In situ observation of void evolution in 1,3,5-triamino-2,4,6-trinitrobenzene under compression by synchrotron radiation X-ray nano-computed tomography

2020 ◽  
Vol 27 (1) ◽  
pp. 127-133 ◽  
Author(s):  
Liang Chen ◽  
Lihui Wu ◽  
Yu Liu ◽  
Wei Chen

The formation and development of voids in 1,3,5-triamino-2,4,6-trinitrobenzene crystals under compression were characterized in situ by X-ray nano-computed tomography. Benefiting from high spatial resolution (30 nm) and excellent imaging contrast, the X-ray nano-computed tomography images revealed the presence of a small fraction of inhomogeneous structures in the original crystal (volume ratio ∼1.2%). Such an inhomogeneity acts as a nucleation of voids and produces stress concentration during compression, which leads to continuous growth of the voids under loading. Meanwhile, the results further reveal that the developing voids are not isotropic: voids with higher surface roughness and irregular structures are easier to break and form new micro-voids. These new voids with higher irregular structures are weaker and easier to break into smaller ones compared with the originals, leading to the development of voids along these weak zones. Finally large voids form. The experiments allow direct investigation of void formation and development, which helps in studying the mechanisms of void development and energetic materials deterioration during manufacturing and transporting.

2015 ◽  
Vol 754-755 ◽  
pp. 508-512
Author(s):  
M.A.A. Mohd Salleh ◽  
A. Sugiyama ◽  
Hideyuki Yasuda ◽  
Stuart D. McDonald ◽  
Kazuhiro Nogita

This paper demonstrates the development of an experimental technique of in-situ observation for soldering of Sn-0.7wt%Cu lead-free solder on a Cu substrate which was achieved for the first time by synchrotron X-ray imaging. Reactions between liquid solder and Cu substrate during a soldering process were able to be recorded in real-time. Individual stages of the soldering process consisted of flux activation in removal of Cu oxide, solder melting and contact with the Cu substrate (wetting) and intermetallic compound (IMC) and void formation between the solder and Cu substrate. The technique development which includes experimental setup with calculated optimum beam energy in the range of 20 – 30 keV appears to result in a clear observation of real-time X-ray imaging of the soldering process. This technique provides a key method to understand the mechanism of formation of micro-electronic inter-connects for future electronic packaging applications.


1993 ◽  
Vol 308 ◽  
Author(s):  
Paul R. Besser ◽  
Thomas N. Marieb ◽  
John C. Bravman

ABSTRACTStrain relaxation in passivated Al-0.5% Cu lines was measured using X-ray diffraction coupled with in-situ observation of the formation and growth of stress induced voids. Samples of 1 μm thick Al-0.5% Cu lines passivated with Si3N4 were heated to 380ºC, then cooled and held at 150ºC. During the test, principal strains along the length, width, and height of the line were determined using a grazing incidence x-ray geometry. From these measurements the hydrostatic strain in the metal was calculated and strain relaxation was observed. The thermal cycle was duplicated in a high voltage scanning transmission electron microscope equipped with a backscattered electron detector. The 1.25 μm wide lines were seen to have initial stress voids. Upon heating these voids reduced in size until no longer observable. Once the samples were cooled to 150ºC, voids reappeared and grew. The measured strain relaxation is discussed in terms of void and θ-phase (Al2Cu) formation.


2021 ◽  
Vol 20 ◽  
pp. 153303382110101
Author(s):  
Thet-Thet Lwin ◽  
Akio Yoneyama ◽  
Hiroko Maruyama ◽  
Tohoru Takeda

Phase-contrast synchrotron-based X-ray imaging using an X-ray interferometer provides high sensitivity and high spatial resolution, and it has the ability to depict the fine morphological structures of biological soft tissues, including tumors. In this study, we quantitatively compared phase-contrast synchrotron-based X-ray computed tomography images and images of histopathological hematoxylin-eosin-stained sections of spontaneously occurring rat testicular tumors that contained different types of cells. The absolute densities measured on the phase-contrast synchrotron-based X-ray computed tomography images correlated well with the densities of the nuclear chromatin in the histological images, thereby demonstrating the ability of phase-contrast synchrotron-based X-ray imaging using an X-ray interferometer to reliably identify the characteristics of cancer cells within solid soft tissue tumors. In addition, 3-dimensional synchrotron-based phase-contrast X-ray computed tomography enables screening for different structures within tumors, such as solid, cystic, and fibrous tissues, and blood clots, from any direction and with a spatial resolution down to 26 μm. Thus, phase-contrast synchrotron-based X-ray imaging using an X-ray interferometer shows potential for being useful in preclinical cancer research by providing the ability to depict the characteristics of tumor cells and by offering 3-dimensional information capabilities.


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