High-resolution studies of autodetachment in negative ions

1988 ◽  
Vol 324 (1578) ◽  
pp. 179-196 ◽  
Keyword(s):  
High Resolution ◽  
Ion Beam ◽  
Negative Ions ◽  
Beam Technique

A review of high-resolution autodetachment spectroscopy of negative ions is given. The coaxial laser-ion-beam technique is used to probe the autodetachment dynamics of several molecular negative ions. The NH - ( v = 1) ion is shown to decay mainly via vibrational autodetachment, whereas CH 2 CN - detaches via rotational autodetachment. The propensity rules implied by these systems are confirmed by PtN - , which is found to decay by both routes.

FIB Enhancement of Mechanically Polished Cross-sections

2019 ◽  
Author(s):  
Becky Holdford
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Cross Sections ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
High Resolution Imaging ◽  
Chemical Attack ◽  
Resolution Imaging ◽  
Scanning Electron

Abstract On mechanically polished cross-sections, getting a surface adequate for high-resolution imaging is sometimes beyond the analyst’s ability, due to material smearing, chipping, polishing media chemical attack, etc.. A method has been developed to enable the focused ion beam (FIB) to re-face the section block and achieve a surface that can be imaged at high resolution in the scanning electron microscope (SEM).

The Novel Dopant Profile Inspection Methodology by FIB

2010 ◽  
Author(s):  
Po Fu Chou ◽  
Li Ming Lu
Keyword(s):  
High Resolution ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Real Sample ◽  
Physical Analysis ◽  
The Novel ◽  
High Contrast ◽  
Dopant Profile ◽  
P Type

Abstract Dopant profile inspection is one of the focused ion beam (FIB) physical analysis applications. This paper presents a technique for characterizing P-V dopant regions in silicon by using a FIB methodology. This technique builds on published work for backside FIB navigation, in which n-well contrast is observed. The paper demonstrates that the technique can distinguish both n- and p-type dopant regions. The capability for imaging real sample dopant regions on current fabricated devices is also demonstrated. SEM DC and FIB DC are complementary methodologies for the inspection of dopants. The advantage of the SEM DC method is high resolution and the advantage of FIB DC methodology is high contrast, especially evident in a deep N-well region.

scholarly journals Revealing Inflammatory Indications Induced by Titanium Alloy Wear Debris in Periprosthetic Tissue by Label-Free Correlative High-Resolution Ion, Electron and Optical Microspectroscopy

Materials ◽  
2021 ◽  
Vol 14 (11) ◽  
pp. 3048
Author(s):  
Rok Podlipec ◽  
Esther Punzón-Quijorna ◽  
Luka Pirker ◽  
Mitja Kelemen ◽  
Primož Vavpetič ◽  
...  
Keyword(s):  
Titanium Alloy ◽  
High Resolution ◽  
Wear Debris ◽  
Ion Beam ◽  
Quantitative Measure ◽  
Label Free ◽  
Periprosthetic Tissue ◽  
Correlative Microscopy ◽  
X Ray ◽  
Tissue Reactions

The metallic-associated adverse local tissue reactions (ALTR) and events accompanying worn-broken implant materials are still poorly understood on the subcellular and molecular level. Current immunohistochemical techniques lack spatial resolution and chemical sensitivity to investigate causal relations between material and biological response on submicron and even nanoscale. In our study, new insights of titanium alloy debris-tissue interaction were revealed by the implementation of label-free high-resolution correlative microscopy approaches. We have successfully characterized its chemical and biological impact on the periprosthetic tissue obtained at revision surgery of a fractured titanium-alloy modular neck of a patient with hip osteoarthritis. We applied a combination of photon, electron and ion beam micro-spectroscopy techniques, including hybrid optical fluorescence and reflectance micro-spectroscopy, scanning electron microscopy (SEM), Energy-dispersive X-ray Spectroscopy (EDS), helium ion microscopy (HIM) and micro-particle-induced X-ray emission (micro-PIXE). Micron-sized wear debris were found as the main cause of the tissue oxidative stress exhibited through lipopigments accumulation in the nearby lysosome. This may explain the indications of chronic inflammation from prior histologic examination. Furthermore, insights on extensive fretting and corrosion of the debris on nm scale and a quantitative measure of significant Al and V release into the tissue together with hydroxyapatite-like layer formation particularly bound to the regions with the highest Al content were revealed. The functional and structural information obtained at molecular and subcellular level contributes to a better understanding of the macroscopic inflammatory processes observed in the tissue level. The established label-free correlative microscopy approach can efficiently be adopted to study any other clinical cases related to ALTR.

