Design and Analysis of Hard X-Ray Microscope Employing Toroidal Mirrors Working at Grazing-Incidence

2019 ◽  
Vol 34 (04) ◽  
pp. 2055010
Author(s):  
Ying Cui ◽  
Yadong Yan ◽  
Bingjing Wu ◽  
Qi Li ◽  
Junhua He
Keyword(s):  
Optical Axis ◽  
Incidence Angle ◽  
Incident Angle ◽  
Optical Design ◽  
Grazing Incidence ◽  
Imaging Diagnosis ◽  
X Ray ◽  
Imaging Characteristics ◽  
Axis Offset ◽  
Better Than

A high resolution microscope is designed for plasma hard X-ray (10–20[Formula: see text]keV) imaging diagnosis. This system consists of two toroidal mirrors, which are nearly parallel, with an angle twice that of the grazing incidence angle and a plane mirror for spectral selection and correction of optical axis offset. The imaging characteristics of single toroidal mirror and double mirrors are analyzed in detail by the optical path function. The optical design, parameter optimization, image quality simulation and analysis of the microscope are carried out. The optimized hard X-ray microscope has a resolution better than 5[Formula: see text][Formula: see text]m at 1[Formula: see text]mm object field of view. The experimental data shows that the variation of the resolution is smaller in the direction of incident angle decrease than that in the increasing direction.

Growth of nano-dots on the grazing-incidence mirror surface under FEL irradiation

2016 ◽  
Vol 23 (1) ◽  
pp. 78-90 ◽  
Author(s):  
I. V. Kozhevnikov ◽  
A. V. Buzmakov ◽  
F. Siewert ◽  
K. Tiedtke ◽  
M. Störmer ◽  
...  
Keyword(s):  
Incidence Angle ◽  
Incident Angle ◽  
Grazing Incidence ◽  
Mirror Surface ◽  
Model Calculations ◽  
X Ray ◽  
Peak Intensity ◽  
Reflection Angle ◽  
Hydrocarbon Molecules ◽  
Total Disappearance

A new phenomenon on X-ray optics surfaces has been observed: the growth of nano-dots (40–55 nm diameter, 8–13 nm height, 9.4 dots µm−2surface density) on the grazing-incidence mirror surface under irradiation by the free-electron laser (FEL) FLASH (5–45 nm wavelength, 3° grazing-incidence angle). With a model calculation it is shown that these nano-dots may occur during the growth of a contamination layer due to polymerization of incoming hydrocarbon molecules. The crucial factors responsible for the growth of nano-dots in the model are the incident peak intensity and the reflection angle of the beam. A reduction of the peak intensity (e.g.replacement of the FEL beam by synchrotron radiation) as well as a decrease of the incident angle by just 1° (from 3° to 2°) may result in the total disappearance of the nano-dots. The model calculations are compared with surface analysis of two FLASH mirrors.

Anomalous peaks in grazing incidence thin film X-ray diffraction

1994 ◽  
Vol 9 (1) ◽  
pp. 44-49 ◽  
Author(s):  
Richard A. Vaia ◽  
Maura S. Weathers ◽  
William A. Bassett
Keyword(s):  
Thin Films ◽  
Incidence Angle ◽  
Incident Angle ◽  
Grazing Incidence ◽  
Sample Surface ◽  
X Ray ◽  
Polymeric Thin Films ◽  
Diffraction Geometry ◽  
Sample Orientation ◽  
Diffuse Surface

Numerous spurious X-ray peaks were encountered during grazing incidence angle diffractometer scans of ceramic and polymeric thin films on crystalline and amorphous substrate materials. At least three possible sources of spurious peaks are identified. (1) At (2θ) values greater than ∼ 10°, Laue reflections from characteristic and Bremsstrahlung continuum radiation produce spurious peaks with a (2θ) dependence on X-ray incident angle and sample orientation. At (2θ) values less than 10°, (2) specular X-ray reflection from a boundary between two media of different indices of refraction and (3) diffuse surface scattering produces spurious peaks with a dependence on X-ray incident angle and sample surface topography. From an understanding of the spurious peaks, improved experimental techniques may be developed. Because these peaks can interfere significantly with grazing incidence diffractometer scans, it is particularly important to those making studies of thin films by this asymmetric diffraction geometry to be aware of the existence and origins of these spurious peaks.

Imaging X-ray fluorescence microscope with a Wolter-type grazing-incidence mirror

1998 ◽  
Vol 5 (3) ◽  
pp. 1117-1118 ◽  
Author(s):  
S. Aoki ◽  
A. Takeuchi ◽  
M. Ando
Keyword(s):  
Spatial Resolution ◽  
Incidence Angle ◽  
Grazing Incidence ◽  
Fluorescence Microscope ◽  
X Rays ◽  
X Ray ◽  
Photon Factory ◽  
Grazing Incidence Angle ◽  
Fluorescence Images ◽  
Better Than

A Wolter-type grazing-incidence mirror was used as an objective for an imaging X-ray fluorescence microscope. The microscope was constructed at the beamline 6C2 of the Photon Factory. The shortest wavelength used was ∼0. 1 nm, which was limited by the grazing-incidence angle of the mirror. To demonstrate the possibility of recording X-ray fluorescence images, several fine grids were used as test specimens. Characteristic X-rays emitted from each specimen could be clearly imaged. Spatial resolution was estimated to be better than 10 µm.

