberian Trap ◽  
Formation Conditions ◽  
Composition Structure ◽  
Geochemical Studies ◽  
Scanning Electron

Abstract We studied 6 sections of the Arydzhangsky lava formation (P2-T1) in the Kotuy river valley. The results of petrographic and geochemical studies of the composition of rocks of the Arydzhangsky, Khardaksky and Pravoboyarsky formations are presented. The stratigraphic columns of the sections were built and the composition of the rocks was additionally determined using a scanning electron microscope. In this regard, the relative position of these formations was established, the mantle and crust sources of magmas were confirmed. A geochemical identity of the rocks of the Khardaksky formation with the rocks of the Arydzhangsky formation was established, which suggests a similar age of their formation.

scholarly journals Fruit micromorphology of Siberian Apiaceae and its value for taxonomy of the family

Turczaninowia ◽  
2021 ◽  
Vol 24 (2) ◽  
pp. 120-143
Author(s):  
Tatyana A. Ostroumova
Keyword(s):  
Cell Wall ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Cell Surface ◽  
Species Identification ◽  
Relative Position ◽  
Wide Distribution ◽  
Cultivated Plants ◽  
The Family ◽  
Scanning Electron

Using a scanning electron microscope, the fruit micromorphology of the family Apiaceae of Siberia was studied. In total, the study covered 97 species of wild, adventive, and the most important cultivated plants. Within one fruit, micromorphology is heterogeneous; the most informative is the surface of the grooves and the rib bases. Exocarp cells are described (relative position, shape, size, nature of the boundaries between cells, outer walls, and fine relief of the cell wall). Characters most consistent within the species, for example, outgrowths on cell surface and a thin relief of cell wall, are noted. The characteristics of the ridges of the ribs, stomata (their presence, position on the surface of the fruit, and cuticle on the cells adjacent to the stomata), and epicuticular wax are also given. 25 species have hairs, scales, spines or warts on the surface; the shape of these structures and their fine relief are described. The importance of micromorphology for species identification and taxonomy is shown. The wide distribution of parallel variability in the family is noted.

scholarly journals Mineralogical and geochemical studies of gabbroids in the East Central Desert, Egypt

2020 ◽  
Vol 59 (3) ◽  
pp. 41-51
Author(s):  
Hamdy Ahmed Mohamed AWAD ◽  
◽  
Aleksey Valer’evich NASTAVKIN ◽  
Keyword(s):  
Electron Microscope ◽  
Iron Oxide ◽  
Scanning Electron Microscope ◽  
Iron Oxides ◽  
Eastern Desert ◽  
Central Eastern Desert ◽  
Oxide Minerals ◽  
Central Eastern ◽  
Geochemical Studies ◽  
Scanning Electron

Relevance of the work. The study area is limited to the Central-Eastern Desert of Egypt, represented by various rock units in addition to the gabbro rock containing iron oxides. Research Objective. This work is devoted to detailed studies of the geology of gabbroid rock minerals and iron oxides. Methodology. This work includes both field work (creation of a new geological map for various rock units in the study area) and laboratory work (preparation of thin sections for petrographic and mineralogical studies using a polarizing microscope and a scanning electron microscope SEM). Results and their application. Exploration and extraction of ore deposits and minerals in the eastern desert of Egypt is one of the most important goals for increasing the rate of mining in the country, which leads to economic recovery and meeting the needs of society. Previous work has focused on evaluating and studying economically mineral resources in the Central-Eastern Desert of Egypt. This place is considered one of the most promising mineral deposits in addition to the available iron oxide minerals. Geological studies show that the mineralization of iron oxide in the study area is mainly associated with gabbroid rocks, which carry iron oxide minerals in the form of groups and lenses in the lower part of the Earth’s layers, which is associated with magma rich in iron oxides. According to field studies, we found that iron minerals are represented by lenses up to 3 m thick, alternating with rock. Conclusions. The chemical analysis of minerals based on iron oxides was discovered using a scanning electron microscope (SEM) used to determine the chemical composition of these minerals, which are classified as minerals such as ilmenite and magnetite. Actually geochemical studies have shown that they have a high content of total iron oxides.

The Alteration of the Pore Spaces in Sandstones

1973 ◽  
Vol 31 ◽  
pp. 210-211
Author(s):  
R. E. Ferrell ◽  
G. G. Paulson
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
The Other ◽  
Coarse Grained ◽  
Depositional Fabric ◽  
Soluble Components ◽  
Scanning Electron ◽  
Shape And Size

The pore spaces in sandstones are the result of the original depositional fabric and the degree of post-depositional alteration that the rock has experienced. The largest pore volumes are present in coarse-grained, well-sorted materials with high sphericity. The chief mechanisms which alter the shape and size of the pores are precipitation of cementing agents and the dissolution of soluble components. Each process may operate alone or in combination with the other, or there may be several generations of cementation and solution.The scanning electron microscope has ‘been used in this study to reveal the morphology of the pore spaces in a variety of moderate porosity, orthoquartzites.