Carbon Nitride Film Formation by Low Energy Positive and Negative Ion Beam Deposition

1996 ◽  
Vol 438 ◽  
Author(s):  
N. Tsubouchi ◽  
Y. Horino ◽  
B. Enders ◽  
A. Chayahara ◽  
A. Kinomura ◽  
...  
Keyword(s):  
Carbon Nitride ◽  
Rutherford Backscattering Spectrometry ◽  
Ion Beam ◽  
High Vacuum ◽  
Negative Ions ◽  
Low Energy ◽  
Ultra High Vacuum ◽  
Negative Ion ◽  
Nitride Film ◽  
Ion Energy

AbstractUsing a newly developed ion beam apparatus, PANDA (Positive And Negative ions Deposition Apparatus), carbon nitride films were prepared by simultaneous deposition of mass-analyzed low energy positive and negative ions such as C2-, N+, under ultra high vacuum conditions, in the order of 10−6 Pa on silicon wafer. The ion energy was varied from 50 to 400 eV. The film properties as a function of their beam energy were evaluated by Rutherford Backscattering Spectrometry (RBS), Fourier Transform Infrared spectroscopy (FTIR) and Raman scattering. From the results, it is suggested that the C-N triple bond contents in films depends on nitrogen ion energy.

Forced neutralisation of a positive ion beam by negative ions

1975 ◽  
Vol 17 (7-8) ◽  
pp. 525-538 ◽  
Author(s):  
J Pelletier ◽  
C Pomot
Keyword(s):  
Ion Beam ◽  
Negative Ions ◽  
Positive Ion

scholarly journals High resolution magnetic force microscopy using focused ion beam modified tips

2002 ◽  
Vol 81 (5) ◽  
pp. 865-867 ◽  
Author(s):  
G. N. Phillips ◽  
M. Siekman ◽  
L. Abelmann ◽  
J. C. Lodder
Keyword(s):  
High Resolution ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Force Microscopy

Color improvement of rubies by ion beam technique

2016 ◽  
Vol 306 ◽  
pp. 205-210 ◽  
Author(s):  
S. Intarasiri ◽  
D. Bootkul ◽  
U. Tippawan ◽  
P. Songsiriritthigul
Keyword(s):  
Ion Beam ◽  
Beam Technique

Characterisation of concrete, mortar and calcium silicate hydrated phases (CSH) and thorium retention analyses by ion beam techniques.

2012 ◽  
Vol 1475 ◽  
Author(s):  
Ursula Alonso ◽  
Tiziana Missana ◽  
Miguel Garcia-Gutierrez ◽  
Henar Rojo ◽  
Alessandro Patelli ◽  
...  
Keyword(s):  
Calcium Silicate ◽  
Cement Hydration ◽  
Ion Beam ◽  
X Ray ◽  
Tetravalent Actinide ◽  
Radioactive Waste Repositories ◽  
Edx Analyses ◽  
Waste Repositories ◽  
Beam Technique

ABSTRACTCement-based materials, like concrete and mortar, are widely used in radioactive waste repositories. A deep characterization of these heterogeneous materials, and of their main phases, is necessary to evaluate their capability of retaining critical radionuclides (RN).In this study, the ion beam technique micro- Particle Induced X- Ray Emission (μPIXE) is used to characterize the concrete and mortar used in the Spanish low level waste repository. Two calcium silicate hydrate (CSH) phases with different Ca/Si ratio are also studied, because they are known to be amongst the most relevant phases, formed upon cement hydration, that retain RN. The retention of thorium on the above mention materials, as relevant tetravalent actinide, is also analyzed. Results are compared with Scanning Electron Microscopy- Energy Dispersive X-Ray Spectroscopy (SEM-EDX) analyses.

Development of ion-beam technique for manufacturing silicon nanowires

2012 ◽  
Vol 7 (1-2) ◽  
pp. 93-97 ◽  
Author(s):  
B. A. Gurovich ◽  
K. E. Prikhod’ko ◽  
A. N. Taldenkov ◽  
A. Yu. Yakubovskii ◽  
K. I. Maslakov ◽  
...  
Keyword(s):  
Silicon Nanowires ◽  
Ion Beam ◽  
Beam Technique
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