scholarly journals A diffraction effect in X-ray area detectors

2014 ◽  
Vol 47 (1) ◽  
pp. 378-383 ◽  
Author(s):  
Christian Gollwitzer ◽  
Michael Krumrey
Keyword(s):  
Bragg Reflection ◽  
Energy Calibration ◽  
Diffraction Effect ◽  
Pixel Detector ◽  
Sensor Layer ◽  
X Ray ◽  
Area Detector ◽  
X Ray Scattering ◽  
Detector Surface ◽  
Individual Detector

When an X-ray area detector based on a single-crystalline material, for instance a state-of-the-art hybrid pixel detector, is illuminated from a point source by monochromatic radiation, a pattern of lines appears which overlays the detected image. These lines are easily seen in scattering experiments with smooth patterns, such as small-angle X-ray scattering. The origin of this effect is Bragg reflection within the sensor layer of the detector. Experimental images are presented over a photon energy range from 3.4 to 10 keV, together with a theoretical analysis. The intensity of the detected signal is decreased by up to 20% on this pattern, which can affect the evaluation of scattering and diffraction experiments. The patterns can be exploited to check the alignment of the detector surface with the direct beam, and the alignment of individual detector modules with each other in the case of modular detectors, as well as for energy calibration of the radiation.

In situ X-ray Scattering Study of the Formation of Au Nano Crystals During Thermal Annealing

2007 ◽  
Vol 1027 ◽  
Author(s):  
Do Young Noh ◽  
Ki-Hyun Ryu ◽  
Hyon Chol Kang
Keyword(s):  
Thermal Annealing ◽  
Bragg Reflection ◽  
Ex Situ ◽  
X Ray ◽  
Force Microscopy ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Au Thin Films ◽  
Ray Scattering

AbstractThe transformation of Au thin films grown on sapphire (0001) substrates into nano crystals during thermal annealing was investigated by in situ synchrotron x-ray scattering and ex situ atomic force microscopy (AFM). By monitoring the Au(111) Bragg reflection and the low Q reflectivity and comparing them with ex situ AFM images, we found that polygonal-shape holes were nucleated and grow initially. As the holes grow larger and contact each other, their boundary turns into Au nano crystals. The Au nano crystals have a well-defined (111) flat top surface and facets in the in-plane direction.

scholarly journals ASAXS study of CaF2nanoparticles embedded in a silicate glass matrix

2014 ◽  
Vol 47 (1) ◽  
pp. 60-66 ◽  
Author(s):  
Armin Hoell ◽  
Zoltan Varga ◽  
Vikram Singh Raghuwanshi ◽  
Michael Krumrey ◽  
Christian Bocker ◽  
...  
Keyword(s):  
Heat Treatment ◽  
Spatial Distribution ◽  
Glass Matrix ◽  
Structural Parameters ◽  
Pixel Detector ◽  
Oxyfluoride Glass ◽  
X Ray ◽  
X Ray Scattering ◽  
Silicate Glass Matrix

The formation and growth of nanosized CaF2crystallites by heat treatment of an oxyfluoride glass of composition 7.65Na2O–7.69K2O–10.58CaO–12.5CaF2–5.77Al2O3–55.8SiO2(wt%) was investigated using anomalous small-angle X-ray scattering (ASAXS). A recently developed vacuum version of the hybrid pixel detector Pilatus 1M was used for the ASAXS measurements below the CaK-edge of 4038 eV down to 3800 eV. ASAXS investigation allows the determination of structural parameters such as size and size distribution of nanoparticles and characterizes the spatial distribution of the resonant element, Ca. The method reveals quantitatively that the growing CaF2crystallites are surrounded by a shell of lower electron density. This depletion shell of growing thickness hinders and finally limits the growth of CaF2crystallites. Moreover, in samples that were annealed for 10 h and more, additional very small heterogeneities (1.6 nm diameter) were found.

scholarly journals Reciprocal-space imaging of a real quasicrystal. A feasibility study with PILATUS 6M

2008 ◽  
Vol 41 (4) ◽  
pp. 669-674 ◽  
Author(s):  
Thomas Weber ◽  
Sofia Deloudi ◽  
Miroslav Kobas ◽  
Yoshihiko Yokoyama ◽  
Akihisa Inoue ◽  
...  
Keyword(s):  
Diffuse Scattering ◽  
Dynamic Range ◽  
Single Photon ◽  
Bragg Reflection ◽  
Photon Counting ◽  
Structural Disorder ◽  
Icosahedral Quasicrystal ◽  
Pixel Detector ◽  
Area Detector ◽  
Free Data

