In situ X-ray Scattering Study of the Formation of Au Nano Crystals During Thermal Annealing

2007 ◽  
Vol 1027 ◽  
Author(s):  
Do Young Noh ◽  
Ki-Hyun Ryu ◽  
Hyon Chol Kang
Keyword(s):  
Thermal Annealing ◽  
Bragg Reflection ◽  
Ex Situ ◽  
X Ray ◽  
Force Microscopy ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Au Thin Films ◽  
Ray Scattering

AbstractThe transformation of Au thin films grown on sapphire (0001) substrates into nano crystals during thermal annealing was investigated by in situ synchrotron x-ray scattering and ex situ atomic force microscopy (AFM). By monitoring the Au(111) Bragg reflection and the low Q reflectivity and comparing them with ex situ AFM images, we found that polygonal-shape holes were nucleated and grow initially. As the holes grow larger and contact each other, their boundary turns into Au nano crystals. The Au nano crystals have a well-defined (111) flat top surface and facets in the in-plane direction.

Hydrolysis of the Nafion® precursor studied by X-ray scattering and in-situ atomic force microscopy

e-Polymers ◽  
2001 ◽  
Vol 1 (1) ◽  
Author(s):  
James A. Elliott ◽  
Paul J. James ◽  
Terence J. McMaster ◽  
John M. Newton ◽  
Alice M. S. Elliott ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Wide Angle ◽  
Ionic Clusters ◽  
X Ray ◽  
Force Microscopy ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Hydrolysis Of ◽  
Ray Scattering

AbstractThe hydrolysis of Nafion® † precursor material to a perfluorosulfonate ion exchange membrane has been studied in situ at the surface of a sample using atomic force microscopy (AFM), and in the bulk using a combination of small and wide-angle X-ray scattering. The AFM results show that there is a rapid and significant change in the surface morphology of the sample during the first 12 min after the introduction of aqueous hydroxyl ions, provided that an appropriate swelling agent is used. After this point there is little change in surface morphology, although bulk swelling of the sample continues. The wide-angle X-ray scattering results indicate a significant drop in the degree of crystallinity of fluorocarbon matrix from 14±1% to 7±1% on hydrolysis, as a result of the bulk structural reordering necessary to accommodate the formation of ionic clusters. Ionic clustering is confirmed by the appearance of a characteristic small-angle X-ray peak. However, the peak forms towards the end of the hydrolysis process, and subsequently coarsens, suggesting that the formation of ionic clusters is a slow process compared to the rate of hydrolysis. It is confirmed that an appropriate water/solvent mixture is necessary to achieve an efficient conversion of precursor to membrane. AFM images of the precursor surface, when water alone is used, show no signs of structural change.

scholarly journals Bicontinuous Gyroid Phase of a Water-Swollen Wedge-Shaped Amphiphile: Studies with In-Situ Grazing-Incidence X-ray Scattering and Atomic Force Microscopy

Materials ◽  
2021 ◽  
Vol 14 (11) ◽  
pp. 2892
Author(s):  
Kseniia N. Grafskaia ◽  
Azaliia F. Akhkiamova ◽  
Dmitry V. Vashurkin ◽  
Denis S. Kotlyarskiy ◽  
Diego Pontoni ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Environmental Conditions ◽  
Grazing Incidence ◽  
X Ray ◽  
Force Microscopy ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Double Gyroid ◽  
Ray Scattering

We report on formation of a bicontinuous double gyroid phase by a wedge-shaped amphiphilic mesogen, pyridinium 4′-[3″,4″,5″-tris-(octyloxy)benzoyloxy]azobenzene-4-sulfonate. It is found that this compound can self-organize in zeolite-like structures adaptive to environmental conditions (e.g., temperature, humidity, solvent vapors). Depending on the type of the phase, the structure contains 1D, 2D, or 3D networks of nanometer-sized ion channels. Of particular interest are bicontinuous phases, such as the double gyroid phase, as they hold promise for applications in separation and energy. Specially designed environmental cells compatible with grazing-incidence X-ray scattering and atomic force microscopy enable simultaneous measurements of structural parameters/morphology during vapor-annealing treatment at different temperatures. Such in-situ approach allows finding the environmental conditions at which the double gyroid phase can be formed and provide insights on the supramolecular structure of thin films at different spatial levels.

