Beam splitting of a double-groove fused-silica grating under normal incidence

2011 ◽  
Vol 13 (11) ◽  
pp. 115703 ◽  
Author(s):  
Jun Wu ◽  
Changhe Zhou ◽  
Hongchao Cao ◽  
Anduo Hu ◽  
Junjie Yu ◽  
...  
Keyword(s):  
Normal Incidence ◽  
Fused Silica ◽  
Beam Splitting

scholarly journals Diffraction mechanism of five-port transmission gratings

2020 ◽  
Vol 50 (4) ◽  
Author(s):  
Chenhao Gao ◽  
Bo Wang ◽  
Kunhua Wen ◽  
Ziming Meng ◽  
Qu Wang ◽  
...  
Keyword(s):  
Beam Splitter ◽  
Diffraction Order ◽  
Normal Incidence ◽  
Propagation Mechanism ◽  
Beam Splitting ◽  
Transmission Grating ◽  
Process Tolerance ◽  
Wide Range ◽  
Rigorous Coupled Wave ◽  
Modal Method

This paper designs a five-port transmission grating under normal incidence. Rigorous coupled-wave approach is used to optimize the grating parameters. The energy of the grating is mainly dispersed to the 0th, ±1st and ±2nd orders. The efficiency of each diffraction order under both polarizations is close to 20%. The modal method is used to describe the propagation mechanism of the two polarized lights in the grating, and the diffraction behavior of the grating is analyzed. In addition, the grating has a wide range of incident characteristics and a large process tolerance. Therefore, this five-port beam splitter with a connecting layer will be a good polarization-independent beam splitting device.

scholarly journals Refractive Index of Cadmium Sulfide Films Determined from Transmittance Measurements

2019 ◽  
Vol 3 (4) ◽  
pp. 21-29
Author(s):  
Zaheer Hussain Shah ◽  
Imtiaz Ahmad ◽  
Rabia Nasar
Keyword(s):  
Refractive Index ◽  
Cadmium Sulfide ◽  
Normal Incidence ◽  
Fused Silica ◽  
Refractive Indices ◽  
Silica Substrates

In the present work the refractive indices of thermally evaporated films of cadmium sulfide (CdS) on fused silica substrates were obtained from measurement of transmittance (T, alone) at normal incidence. Earlier, the same were determined by using measurements of reflectance (R) and transmittance (T) again at normal incidence. On comparison of the two results, we noted that the present results are in fact more, closer than those obtained earlier to the corresponding values reported for the bulk cadmium sulfide.

scholarly journals High-efficiency nine-port beam splitting output enabled by a dielectric lamellar sandwiched fused-silica grating

2022 ◽  
Vol 145 ◽  
pp. 107465
Author(s):  
Hongtao Li ◽  
Tianqi Huang ◽  
Liang Lu ◽  
Zhijia Hu ◽  
Benli Yu
Keyword(s):  
High Efficiency ◽  
Fused Silica ◽  
Beam Splitting

SEM analysis of DC magnetron sputtered beryllium films

1988 ◽  
Vol 46 ◽  
pp. 960-961
Author(s):  
E. F. Lindsey ◽  
C. W. Price ◽  
E. L. Pierce ◽  
E. J. Hsieh
Keyword(s):  
Fine Structure ◽  
Electron Emission ◽  
Secondary Electron ◽  
Low Voltage ◽  
Ion Beam ◽  
Secondary Electron Emission ◽  
Sem Analysis ◽  
Fused Silica ◽  
Grain Structure ◽  
Silica Substrate

Columnar structures produced by DC magnetron sputtering can be altered by using RF biased sputtering or by exposing the film to nitrogen pulses during sputtering, and these techniques are being evaluated to refine the grain structure in sputtered beryllium films deposited on fused silica substrates. Beryllium is brittle, and fractures in sputtered beryllium films tend to be intergranular; therefore, a convenient technique to analyze grain structure in these films is to fracture the coated specimens and examine them in an SEM. However, fine structure in sputtered deposits is difficult to image in an SEM, and both the low density and the low secondary electron emission coefficient of beryllium seriously compound this problem. Secondary electron emission can be improved by coating beryllium with Au or Au-Pd, and coating also was required to overcome severe charging of the fused silica substrate even at low voltage. The coating structure can obliterate much of the fine structure in beryllium films, but reasonable results were obtained by using the high-resolution capability of an Hitachi S-800 SEM and either ion-beam coating with Au-Pd or carbon coating by thermal evaporation.

