scholarly journals Background modelling of diffraction data in the presence of ice rings

IUCrJ ◽  
2017 ◽  
Vol 4 (5) ◽  
pp. 626-638 ◽  
Author(s):  
James M. Parkhurst ◽  
Andrea Thorn ◽  
Melanie Vollmar ◽  
Graeme Winter ◽  
David G. Waterman ◽  
...  
Keyword(s):  
Diffraction Data ◽  
Bragg Reflection ◽  
Background Model ◽  
Data Sets ◽  
Systematic Bias ◽  
X Ray Diffraction ◽  
Data Set ◽  
X Ray ◽  
Local Background ◽  
Global Background

An algorithm for modelling the background for each Bragg reflection in a series of X-ray diffraction images containing Debye–Scherrer diffraction from ice in the sample is presented. The method involves the use of a global background model which is generated from the complete X-ray diffraction data set. Fitting of this model to the background pixels is then performed for each reflection independently. The algorithm uses a static background model that does not vary over the course of the scan. The greatest improvement can be expected for data where ice rings are present throughout the data set and the local background shape at the size of a spot on the detector does not exhibit large time-dependent variation. However, the algorithm has been applied to data sets whose background showed large pixel variations (variance/mean > 2) and has been shown to improve the results of processing for these data sets. It is shown that the use of a simple flat-background model as in traditional integration programs causes systematic bias in the background determination at ice-ring resolutions, resulting in an overestimation of reflection intensities at the peaks of the ice rings and an underestimation of reflection intensities either side of the ice ring. The new global background-model algorithm presented here corrects for this bias, resulting in a noticeable improvement inRfactors following refinement.

Determination of depth profiles from X-ray diffraction data

1993 ◽  
Vol 8 (2) ◽  
pp. 122-126 ◽  
Author(s):  
Paul Predecki
Keyword(s):  
Diffraction Data ◽  
Direct Method ◽  
Sample Surface ◽  
Data Sets ◽  
X Ray Diffraction ◽  
Data Set ◽  
X Ray ◽  
Depth Profiles ◽  
A Direct Method

A direct method is described for determining depth profiles (z-profiles) of diffraction data from experimentally determined τ-profiles, where z is the depth beneath the sample surface and τ is the 1/e penetration depth of the X-ray beam. With certain assumptions, the relation between these two profile functions can be expressed in the form of a Laplace transform. The criteria for fitting experimental τ-data to functions which can be utilized by the method are described. The method was applied to two τ-data sets taken from the literature: (1) of residual strain in an A1 thin film and (2) of residual stress in a surface ground A12O3/5vol% TiC composite. For each data set, it was found that the z-profiles obtained were of two types: oscillatory and nonoscillatory. The nonoscillatory profiles appeared to be qualitatively consistent for a given data set. The oscillatory profiles were considered to be not physically realistic. For the data sets considered, the nonoscillatory z-profiles were found to lie consistently above the corresponding τ-profiles, and to approach the τ-profiles at large z, as expected from the relation between the two.

A batch-wise non-linear fitting and analysis tool for treating large X-ray diffraction data sets

2006 ◽  
Vol 39 (2) ◽  
pp. 262-266 ◽  
Author(s):  
R. J. Davies
Keyword(s):  
Diffraction Data ◽  
Operation Mode ◽  
Large Data ◽  
Scattering Data ◽  
Data Sets ◽  
Analysis Tool ◽  
Data Set ◽  
X Ray ◽  
Linear Fitting ◽  
Non Linear

Synchrotron sources offer high-brilliance X-ray beams which are ideal for spatially and time-resolved studies. Large amounts of wide- and small-angle X-ray scattering data can now be generated rapidly, for example, during routine scanning experiments. Consequently, the analysis of the large data sets produced has become a complex and pressing issue. Even relatively simple analyses become difficult when a single data set can contain many thousands of individual diffraction patterns. This article reports on a new software application for the automated analysis of scattering intensity profiles. It is capable of batch-processing thousands of individual data files without user intervention. Diffraction data can be fitted using a combination of background functions and non-linear peak functions. To compliment the batch-wise operation mode, the software includes several specialist algorithms to ensure that the results obtained are reliable. These include peak-tracking, artefact removal, function elimination and spread-estimate fitting. Furthermore, as well as non-linear fitting, the software can calculate integrated intensities and selected orientation parameters.

scholarly journals AUSPEX: a graphical tool for X-ray diffraction data analysis

2017 ◽  
Vol 73 (9) ◽  
pp. 729-737 ◽  
Author(s):  
Andrea Thorn ◽  
James Parkhurst ◽  
Paul Emsley ◽  
Robert A. Nicholls ◽  
Melanie Vollmar ◽  
...  
Keyword(s):  
Data Analysis ◽  
Diffraction Data ◽  
Software Tool ◽  
Data Conversion ◽  
Data Sets ◽  
X Ray Diffraction ◽  
X Ray ◽  
Pixel Detectors ◽  
Graphical Tool ◽  
Data Acquisition And Processing

In this paper,AUSPEX, a new software tool for experimental X-ray data analysis, is presented. Exploring the behaviour of diffraction intensities and the associated estimated uncertainties facilitates the discovery of underlying problems and can help users to improve their data acquisition and processing in order to obtain better structural models. The program enables users to inspect the distribution of observed intensities (or amplitudes) against resolution as well as the associated estimated uncertainties (sigmas). It is demonstrated howAUSPEXcan be used to visually and automatically detect ice-ring artefacts in integrated X-ray diffraction data. Such artefacts can hamper structure determination, but may be difficult to identify from the raw diffraction images produced by modern pixel detectors. The analysis suggests that a significant portion of the data sets deposited in the PDB contain ice-ring artefacts. Furthermore, it is demonstrated how other problems in experimental X-ray data caused, for example, by scaling and data-conversion procedures can be detected byAUSPEX.