How many of the theoretically densely distributed Bragg reflections of a quasicrystal can be observed employing an area detector and synchrotron radiation? How does the reflection density of a real quasicrystal change as a function of exposure time, and what is the minimum distance between reflections? What does the distribution of diffuse scattering look like? To answer these questions, the Bragg reflection density of a perfect icosahedral quasicrystal with composition Al64Cu23Fe13was measured employing a novel type of single-photon-counting X-ray pixel detector, PILATUS 6M, which allows noise-free data collection with the extraordinarily large dynamic range of 20 bit. The reflection density was found to be two orders of magnitude lower than expected for a strictly quasiperiodic structure. Moreover, diffuse scattering reflects significant structural disorder, breaking six-dimensionalF-lattice symmetry. These findings have some implications for the interpretation of physical properties.

scholarly journals Improved data acquisition in grazing-incidence X-ray scattering experiments using a pixel detector

2005 ◽  
Vol 61 (4) ◽  
pp. 418-425 ◽  
Author(s):  
C. M. Schlepütz ◽  
R. Herger ◽  
P. R. Willmott ◽  
B. D. Patterson ◽  
O. Bunk ◽  
...  
Keyword(s):  
Data Acquisition ◽  
Grazing Incidence ◽  
Pixel Detector ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals Double-Exposure Method with Synchrotron White X-ray for Stress Evaluation of Coarse-Grain Materials

2020 ◽  
Vol 4 (3) ◽  
pp. 25
Author(s):  
Kenji Suzuki ◽  
Ayumi Shiro ◽  
Hidenori Toyokawa ◽  
Choji Saji ◽  
Takahisa Shobu
Keyword(s):  
High Energy ◽  
Coarse Grained ◽  
X Rays ◽  
Pixel Detector ◽  
Bending Stress ◽  
Double Exposure ◽  
X Ray ◽  
Area Detector ◽  
Exposure Method ◽  
Coarse Grained Material

Stress measurements of coarse-grained material are difficult using synchrotron X-ray diffraction because the diffraction patterns of coarse-grained materials are spotty. In addition, the center of the diffraction pattern is unknown for the transmitted X-ray beam. Here, a double-exposure method is proposed as the countermeasure against this issue. In the experiment, we introduce a CdTe pixel detector. The detector is a newly developed area detector and can resolve high-energy X-rays. The strains of the coarse-grained material can be measured using a combination of the double-exposure method, white synchrotron X-ray, and the CdTe pixel detector. The bending stress in an austenitic stainless steel plate was measured using the proposed technique. As a result, the measured stress corresponded to the applied bending stress.

Energy calibration of a high-resolution inelastic x-ray scattering spectrometer

2008 ◽  
Vol 79 (8) ◽  
pp. 083902 ◽  
Author(s):  
Roberto Verbeni ◽  
Matteo D’Astuto ◽  
Michael Krisch ◽  
Maren Lorenzen ◽  
Alain Mermet ◽  
...  
Keyword(s):  
High Resolution ◽  
Energy Calibration ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Structural properties of ultra-low-energy ion-implanted silicon studied by combined X-ray scattering methods

2006 ◽  
Vol 39 (4) ◽  
pp. 571-581 ◽  
Author(s):  
L. Capello ◽  
T. H. Metzger ◽  
V. Holý ◽  
M. Servidori ◽  
A. Malachias
Keyword(s):  
Structural Characterization ◽  
Bragg Reflection ◽  
Complete Characterization ◽  
Low Energy ◽  
Diffuse Intensity ◽  
Near Surface ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

The use of a combination of X-ray scattering techniques for the complete characterization of ultra-low-energy (E< 5 keV) implanted Si is discussed. Grazing incidence diffuse X-ray scattering (GI-DXS) reveals the properties of the defects confined within thin crystalline layers with depth resolution. Due to the weak diffuse intensity arising from such defects, the high brilliance of synchrotron radiation is required. GI-DXS proved to be particularly well suited for the investigation of the so-called `end-of-range' defects. In a complementary way, X-ray diffraction (XRD) in the vicinity of the 004 Bragg reflection is sensitive to the distribution of the strain in the Si lattice in the direction perpendicular to the sample surface. The structural characterization is complemented by the electron density profile of the near-surface amorphous region provided by specular reflectivity (SR). It will be shown that only by merging the results obtained with GI-DXS, XRD and SR, is it possible to obtain the detailed structural characterization of the implanted Si samples.

Solution small-angle X-ray scattering studies on myosin with a multiwire area detector

1991 ◽  
Vol 24 (5) ◽  
pp. 852-856 ◽  
Author(s):  
A. R. Faruqi ◽  
R. A. Cross ◽  
J. Kendrick-Jones
Keyword(s):  
Small Angle ◽  
X Ray ◽  
Area Detector ◽  
X Ray Scattering ◽  
Ray Scattering
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