The Determination of X-Ray Line Shapes by a Double Crystal Spectrometer

1934 ◽  
Vol 46 (5) ◽  
pp. 343-351 ◽  
Author(s):  
Lloyd P. Smith
Keyword(s):  
Crystal Spectrometer ◽  
Double Crystal ◽  
X Ray ◽  
Line Shapes

scholarly journals Mass determination of the charged pion, using high precision X-ray spectroscopy

2020 ◽  
Vol 9 ◽  
pp. 308
Author(s):  
D. F. Anagnostopoulos, et al.
Keyword(s):  
Electronic Transition ◽  
Transition Energy ◽  
Charged Pion ◽  
Pion Mass ◽  
Mass Determination ◽  
Crystal Spectrometer ◽  
X Ray ◽  
Line Shapes ◽  
A Value

X-ray transitions in pionic nitrogen were measured using a curved crystal spectrometer. From the transition energy, calibrated with the help of the copper Ka1,2 electronic transition, a value for the charged pion mass of (139.57071± 0.00053) MeV/c2 was deduced. In order to reduce the uncertainty of the charged pion mass in the level of 1 ppm, we propose the determination of pionic transition energy based on the more precisely known energies and line shapes of muonic transitions.

A Versatile Vacuum Scahhihg Double Crystal Spectrometer for Soft X-Ray Absorption Edge Studies

1969 ◽  
Vol 13 ◽  
pp. 272-288
Author(s):  
A.S. Bhalla ◽  
E.W. White
Keyword(s):  
Absorption Edge ◽  
Vacuum Chamber ◽  
Wavelength Region ◽  
Materials Characterization ◽  
Resolving Power ◽  
Crystal Spectrometer ◽  
Double Crystal ◽  
X Ray ◽  
X Ray Absorption

Studies of the fine structure of absorption edges in the soft x-ray region are becoming increasingly important as a tool for materials characterization. Examples of application includes determination of chemical state of elements, bonding and band structure studies. Intensity and resolving power of the x-ray spectrometer are important experimental considerations. As a rule adjustment of instrumental parameters, such as collimation, to give increased intensity adversely affect resolving power. Optimization of intensity and resolving power must therefore he achieved.A newly designed double crystal spectrometer has been constructed for high-resolution absorption edge studies in the wavelength region of 5Ǻ to 70Ǻ.The entire system is enclosed in a vacuum chamber ion pumped to the 10-7 torr range. The second crystal motion is obtained by means of an ULTRADEX 360-sided polygon and sine arm that is automatically step-scanned. The spectrometer functions equally well in the (l, + l) and (l, - l) orientation and as a precise single crystal spectrometer.

X-Ray Double-Crystal Method of Analyzing Microstrains with BeO Single Crystals

1967 ◽  
Vol 11 ◽  
pp. 394-400
Author(s):  
Jun-ichi Chikawa ◽  
Stanley B. Austerman
Keyword(s):  
Single Crystals ◽  
Incident Beam ◽  
X Rays ◽  
Bragg Condition ◽  
Fraunhofer Diffraction ◽  
Crystal Spectrometer ◽  
Double Crystal ◽  
X Ray ◽  
The Senses

AbstractA double.crystal arrangement was employed in the symmetrical Laue arrangement [(+n, −n) setting]. A perfect BeO crystal was used for the first crystal of the double-crystal spectrometer. To obtain a high X-ray intensity, the thickness of the crystal was made to correspond to a maximum of Pendellosung interference. A slit was pieced between the first and second (specimen) crystals to select the X-rays which precisely satisfy the Bragg condition. The slit was adjusted to avoid significant Fraunhofer diffraction. In this method, the incident beam for the specimen crystal was parallel enough to obtain intrinsic rocking curves of the specimen crystal. As an application, the method was used for determination of the senses of slight strains in BeO crystals.

