Dynamical interaction of surface electron-hole pairs with surface defects: Surface spectroscopy monitored by particle emissions

1993 ◽  
Vol 70 (16) ◽  
pp. 2495-2498 ◽  
Author(s):  
Jun’ ichi Kanasaki ◽  
Akiko Okano ◽  
Ken’ ichi Ishikawa ◽  
Yasuo Nakai ◽  
Noriaki Itoh
Keyword(s):  
Surface Defects ◽  
Surface Electron ◽  
Electron Hole ◽  
Particle Emissions ◽  
Dynamical Interaction ◽  
Surface Spectroscopy

Combining atomic imaging, growth, and surface spectroscopy

1995 ◽  
Vol 53 ◽  
pp. 292-293
Author(s):  
L. D. Marks ◽  
C. Collazo ◽  
N Doraiswamy ◽  
D. Grozea ◽  
G. Jayaram ◽  
...  
Keyword(s):  
Diffraction Analysis ◽  
Surface Defects ◽  
Surface Structures ◽  
Noise Levels ◽  
Silicon Structure ◽  
Analysis Techniques ◽  
Transmission Electron ◽  
Surface Spectroscopy ◽  
Subsurface Layers ◽  
Atomic Scattering

UHV transmission electron microscopy brings several advantages to the study of surfaces including direct imaging of surface structures and surface defects with contrast based on atomic scattering and the ability to obtain information from subsurface layers. Over the last several months our research group has implemented several image and diffraction analysis techniques to enhance these advantages and help determine four noble metal induced silicon surface structures. Perhaps the most significant of these techniques are Wiener and Parametric Wiener image filtering to improve signal to noise levels in off axis HREM images of surface structures, two examples of which are shown in Figs. 1 and 2. Figure 1 is a Parametric Wiener filtered, near Schertzer, off-zone HREM image of Si(lll)-(5×2) Au which clearly shows the rows of gold and also contains some information on the silicon structure between the gold rows. With data from images and χ2 diffraction analysis we have found this structure is basically a Si surface dislocation decorated by two rows of gold atoms.

scholarly journals Simple Synthesis and Luminescence Characteristics of PVP-Capped GeO2Nanoparticles

2011 ◽  
Vol 2011 ◽  
pp. 1-5 ◽  
Author(s):  
Wei Wu ◽  
Xu Zou ◽  
Quanjun Li ◽  
Bingbing Liu ◽  
Bo Liu ◽  
...  
Keyword(s):  
Surface Defects ◽  
Hydrothermal Process ◽  
Thermo Gravimetric Analysis ◽  
Gravimetric Analysis ◽  
X Ray Diffraction ◽  
Electron Hole ◽  
Transmission Electron ◽  
Luminescence Characteristics ◽  
Facile Hydrothermal Process ◽  
Hole Recombination

Polyvinylpyrrolidone (PVP)-capped rutile GeO2nanoparticles were synthesized through a facile hydrothermal process. The obtained nanoparticles were characterized by X-ray diffraction (XRD), transmission electron microscopy (TEM), Fourier transform infrared spectroscopy (FTIR), thermo gravimetric analysis (TGA), and photoluminescence spectroscopy (PL). The capped GeO2nanoparticles showed significantly enhanced luminescence properties compared with those of the uncapped ones. We attributed this result to the effect of reducing surface defects and enhancing the possibility of electron-hole recombination of the GeO2nanoparticles by the PVP molecules. PVP-capped GeO2nanoparticles have potential application in optical and electronic fields.

scholarly journals Homojunction and defect synergy-mediated electron–hole separation for solar-driven mesoporous rutile/anatase TiO2 microsphere photocatalysts

RSC Advances ◽  
2019 ◽  
Vol 9 (14) ◽  
pp. 7870-7877 ◽  
Author(s):  
Haoze Li ◽  
Bojing Sun ◽  
Fan Yang ◽  
Zhen Wang ◽  
Yachao Xu ◽  
...  
Keyword(s):  
Synergistic Effect ◽  
Photocatalytic Performance ◽  
Surface Defects ◽  
Anatase Tio2 ◽  
Electron Hole ◽  
Tio2 Microsphere

Mesoporous rutile/anatase TiO2 microspheres with surface defects are fabricated and exhibit excellent solar-driven photocatalytic performance due to synergistic effect of the homojunction and surface defects favoring efficient e–h separation.

scholarly journals Surface Electron-Hole Rich Species Active in the Electrocatalytic Water Oxidation

2021 ◽  
Author(s):  
Juan-Jesús Velasco-Vélez ◽  
Emilia A. Carbonio ◽  
Cheng-Hao Chuang ◽  
Cheng-Jhih Hsu ◽  
Jyh-Fu Lee ◽  
...  
Keyword(s):  
Water Oxidation ◽  
Surface Electron ◽  
Electron Hole

