scholarly journals Structure and optical properties of polycrystalline ZnSe thin films: validity of Swanepol’s approach for calculating the optical parameters

2020 ◽  
Vol 7 (1) ◽  
pp. 016422 ◽  
Author(s):  
M F Hasaneen ◽  
Z A Alrowaili ◽  
W S Mohamed
1983 ◽  
Vol 12 (4) ◽  
pp. 137-139
Author(s):  
A. A. El-Shazly ◽  
M. K. Kenawi ◽  
H. T. El-Shair ◽  
M. M. El-Nahass ◽  
H. S. Soliman

Crystals ◽  
2020 ◽  
Vol 10 (4) ◽  
pp. 252 ◽  
Author(s):  
A. M. Alsaad ◽  
A. A. Ahmad ◽  
I. A. Qattan ◽  
Qais M. Al-Bataineh ◽  
Zaid Albataineh

Undoped ZnO and group III (B, Al, Ga, and In)-doped ZnO thin films at 3% doping concentration level are dip-coated on glass substrates using a sol-gel technique. The optical properties of the as-prepared thin films are investigated using UV–Vis spectrophotometer measurements. Transmittance of all investigated thin films is found to attain high values of ≥80% in the visible region. We found that the index of refraction of undoped ZnO films exhibits values ranging between 1.6 and 2.2 and approximately match that of bulk ZnO. Furthermore, we measure and interpret nonlinear optical parameters and the electrical and optical conductivities of the investigated thin films to obtain a deeper insight from fundamental and practical points of view. In addition, the structural properties of all studied thin film samples are investigated using the XRD technique. In particular, undoped ZnO thin film is found to exhibit a hexagonal structure. Due to the large difference in size of boron and indium compared with that of zinc, doping ZnO thin films with these two elements is expected to cause a phase transition. However, Al-doped ZnO and Ga-doped ZnO thin films preserve the hexagonal phase. Moreover, as boron and indium are introduced in ZnO thin films, the grain size increases. On the other hand, grain size is found to decrease upon doping ZnO with aluminum and gallium. The drastic enhancement of optical properties of annealed dip-synthesized undoped ZnO thin films upon doping with group III metals paves the way to tune these properties in a skillful manner, in order to be used as key candidate materials in the fabrication of modern optoelectronic devices.


2014 ◽  
Vol 37 (6) ◽  
pp. 1255-1263 ◽  
Author(s):  
M. R. Balboul ◽  
H. M. Hosni ◽  
M. A. Soliman ◽  
S. A. Fayek

2019 ◽  
Vol 33 (05) ◽  
pp. 1950024 ◽  
Author(s):  
Fatma Meydaneri Tezel ◽  
İ. Afşin Kariper

In this study, zinc selenide (ZnSe) thin films were produced on glass substrate by using chemical bath deposition (CBD) method at 80[Formula: see text]C, from aqueous solutions of zinc sulphate and sodium selenosulphide, which were produced using solid selenium as the selenium source. The optical and structural properties of ZnSe thin films were investigated at room-temperature. The pH of the chemical bath, in which ZnSe thin films were immersed, were changed between pH:8–11. Optical properties of the films, including extinction coefficient, refractive index, reflectance, absorbance, transmittance, dielectric constants and optical density values were calculated using absorbance and transmittance measurements determined using a Hach Lange 500 spectrophotometer, in 300–1100 nm wavelength range. Optical bandgap values were obtained from transmittance and absorbance spectra ranged between 2.12 and 2.49 eV. According to XRD results, it was found that the films have polycrystalline structure and they exhibited different film thicknesses depending on phase and pH changes.


2015 ◽  
Vol 12 (9-11) ◽  
pp. 1224-1228 ◽  
Author(s):  
H. H. Güllü ◽  
E. Coşkun ◽  
M. Parlak

2014 ◽  
Vol 21 (05) ◽  
pp. 1450073 ◽  
Author(s):  
SOMAYEH AZIZI ◽  
HAMID REZAGHOLIPOUR DIZAJI ◽  
MOHAMMAD HOSSEIN EHSANI ◽  
SEYED FEYZOLAH GHAVAMI MIRMAHALLE

Cd 0.8 Zn 0.2 S thin films deposited on glass substrates by thermal evaporation method were annealed at different temperatures for the first time in order to investigate annealing effect on optical properties. The compositional, structural of nanoparticles precursor synthesized using microwave irradiation method and optical properties of the films were studied using energy dispersive X-ray (EDX), X-ray diffraction, transmission electron microscopy (TEM), and UV-visible spectrophotometer techniques. The annealed films were found to have hexagonal Wurtzite structure with strong preferential orientation along the (002) diffraction peak. Important optical parameters such as extinction coefficient and refractive index revealed the effect of heat treatment on the deposited thin layers. A reduction in the band gap energy from 2.41 eV to 2.29 eV was observed for the annealed samples.


Sign in / Sign up

Export Citation Format

Share Document