scholarly journals Atomic Data Needed for X-ray and EUV Astronomy

1992 ◽  
Vol 9 ◽  
pp. 573-574
Author(s):  
John C. Raymond
Keyword(s):  
Spectral Resolution ◽  
Atomic Data ◽  
Ionization State ◽  
Crystal Spectrometer ◽  
X Ray ◽  
Transmission Grating ◽  
Elemental Abundances ◽  
The Past ◽  
Accurate Temperature

AbstractThe astronomical X-ray and EUV satellites of the past generally had low enough spectral resolution that atomic data of modest quality was sufficient for most interpretation of the data. Typical proportional counter resolution Δ E/E ~ 1 permits a determination of the spectral shape sufficient for an estimate of the temperature of the emitting gas, but only the Fe K feature at 6.7 keV stands out as a distinct emission line. The higher spectral resolution Einstein Transmission Grating, Solid State Spectrometer, and Focal Plane Crystal Spectrometer instruments measured a score of emission lines or line blends, permitting determinations of the elemental abundances, temperature, and ionization state of the emitting gas. The higher spectral resolution and throughput of the BBXRT aboard the ASTRO mission and the instruments planned for EUVE, ASTRO-D, AXAF, and XMM will make possible a far more detailed analysis of the data. It should be possible to derive better abundances for more elements, accurate temperature distributions, electron densities, and accurate ionization states.

The resolution of X-ray double-crystal spectrometer in the three beam case

1976 ◽  
Vol 26 (2) ◽  
pp. 117-123
Author(s):  
O. Renner ◽  
J. Bačkovský ◽  
J. Hrdý
Keyword(s):  
Crystal Spectrometer ◽  
Double Crystal ◽  
X Ray

Chemical State Analysis using a Gearless Two-Crystal X-Ray Spectrometer

1991 ◽  
Vol 35 (A) ◽  
pp. 393-399
Author(s):  
Tokuzo Konishi ◽  
Kazuo Nishihagi ◽  
Kazuo Taniguchi
Keyword(s):  
High Resolution ◽  
Systematic Study ◽  
Chemical State ◽  
Crystal Spectrometer ◽  
X Ray ◽  
Analyzer Crystal ◽  
Chemical Effects ◽  
Scanning Range ◽  
State Analysis

A two-crystal spectrometer for chemical state analysis by high-resolution x-ray fluorescence spectrometry employs hall-screw and slide mechanisms rather than gears to obtain a 2θ scanning range of 40° -147°; a Δ2θ scanning step of 10−4 deg under vacuus; a 2θ resolution of 10−4 deg in determination of an intercrystal angle with encoder-based measurement; and servomechanical control of position. The spectrometer, although simple in structure, is a powerful instrument for chemical state analysis, as demonstrated by its high resolution, precision, and stability; as demonstrated in the determination of the Kα1 lines of first transition metals with Si(220) as analyzer crystal, and in its application to a systematic study of the chemical effects on Ni Kα1 and Kα2.

The Determination of Elastic Constants Using a Combination of X-Ray Stress Techniques

1982 ◽  
Vol 26 ◽  
pp. 259-267
Author(s):  
Charles Goldsmith ◽  
George A. Walker
Keyword(s):  
Crystal Lattice ◽  
Powder Diffraction ◽  
Elastic Constants ◽  
Polycrystalline Materials ◽  
Double Crystal ◽  
Lattice Curvature ◽  
X Ray ◽  
Measured Strain ◽  
Crystal Lattice Curvature

AbstractThe powder diffraction x-ray technique commonly used to measure strain in polycrystalline materials requires a knowledge of the elastic constants in order to convert the strain into a stress value. For many materials, these constants are not always known. Another technique to measure strain is the x-ray lattice curvature (substrate bending) method which requires no knowledge of the film elastic constants. The strain is measured in the substrate and requires only the elastic constants of the substrate to convert the measured strain into stress. Using a combination of the powder diffraction technique and a double crystal lattice curvature technique, the elastic constants of TaSi2 and WSi2 have been determined for various crystallographic directions.

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