Status of Surface Electron/Hole Layer on Oxide Ferroelectrics

2007 ◽  
Vol 355 (1) ◽  
pp. 13-18 ◽  
Author(s):  
Yukio Watanabe ◽  
Yosuke Urakami ◽  
Sigeru Kaku ◽  
Daisuke Matsumoto
Keyword(s):  
Surface Electron ◽  
Electron Hole

scholarly journals Fermi surface electron–hole instability of the (TMTSF)2PF6 Bechgaard salt revealed by the first-principles Lindhard response function

2020 ◽  
Vol 32 (34) ◽  
pp. 345701
Author(s):  
Bogdan Guster ◽  
Miguel Pruneda ◽  
Pablo Ordejón ◽  
Enric Canadell ◽  
Jean-Paul Pouget
Keyword(s):  
Fermi Surface ◽  
Response Function ◽  
First Principles ◽  
Surface Electron ◽  
Electron Hole ◽  
Bechgaard Salt

Defects in Crystals

1968 ◽  
Vol 26 ◽  
pp. 244-245
Author(s):  
Kenneth R. Lawless
Keyword(s):  
Electron Microscope ◽  
Point Defects ◽  
Surface Defects ◽  
Chemical Properties ◽  
Material Point ◽  
Crystal Defects ◽  
Defects In Crystals ◽  
Irradiation Effects ◽  
Normal Lattice ◽  
Line Defects

One of the most important applications of the electron microscope in recent years has been to the observation of defects in crystals. Replica techniques have been widely utilized for many years for the observation of surface defects, but more recently the most striking use of the electron microscope has been for the direct observation of internal defects in crystals, utilizing the transmission of electrons through thin samples.Defects in crystals may be classified basically as point defects, line defects, and planar defects, all of which play an important role in determining the physical or chemical properties of a material. Point defects are of two types, either vacancies where individual atoms are missing from lattice sites, or interstitials where an atom is situated in between normal lattice sites. The so-called point defects most commonly observed are actually aggregates of either vacancies or interstitials. Details of crystal defects of this type are considered in the special session on “Irradiation Effects in Materials” and will not be considered in detail in this session.

Characterization of homoepitaxial diamond films by Electron microscopy

1991 ◽  
Vol 49 ◽  
pp. 880-881
Author(s):  
D.P. Malta ◽  
S.A. Willard ◽  
R.A. Rudder ◽  
G.C. Hudson ◽  
J.B. Posthill ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Surface Defects ◽  
Substrate Surface ◽  
Diamond Films ◽  
Chemical Vapor ◽  
Polycrystalline Diamond ◽  
Large Degree ◽  
Rf Plasma ◽  
Semiconducting Diamond

Semiconducting diamond films have the potential for use as a material in which to build active electronic devices capable of operating at high temperatures or in high radiation environments. A major goal of current device-related diamond research is to achieve a high quality epitaxial film on an inexpensive, readily available, non-native substrate. One step in the process of achieving this goal is understanding the nucleation and growth processes of diamond films on diamond substrates. Electron microscopy has already proven invaluable for assessing polycrystalline diamond films grown on nonnative surfaces.The quality of the grown diamond film depends on several factors, one of which is the quality of the diamond substrate. Substrates commercially available today have often been found to have scratched surfaces resulting from the polishing process (Fig. 1a). Electron beam-induced current (EBIC) imaging shows that electrically active sub-surface defects can be present to a large degree (Fig. 1c). Growth of homoepitaxial diamond films by rf plasma-enhanced chemical vapor deposition (PECVD) has been found to planarize the scratched substrate surface (Fig. 1b).

ESEM - A multipurpose surface Electron Microscope

1986 ◽  
Vol 44 ◽  
pp. 632-633 ◽  
Author(s):  
G.D. Danilatos
Keyword(s):  
Electron Microscope ◽  
Room Temperature ◽  
Environmental Scanning ◽  
Gas Composition ◽  
Saturated Water Vapor ◽  
Surface Electron ◽  
Current State ◽  
Saturated Water ◽  
New Type ◽  
Temperature And Pressure

Over recent years a new type of electron microscope - the environmental scanning electron microscope (ESEM) - has been developed for the examination of specimen surfaces in the presence of gases. A detailed series of reports on the system has appeared elsewhere. A review summary of the current state and potential of the system is presented here.The gas composition, temperature and pressure can be varied in the specimen chamber of the ESEM. With air, the pressure can be up to one atmosphere (about 1000 mbar). Environments with fully saturated water vapor only at room temperature (20-30 mbar) can be easily maintained whilst liquid water or other solutions, together with uncoated specimens, can be imaged routinely during various applications.

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