Comparative study of the roughness of optical surfaces and thin films by use of x-ray scattering and atomic force microscopy

1999 ◽  
Vol 38 (4) ◽  
pp. 684 ◽  
Author(s):  
Victor E. Asadchikov ◽  
Angela Duparré ◽  
Stefan Jakobs ◽  
Albert Yu. Karabekov ◽  
Igor V. Kozhevnikov ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Comparative Study ◽  
X Ray ◽  
Force Microscopy ◽  
Optical Surfaces ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Ray Scattering

(G03 Best Paper Award Winner) Analysis of Sn Behavior During Ni/GeSn Solid-State Reaction by Correlated X-ray Diffraction, Atomic Force Microscopy, and Ex-situ/In-situ Transmission Electron Microscopy

2020 ◽  
Vol MA2020-02 (24) ◽  
pp. 1750-1750
Author(s):  
Andrea Quintero Colmenares ◽  
Patrice Gergaud ◽  
Jean-Michel Hartmann ◽  
Vincent Delaye ◽  
Nicolas Bernier ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Ex Situ ◽  
Paper Award ◽  
X Ray Diffraction ◽  
Award Winner ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron

The surface roughness investigation by the atomic force microscopy, x-ray scattering, and light scattering

2006 ◽  
Author(s):  
M. L. Zanaveskin ◽  
Yu. V. Grishchenko ◽  
A. L. Tolstikhina ◽  
V. E. Asadchikov ◽  
B. S. Roshchin ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Light Scattering ◽  
X Ray ◽  
Force Microscopy ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Ray Scattering

Grazing Incidence X-Ray Scattering Studies of the Structure and Morphology of the Ni/Mgo(001), Co/Nio(111) and Nife/Nio(111) Interfaces During their in Situ Growth

1999 ◽  
Vol 562 ◽  
Author(s):  
G. Renaud ◽  
A. Barbier ◽  
C. Mocuta
Keyword(s):  
High Temperature ◽  
Magnetic Measurements ◽  
Grazing Incidence ◽  
Ex Situ ◽  
Crystallographic Structure ◽  
Temperature Oxidation ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

ABSTRACTCombined in situ structural and ex situ magnetic studies of the Co/NiO(111) and Ni81Fe19/NiO(111) interfaces are presented. The Co and Permalloy films were grown on NiO(111) single crystals. Structural studies were performed by Grazing Incidence X-ray Scattering during growth. The effect of the temperature of the substrate during deposition was investigated. Under specific growth conditions, almost pure FCC Co and NiFe films can be obtained, with small quantities of twins. Magnetic measurements were performed ex situ by Magneto-Optical Kerr Effect (MOKE). A strong correlation between the magnetic properties and the crystallographic structure of the Co film is evidenced. High coercive fields are measured for all samples. High temperature annealing of the NiFe film leads to an improved crystalline quality, but the interface becomes reactive and diffuse: part of the Fe diffuses into the NiO substrate and forms an interface compound, likely to be the spinel NiFe2O4. We also report an in situ grazing incidence X-ray scattering study of the Ni/MgO(001) interface during its formation at room temperature. In-plane measurements reveal that the interface is sharp and that the epitaxial relationship is complex. Two distinct lattices are found to exist: expanded Ni(001) and Ni(110). The latter exhibits several orientations with respect to the substrate depending on the thickness. The Ni(110) orientations disappear by annealing at high temperature, leaving only the Ni cube/cube orientation. The layer was also almost fully transformed into NiO(001) by high temperature oxidation.

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