Two- and Three-Beam X-ray Diffraction Imaging of Domains in Magnetite

1998 ◽  
Vol 31 (5) ◽  
pp. 726-732
Author(s):  
C. Medrano ◽  
F. Heyroth ◽  
M. Schlenker ◽  
J. Baruchel ◽  
J. Espeso
Keyword(s):  
Synchrotron Radiation ◽  
Room Temperature ◽  
X Ray Diffraction ◽  
Large Crystal ◽  
Angular Sensitivity ◽  
X Ray ◽  
Diffraction Imaging ◽  
The Difference ◽  
Topographic Imaging ◽  
Radiation Beams

The X-ray diffraction topographic imaging process for ferrimagnetic domains in magnetite Fe3O4at room temperature is investigated, in two- and three-beam cases, for incident synchrotron radiation beams differing in angular divergence and energy spread. In the usual two-beam configuration, domain or wall contrast is obtained from the difference in Bragg conditions, or from the slight difference in the direction of the beams diffracted by neighbouring domains, revealed by the large crystal-to-film distance that can be used at a third-generation synchrotron radiation facility. A three-beamUmweganregungcase involving the weak 171 and the strong 131 reflections shows unusual domain contrast on the 171 topographs, even on images involving energy or angle integration; this contrast is particularly evident on white-beam topographs. The high angular sensitivity this implies is associated with the difference in dispersion relation between the two reflections.

scholarly journals X-ray imaging of silicon die within fully packaged semiconductor devices

2021 ◽  
pp. 1-7
Author(s):  
Brian K. Tanner ◽  
Patrick J. McNally ◽  
Andreas N. Danilewsky
Keyword(s):  
Synchrotron Radiation ◽  
Feasibility Studies ◽  
Monochromatic Radiation ◽  
X Ray Diffraction ◽  
Divergent Beam ◽  
X Ray ◽  
X Ray Imaging ◽  
Setting Process ◽  
Diffraction Imaging ◽  
Lattice Planes

X-ray diffraction imaging (XRDI) (topography) measurements of silicon die warpage within fully packaged commercial quad-flat no-lead devices are described. Using synchrotron radiation, it has been shown that the tilt of the lattice planes in the Analog Devices AD9253 die initially falls, but after 100 °C, it rises again. The twist across the die wafer falls linearly with an increase in temperature. At 200 °C, the tilt varies approximately linearly with position, that is, displacement varies quadratically along the die. The warpage is approximately reversible on cooling, suggesting that it has a simple paraboloidal form prior to encapsulation; the complex tilt and twisting result from the polymer setting process. Feasibility studies are reported, which demonstrate that a divergent beam and quasi-monochromatic radiation from a sealed X-ray tube can be used to perform warpage measurements by XRDI in the laboratory. Existing tools have limitations because of the geometry of the X-ray optics, resulting in applicability only to simple warpage structures. The necessary modifications required for use in situations of complex warpage, for example, in multiple die interconnected packages are specified.

scholarly journals Structural Study of δ-AlOOH Up to 29 GPa

Minerals ◽  
2020 ◽  
Vol 10 (12) ◽  
pp. 1055
Author(s):  
Dariia Simonova ◽  
Elena Bykova ◽  
Maxim Bykov ◽  
Takaaki Kawazoe ◽  
Arkadiy Simonov ◽  
...  
Keyword(s):  
Phase Transition ◽  
Synchrotron Radiation ◽  
Equation Of State ◽  
Room Temperature ◽  
Diamond Anvil Cell ◽  
Volume Data ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diamond Anvil ◽  
Murnaghan Equation

A structure and equation of the state of δ-AlOOH has been studied at room temperature, up to 29.35 GPa, by means of single crystal X-ray diffraction in a diamond anvil cell using synchrotron radiation. Above ~10 GPa, we observed a phase transition with symmetry changes from P21nm to Pnnm. Pressure-volume data were fitted with the second order Birch-Murnaghan equation of state and showed that, at the phase transition, the bulk modulus (K0) of the calculated wrt 0 pressure increases from 142(5) to 216(5) GPa.