Depth Profile of Structure, Strain, and Composition in an Annealed Al-Cu-Fe-Cr Quasicrystalline Film

2001 ◽  
Vol 695 ◽  
Author(s):  
M.J. Daniels ◽  
D. King ◽  
J.S. Zabinski ◽  
Z.U. Rek ◽  
J.C. Bilello
Keyword(s):  
Residual Strain ◽  
Incident Angle ◽  
Rf Sputtering ◽  
Strain Analysis ◽  
Grazing Incidence ◽  
Grain Structure ◽  
Second Phase ◽  
Secondary Phases ◽  
Composite Target ◽  
X Ray

ABSTRACTQuasicrystalline films were formed by RF sputtering from a powder composite target onto Inconel substrates, which produces a polymorphic nanoquasicrystalline grain structure, ~2.5 - 10 nm. Subsequent annealing at 500°C for 4 hours, at base pressures of below 5*10-5 Torr, and with Ar flow to 5 - 10 mT, fully develops the quasicrystalline structure with decagonal phase predominating, except near the termination surface. Analysis by XPS indicated extensive oxygen incorporation and limited aluminum enrichment at the termination surface. These results are correlated with structure and strain analysis via synchrotron grazing incidence x-ray scattering (GIXS). By varying the incident angle, hence the x-ray penetration depth, the evolution of an amorphous and crystalline crystalline secondary phases at the surface of the film has been detected. Residual strain analysis shows that this second phase induces a compressive residual strain of 0.10% as measured from the displacement of the major quasicrystalline peaks in the surface layers of the film.

Theory & Performance of Holographically-Formed Stigmatic X-Ray Gratings

1975 ◽  
Vol 19 ◽  
pp. 643-656
Author(s):  
R. J. Speer
Keyword(s):  
Fringe Pattern ◽  
Optical Design ◽  
Grazing Incidence ◽  
Laser Fusion ◽  
Molecular Chemistry ◽  
X Ray ◽  
First Order ◽  
Imaging Theory ◽  
Reflection Grating ◽  
Aberration Corrected

Holographically-formed X-ray reflection grating scan now be constructed with competitive groove efficiency to classically ruled types, down to a short wavelength diffracting limit of several angstroms.The gratings can be generated on any surface capable of intersecting the interference fringe pattern without shadowing. This fact alone brings several new X-ray optical design possibilities within reach, for example, by combining plane construction waves with steep aspheric substrates. The first order imaging theory of the grazing incidence mounting is discussed and compared to measured performance for aberration corrected stigmatic types.A new 5 meter spectrograph has also been constructed with applications in molecular chemistry, laser fusion research and synchro tronspectroscopy. The unit is available with fully prefocussed holographic and classical X-ray grating optics, and uses the precision miniature camera principle of fully interchangeable lenses, but applied, in this case to the entrance slit, grating and detector modules.

Silver behenate as a calibration standard of grazing-incidence small-angle X-ray scattering

2006 ◽  
Vol 39 (5) ◽  
pp. 749-751 ◽  
Author(s):  
Byeongdu Lee ◽  
Chieh-Tsung Lo ◽  
Soenke Seifert ◽  
Randall E. Winans
Keyword(s):  
Refractive Index ◽  
Sample Preparation ◽  
Small Angle ◽  
Incident Angle ◽  
Grazing Incidence ◽  
Peak Position ◽  
Calibration Standard ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Grazing-incidence small-angle X-ray scattering (GISAXS) patterns of a silver behenate composite film, which has a typical layered structure, are described. The peak position of the film in the GISAXS pattern was varied depending on the incident angle, which was well described by taking into account the refraction and the reflection effects. Since the refractive index of samples depends on sample preparation, it is recommended that the measurement of silver behenate as a standard be done in conventional transmission mode to avoid any complexity.

The theory, manufacture, structure and performance of n.p.l. x-ray gratings

1975 ◽  
Vol 277 (1271) ◽  
pp. 503-543 ◽  
Keyword(s):  
Diffraction Efficiency ◽  
Incidence Angle ◽  
Surface Profile ◽  
Wavelength Region ◽  
Grazing Incidence ◽  
Diffraction Theory ◽  
Groove Depth ◽  
X Ray ◽  
Scalar Diffraction ◽  
And Performance

X-ray gratings have been developed for use in the wavelength region of 0.01-20 nm, where it is required to employ a grazing incidence configuration. The gratings have a rectangular profile and radiation is diffracted both from the tops and bottoms of the grooves. They therefore differ from blazed gratings, used at grazing incidence, in that a substantial portion of the grating participates in the diffraction process. A scalar diffraction theory has been developed which demonstrates that grating diffraction efficiency varies periodically with wavelength, pitch, groove depth and incidence angle. The theory can be used to optimize grating parameters for most efficient use in any selected region of the spectrum. The gratings are produced by processing a ruled 300 lines per millimetre master grating, so that surface profile defects introduced by ruling are eliminated. Grating performance has been assessed by means of a specially designed grating analyser in addition to spectrometers and a spectrograph. The experimental results are in qualitative agreement with theory. At very short wavelengths of 0.05 nm and grazing incidence angles of about 5', the diffraction efficiency in the first order is below 1 %. The efficiency rises rapidly to between 5 and 10 % at 0.15 nm and to 20 % in the 1 nm region where the incidence angles are typically a few degrees.