The Broad Applications of the Scanning Electron Microscope

1969 ◽  
Vol 27 ◽  
pp. 20-21
Author(s):  
C. T. Nightingale ◽  
S. E. Summers ◽  
T. P. Turnbull
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Microscopy ◽  
Surface Topography ◽  
Great Depth ◽  
Resolving Power ◽  
Depth Of Field ◽  
Pictorial Representations ◽  
Scanning Electron

The ease of operation of the scanning electron microscope has insured its wide application in medicine and industry. The micrographs are pictorial representations of surface topography obtained directly from the specimen. The need to replicate is eliminated. The great depth of field and the high resolving power provide far more information than light microscopy.

Observability of Very Thick Specimen by Using Transmission Scanning Electron Microscope

1971 ◽  
Vol 29 ◽  
pp. 26-27
Author(s):  
K. Shibatomi ◽  
T. Yamanoto ◽  
H. Koike
Keyword(s):  
Electron Microscope ◽  
Image Quality ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Image Contrast ◽  
Objective Lens ◽  
Thick Specimen ◽  
Transmission Electron ◽  
Scanning Electron

In the observation of a thick specimen by means of a transmission electron microscope, the intensity of electrons passing through the objective lens aperture is greatly reduced. So that the image is almost invisible. In addition to this fact, it have been reported that a chromatic aberration causes the deterioration of the image contrast rather than that of the resolution. The scanning electron microscope is, however, capable of electrically amplifying the signal of the decreasing intensity, and also free from a chromatic aberration so that the deterioration of the image contrast due to the aberration can be prevented. The electrical improvement of the image quality can be carried out by using the fascionating features of the SEM, that is, the amplification of a weak in-put signal forming the image and the descriminating action of the heigh level signal of the background. This paper reports some of the experimental results about the thickness dependence of the observability and quality of the image in the case of the transmission SEM.

Resolution of a Transmitted Electron Image Formed by A Scanning Electron Microscope

1970 ◽  
Vol 28 ◽  
pp. 386-387
Author(s):  
S. Takashima ◽  
H. Hashimoto ◽  
S. Kimoto
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Objective Lens ◽  
Specimen Thickness ◽  
Probe Diameter ◽  
Transmission Electron ◽  
Electron Image ◽  
Conventional Transmission Electron Microscope ◽  
Scanning Electron

The resolution of a conventional transmission electron microscope (TEM) deteriorates as the specimen thickness increases, because chromatic aberration of the objective lens is caused by the energy loss of electrons). In the case of a scanning electron microscope (SEM), chromatic aberration does not exist as the restrictive factor for the resolution of the transmitted electron image, for the SEM has no imageforming lens. It is not sure, however, that the equal resolution to the probe diameter can be obtained in the case of a thick specimen. To study the relation between the specimen thickness and the resolution of the trans-mitted electron image obtained by the SEM, the following experiment was carried out.

Characterization of Sputtered Films using the Scanning Electron Microscope

1973 ◽  
Vol 31 ◽  
pp. 44-45
Author(s):  
R. F. Schneidmiller ◽  
W. F. Thrower ◽  
C. Ang
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Thin Film Deposition ◽  
Film Deposition ◽  
Sputtered Films ◽  
Plasma Sputtering ◽  
Microelectronic Devices ◽  
Control Film ◽  
Scanning Electron

Solid state materials in the form of thin films have found increasing structural and electronic applications. Among the multitude of thin film deposition techniques, the radio frequency induced plasma sputtering has gained considerable utilization in recent years through advances in equipment design and process improvement, as well as the discovery of the versatility of the process to control film properties. In our laboratory we have used the scanning electron microscope extensively in the direct and indirect characterization of sputtered films for correlation with their physical and electrical properties.Scanning electron microscopy is a powerful tool for the examination of surfaces of solids and for the failure analysis of structural components and microelectronic devices.

Field Emission SEM Equipped With Noise Compensator

1973 ◽  
Vol 31 ◽  
pp. 302-303
Author(s):  
S. Saito ◽  
H. Todokoro ◽  
S. Nomura ◽  
T. Komoda
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Low Contrast ◽  
Probe Current ◽  
High Resolution Images ◽  
Scanning Electron

Field emission scanning electron microscope (FESEM) features extremely high resolution images, and offers many valuable information. But, for a specimen which gives low contrast images, lateral stripes appear in images. These stripes are resulted from signal fluctuations caused by probe current noises. In order to obtain good images without stripes, the fluctuations should be less than 1%, especially for low contrast images. For this purpose, the authors realized a noise compensator, and applied this to the FESEM.Fig. 1 shows an outline of FESEM equipped with a noise compensator. Two apertures are provided gust under the field emission gun.

Visualization of Internal Skin Structures with the Scanning Electron Microscope

1969 ◽  
Vol 27 ◽  
pp. 46-47
Author(s):  
Emil Bernstein
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Great Depth ◽  
Hair Follicles ◽  
Depth Of Field ◽  
Pig Skin ◽  
Realistic Picture ◽  
Main Components ◽  
Scanning Electron

An interesting method for examining structures in g. pig skin has been developed. By modifying an existing technique for splitting skin into its two main components—epidermis and dermis—we can in effect create new surfaces which can be examined with the scanning electron microscope (SEM). Although this method is not offered as a complete substitute for sectioning, it provides the investigator with a means for examining certain structures such as hair follicles and glands intact. The great depth of field of the SEM complements the technique so that a very “realistic” picture of the organ is obtained.

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