Fe K-Edge XAFS Study of Slate Powders Heat Treated up to 1000°C

2010 ◽  
Vol 636-637 ◽  
pp. 922-927
Author(s):  
Fernando A. Costa Oliveira ◽  
Hiroaki Nitani ◽  
T. Nakagawa ◽  
T.A. Yamamoto ◽  
Nobumitsu Shohoji
Keyword(s):  
Synchrotron Radiation ◽  
Short Range ◽  
Short Range Order ◽  
Colour Change ◽  
X Ray Diffraction ◽  
X Ray ◽  
Heat Treated ◽  
Increasing Temperature ◽  
Radiation Beams ◽  
Variable Energy

The use of ultra-bright, highly directional, high and variable energy associated to synchrotron radiation beams at SPring-8 when compared with conventional X-Ray diffraction analysis applied to slate powders heat treated at temperatures in the range of 600°C up to 1000°C is reported. Fe K-edge XAFS measurements of the products formed upon heating slate showed that in the temperature range 600-800°C, conversion of FeO present in the as-received slate powder into a mixed -Fe2O3/-Fe2O3 has occurred providing useful information on the short-range order atomic structure of the slate. Above 800°C, mainly -Fe2O3 was identified to be present in the slate. The change of the Fe valences within the slate network is most likely responsible for the detected colour change with the increasing temperature.

Stress in Sputtered Co90Fe10/Ag GMR Multilayers

1996 ◽  
Vol 436 ◽  
Author(s):  
J. D. Jarratt ◽  
V. R. Inturi ◽  
J. L. Weston ◽  
J. A. Barnard
Keyword(s):  
Giant Magnetoresistance ◽  
Room Temperature ◽  
Multilayer Films ◽  
Antiferromagnetic Coupling ◽  
High Temperature Annealing ◽  
X Ray Diffraction ◽  
Hexagonal Symmetry ◽  
Individual Layer ◽  
X Ray ◽  
The Difference

AbstractStress, giant magnetoresistance (GMR), structure, and magnetic properties of sputtered (Co90Fe10X Å/Ag Y Å)×20 multilayer films have been investigated at room temperature where X ranges from 7.5 to 25 Å and Y from 10 to 60 Å. These films exhibit distinct GMR behaviors dependent on individual layer thicknesses, including layered granular-type GMR in CoFe 7.5 Å samples and ‘discontinuous’ GMR (DGMR) in CoFe 15 and 25 Å samples with Ag thicknesses over 30 Å. No antiferromagnetic coupling was observed. CoFe 10 Å samples act as a transition between GMR behaviors. Compressive stress decreases with increasing Ag thickness in the CoFe 7.5 Å samples. In the CoFe 15 and 25 Å samples the stress fluctuates similarly depending on Ag thickness. The difference in stress and MR behavior between the CoFe 7.5 Å and the 15 and 25 Å samples is thought to be due to incomplete CoFe layering in the CoFe 7.5 Å samples. In the CoFe 15 Å DGMR samples, high temperature annealing resulted in tensile stresses large enough to cause film detachment. X-ray diffraction reveals a strong (111) growth texture as well as satellite peaks from coherent layering. This (111) texture is also evidenced by patterns with hexagonal symmetry formed by the detached films.

Internal Oxidation and Mechanical Properties of Pt-IrO2 Thin Films

2003 ◽  
Vol 795 ◽  
Author(s):  
Richard R. Chromik ◽  
Thirumalesh Bannuru ◽  
Richard P. Vinci
Keyword(s):  
Mechanical Properties ◽  
Residual Stress ◽  
Photoelectron Spectroscopy ◽  
Thermal Cycle ◽  
Room Temperature ◽  
Sputter Deposition ◽  
X Ray Diffraction ◽  
X Ray ◽  
The Difference ◽  
Pt Films

ABSTRACTPt-IrO2 films, approximately 200 nm thick, were fabricated by co-sputter deposition of Pt and Ir in an Ar-O2 mixture followed by annealing at 700°C in O2 for 4 hours. X-ray photoelectron spectroscopy and x-ray diffraction measurements indicate the presence of IrO2 throughout the thickness of the films. After a thermal cycle in vacuum to 700°C, the room temperature residual stress is significantly lower in the internally oxidized films than in pure Pt films of similar thickness subjected to identical cycling. Initial analysis of the behavior of the films during thermal cycling indicates that the primary cause for the difference in residual stress level is a decrease in the thermoelastic slope associated with the introduction of IrO2.