Generalized grazing-incidence-angle X-ray diffraction (G-GIXD) using image plates

1998 ◽  
Vol 5 (3) ◽  
pp. 488-490 ◽  
Author(s):  
Yasuo Takagi ◽  
Masao Kimura
Keyword(s):  
Incidence Angle ◽  
Incident Beam ◽  
Grazing Incidence ◽  
X Rays ◽  
X Ray Diffraction ◽  
X Ray ◽  
Surface And Interface ◽  
Out Of Plane ◽  
Grazing Incidence Angle ◽  
Interface Layers

A new and more `generalized' grazing-incidence-angle X-ray diffraction (G-GIXD) method which enables simultaneous measurements both of in- and out-of-plane diffraction images from surface and interface structures has been developed. While the method uses grazing-incidence-angle X-rays like synchrotron radiation as an incident beam in the same manner as in `traditional' GIXD, two-dimensional (area) detectors like image plates and a spherical-type goniometer are used as the data-collection system. In this way, diffraction images both in the Seemann–Bohlin (out-of-plane) and GIXD geometry (in-plane) can be measured simultaneously without scanning the detectors. The method can be applied not only to the analysis of the in-plane crystal structure of epitaxically grown thin films, but also to more general research topics like the structural analysis of polycrystalline mixed phases of thin surface and interface layers.

X-ray depth profiling of iron oxide thin films

1988 ◽  
Vol 3 (2) ◽  
pp. 351-356 ◽  
Author(s):  
Michael F. Toney ◽  
Ting C. Huang ◽  
Sean Brennan ◽  
Zophia Rek
Keyword(s):  
Incidence Angle ◽  
Depth Profiling ◽  
Grazing Incidence ◽  
Outward Diffusion ◽  
X Ray ◽  
X Ray Scattering ◽  
Α Phase ◽  
Small Incidence ◽  
Pattern Characteristic ◽  
Fe Ions

A nominally γ-Fe2O3 thin film (oxidized from an Fe3O4 film) has been structurally depth profiled using x-ray scattering in a grazing incidence, asymmetric Bragg geometry. By varying the grazing incidence angle, the x-ray penetration depth is varied from tens of Angstroms to several thousand Angstroms, slightly larger than the film thickness. At small incidence angles a diffraction pattern characteristic of α-Fe2O3 is observed, while at larger angles the pattern is predominantly from γ-Fe2O3, showing that there is a surface layer of α-Fe2O3. These results are quantified and the thickness of the α phase found to be 90 Å. The presence of the α phase explains a nonferromagnetic layer observed previously. These data together with magnetic and chemical data suggest that the nonferromagnetic layer forms during oxidation of the Fe3O4 film due to outward diffusion of Fe ions and their subsequent oxidation to form α-Fe2O3

scholarly journals Structural characterization using the multiple scattering effects in grazing-incidence small-angle X-ray scattering

2008 ◽  
Vol 41 (1) ◽  
pp. 134-142 ◽  
Author(s):  
Byeongdu Lee ◽  
Chieh-Tsung Lo ◽  
P. Thiyagarajan ◽  
Dong R. Lee ◽  
Zhongwei Niu ◽  
...  
Keyword(s):  
Multiple Scattering ◽  
Small Angle ◽  
Incident Angle ◽  
Average Distance ◽  
Grazing Incidence ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Effects ◽  
Multiple Scattering Effects ◽  
Ray Scattering

The multiple scattering effects present in grazing-incidence small-angle X-ray scattering (GISAXS) data and interference between them are addressed theoretically as well as experimentally with measurement of a series of patterns at different incident angles, referred to as `incident-angle-resolved GISAXS' (IAR-GISAXS). X-ray reflectivity (XR), GISAXS and IAR-GISAXS of virus particles on Si-substrate supported-polystyrene films have been measured and all the data have been analyzed with appropriate formalisms. It was found that under certain conditions it is possible to extract the correct structural features of the materials from the GISAXS/IAR-GISAXS data using the kinematic SAXS formalisms, without the need to use the distorted-wave Born approximation. Furthermore, the Kiessig fringes in GISAXS enable the measurement of the average distance between the particle and the substrate, similar to the measurement of film thickness using the fringes in the XR data. It is believed that the methods developed here will expand the application of GISAXS as they enable the application of model-independent and kinematic SAXS theories to nanostructured two-dimensional ordered films.

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