Analysis of Contrast Reversal in SEM Images

1972 ◽  
Vol 30 ◽  
pp. 398-399
Author(s):  
M. D. Coutts ◽  
E. R. Levin
Keyword(s):  
Incident Beam ◽  
Normal Incidence ◽  
Beam Current ◽  
Secondary Emission ◽  
Image Contrast ◽  
Sem Images ◽  
Secondary Electrons ◽  
Image Position

On tilting samples in an SEM, the image contrast between two elements, x and y often decreases to zero at θε, which we call the no-contrast angle. At angles above θε the contrast is reversed, θ being the angle between the specimen normal and the incident beam. The available contrast between two elements, x and y, in the SEM can be defined as,(1)where ix and iy are the total number of reflected and secondary electrons, leaving x and y respectively. It can easily be shown that for the element x,(2)where ib is the beam current, isp the specimen absorbed current, δo the secondary emission at normal incidence, k is a constant, and m the reflected electron coefficient.

Characterization of Rh/Si multilayer structure by HREM and HAADF

1992 ◽  
Vol 50 (1) ◽  
pp. 122-123
Author(s):  
Y. Cheng ◽  
J. Liu ◽  
M.B. Stearns ◽  
D.G. Steams
Keyword(s):  
Normal Incidence ◽  
High Resolution Electron Microscopy ◽  
X Rays ◽  
Beam Direction ◽  
Cross Sectional ◽  
Optical Elements ◽  
Resolution Electron ◽  
Point To Point ◽  
Better Than

The Rh/Si multilayer (ML) thin films are promising optical elements for soft x-rays since they have a calculated normal incidence reflectivity of ∼60% at a x-ray wavelength of ∼13 nm. However, a reflectivity of only 28% has been attained to date for ML fabricated by dc magnetron sputtering. In order to determine the cause of this degraded reflectivity the microstructure of this ML was examined on cross-sectional specimens with two high-resolution electron microscopy (HREM and HAADF) techniques.Cross-sectional specimens were made from an as-prepared ML sample and from the same ML annealed at 298 °C for 1 and 100 hours. The specimens were imaged using a JEM-4000EX TEM operating at 400 kV with a point-to-point resolution of better than 0.17 nm. The specimens were viewed along Si [110] projection of the substrate, with the (001) Si surface plane parallel to the beam direction.

On resolving fine periodic microstructures in the optical microscope

1989 ◽  
Vol 47 ◽  
pp. 364-365
Author(s):  
W.S. Putnam ◽  
C. Viney
Keyword(s):  
Liquid Crystalline ◽  
Numerical Aperture ◽  
Polarized Light ◽  
Normal Incidence ◽  
Optical Microscope ◽  
Angle Of Incidence ◽  
Resolution Limit ◽  
Crystalline Materials ◽  
Periodic Microstructures ◽  
Liquid Crystalline Materials

Many sheared liquid crystalline materials (fibers, films and moldings) exhibit a fine banded microstructure when observed in the polarized light microscope. In some cases, for example Kevlar® fiber, the periodicity is close to the resolution limit of even the highest numerical aperture objectives. The periodic microstructure reflects a non-uniform alignment of the constituent molecules, and consequently is an indication that the mechanical properties will be less than optimal. Thus it is necessary to obtain quality micrographs for characterization, which in turn requires that fine detail should contribute significantly to image formation.It is textbook knowledge that the resolution achievable with a given microscope objective (numerical aperture NA) and a given wavelength of light (λ) increases as the angle of incidence of light at the specimen surface is increased. Stated in terms of the Abbe resolution criterion, resolution improves from λ/NA to λ/2NA with increasing departure from normal incidence.

Microspectroscopy Using a Solid Immersion Lens

2001 ◽  
Vol 7 (S2) ◽  
pp. 148-149
Author(s):  
C.D. Poweleit ◽  
J Menéndez
Keyword(s):  
Spatial Resolution ◽  
Focal Plane ◽  
Numerical Aperture ◽  
Normal Incidence ◽  
Spot Size ◽  
Index Of Refraction ◽  
Objective Lens ◽  
Improvement Factor ◽  
Oil Immersion ◽  
Long Time

Oil immersion lenses have been used in optical microscopy for a long time. The light’s wavelength is decreased by the oil’s index of refraction n and this reduces the minimum spot size. Additionally, the oil medium allows a larger collection angle, thereby increasing the numerical aperture. The SIL is based on the same principle, but offers more flexibility because the higher index material is solid. in particular, SILs can be deployed in cryogenic environments. Using a hemispherical glass the spatial resolution is improved by a factor n with respect to the resolution obtained with the microscope’s objective lens alone. The improvement factor is equal to n2 for truncated spheres.As shown in Fig. 1, the hemisphere SIL is in contact with the sample and does not affect the position of the focal plane. The focused rays from the objective strike the lens at normal incidence, so that no refraction takes place.

Investigation of fused silica dynamic behaviour

2006 ◽  
Vol 134 ◽  
pp. 929-934 ◽  
Author(s):  
F. Malaise ◽  
J.-M. Chevalier ◽  
I. Bertron ◽  
F. Malka
Keyword(s):  
Dynamic Behaviour ◽  
Fused Silica
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