Study on the Structure and Electrochromism of WO3 and Ti-Doped WO3 Films

2008 ◽  
Vol 373-374 ◽  
pp. 726-729
Author(s):  
Li Ge Wang ◽  
Guo Qing Li ◽  
Yuan Rong Hu ◽  
Wei Gou ◽  
Meng Shi
Keyword(s):  
Photoelectron Spectroscopy ◽  
Room Temperature ◽  
Lattice Distortion ◽  
Response Speed ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Structure Morphology ◽  
The Difference ◽  
Deposited Films

WO3 and Ti-doped WO3 electrochromic films were prepared by mid-frequency dual-target magnetron sputtering method. X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), transmission electron microscope (TEM) and spectrophotometer were used to characterize the structure, morphology, composition and transmittance properties of the films, respectively. The results show that this method is available to deposit WO3 and Ti-doped WO3 electrochromic films. The as-deposited films prepared at room temperature are amorphous and display good transmittance. The difference value of transmittance between the bleached and coloration states of WO3 film is above 60% at 633nm. Ti-doped WO3 films have smoother surface and smaller grains than undoped ones. Moreover, the crystalline temperature increases after doping titanium, because the titanium atoms influence the lattice distortion of the WO3 films. So it is more convenient for Li+ ions to inject into films and can enhance the response speed and stability of Ti-doped WO3 electrochromic films.

scholarly journals Локализация моноклинной фазы в насцентных частицах сверхвысокомолекулярного полиэтилена

2020 ◽  
Vol 62 (8) ◽  
pp. 1326
Author(s):  
Д.В. Анохин ◽  
К.Н. Графская ◽  
Д.А. Иванов ◽  
Е.М. Иванькова ◽  
В.А. Марихин ◽  
...  
Keyword(s):  
Molecular Weight ◽  
Synchrotron Radiation ◽  
Room Temperature ◽  
Monoclinic Phase ◽  
Orthorhombic Phase ◽  
European Synchrotron Radiation Facility ◽  
X Ray Diffraction ◽  
X Ray ◽  
External Stresses ◽  
Ultra High Molecular Weight

Annotation The X-ray analysis of a virgin particle taken directly from the synthesis products of an ultra-high molecular weight polyethylene (UHMWPE) and not subjected to any external stresses was carried out using nanofocus beamline ID13 European Synchrotron Radiation Facility (ESRF, Grenoble,France). In the X-ray diffraction curves obtained by scanning an arbitrarily selected portion of a particle with a size of (100 x 20) μm2 by a microbeam (0.3 x 0.3) μm2 with a step of 2 μm horizontally and 0.5 μm vertically, along with reflections from the orthorhombic phase, reflexes from the metastable monoclinic phase were observed. It is believed that the cause of its occurrence may be stresses that develop during specific structure formation in slurry synthesis and persist when cooled to room temperature and the solvent evaporates. The possibility of localization of the monoclinic phase in various morphological formations is discussed.

In-Situ Investigations of the Martensitic Transformation in TiNi by Synchrotron Radiation

1999 ◽  
Vol 121 (1) ◽  
pp. 56-60 ◽  
Author(s):  
S. N. Kulkov ◽  
Yu. P. Mironov
Keyword(s):  
Martensitic Transformation ◽  
Synchrotron Radiation ◽  
Martensite Transformation ◽  
Room Temperature ◽  
Diffraction Method ◽  
X Ray Diffraction ◽  
Initial State ◽  
X Ray

By means of synchrotron X-ray diffraction method the stress-induced martensite transformation in TiNi (with two different phase compositions) at room temperature was investigated in situ. It has been shown that in the alloys with temperature-induced martensite in the initial state a nonperiodic fluctuation of intensity of the X-ray reflexes appeared due to anomalous transformation B2 + B19′T → B2 → B19′Si.

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