In Situ Diffraction Studies: Thermal Decomposition of a Natural Plumbojarosite and the Development of Rietveld-Based Data Analysis Techniques

2010 ◽  
Vol 651 ◽  
pp. 37-64 ◽  
Author(s):  
Ian C. Madsen ◽  
Ian E. Grey ◽  
Stuart J. Mills
Keyword(s):  
Thermal Decomposition ◽  
Amorphous Material ◽  
Data Sets ◽  
X Ray Diffraction ◽  
Data Set ◽  
X Ray ◽  
Analysis Techniques ◽  
Path Lengths ◽  
Instrument Configuration

A study of the thermal decomposition sequence of a sample of natural arsenian plumbojarosite has been undertaken using in situ X-ray diffraction. The sample was heated to 900°C using an Anton-Paar heating stage fitted to an INEL CPS120 diffractometer. The data were analysed using a whole-pattern, Rietveld based approach for the extraction of quantitative phase abundances. The instrument configuration used required the development and application of algorithms to correct for aberrations in the (i) peak intensities due to differing path lengths of incident and diffracted beams in the sample and (ii) peak positions due to sample displacement. Details of the structural models used were refined at selected steps in the pattern and then fixed for subsequent analysis. The data sequence consists of some 110 individual data sets which were analysed sequentially with the output of each run forming the input for analysis of the next data set. The results of the analysis show a complex breakdown and recrystallisation sequence including the formation of a major amount of amorphous material after initial breakdown of the plumbojarosite.

scholarly journals Experience with exchange and archiving of raw data: comparison of data from two diffractometers and four software packages on a series of lysozyme crystals

2012 ◽  
Vol 46 (1) ◽  
pp. 108-119 ◽  
Author(s):  
Simon W. M. Tanley ◽  
Antoine M. M. Schreurs ◽  
John R. Helliwell ◽  
Loes M. J. Kroon-Batenburg
Keyword(s):  
Diffraction Data ◽  
Data Sets ◽  
X Ray Diffraction ◽  
Noticeable Effect ◽  
Raw Data ◽  
X Ray ◽  
Data Comparison ◽  
Data Processing Software ◽  
Software Packages ◽  
Lysozyme Crystals

The International Union of Crystallography has for many years been advocating archiving of raw data to accompany structural papers. Recently, it initiated the formation of the Diffraction Data Deposition Working Group with the aim of developing standards for the representation of these data. A means of studying this issue is to submit exemplar publications with associated raw data and metadata. A recent study on the effects of dimethyl sulfoxide on the binding of cisplatin and carboplatin to histidine in 11 different lysozyme crystals from two diffractometers led to an investigation of the possible effects of the equipment and X-ray diffraction data processing software on the calculated occupancies andBfactors of the bound Pt compounds. 35.3 Gb of data were transferred from Manchester to Utrecht to be processed withEVAL. A systematic comparison shows that the largest differences in the occupancies andBfactors of the bound Pt compounds are due to the software, but the equipment also has a noticeable effect. A detailed description of and discussion on the availability of metadata is given. By making these raw diffraction data sets availableviaa local depository, it is possible for the diffraction community to make their own evaluation as they may wish.

scholarly journals Neutron and high-resolution room-temperature X-ray data collection from crystallized lytic polysaccharide monooxygenase

2015 ◽  
Vol 71 (11) ◽  
pp. 1448-1452 ◽  
Author(s):  
John-Paul Bacik ◽  
Sophanit Mekasha ◽  
Zarah Forsberg ◽  
Andrey Kovalevsky ◽  
Jay C. Nix ◽  
...  
Keyword(s):  
High Resolution ◽  
Diffraction Data ◽  
Room Temperature ◽  
X Ray Diffraction ◽  
Lytic Polysaccharide Monooxygenase ◽  
Data Set ◽  
X Ray ◽  
Processing Enzymes ◽  
Bacteria And Fungi ◽  
Polysaccharide Monooxygenase

Bacteria and fungi express lytic polysaccharide monooxgyenase (LPMO) enzymes that act in conjunction with canonical hydrolytic sugar-processing enzymes to rapidly convert polysaccharides such as chitin, cellulose and starch to single monosaccharide products. In order to gain a better understanding of the structure and oxidative mechanism of these enzymes, large crystals (1–3 mm3) of a chitin-processing LPMO from the Gram-positive soil bacteriumJonesia denitrificanswere grown and screened for their ability to diffract neutrons. In addition to the collection of neutron diffraction data, which were processed to 2.1 Å resolution, a high-resolution room-temperature X-ray diffraction data set was collected and processed to 1.1 Å resolution in space groupP212121. To our knowledge, this work marks the first successful neutron crystallographic experiment on an LPMO. Joint X-ray/neutron refinement of the resulting data will reveal new details of the structure and mechanism of this recently discovered class of enzymes.

XRD Instrument Sensitivity Results from a Round Robin Study

1991 ◽  
Vol 35 (A) ◽  
pp. 333-340 ◽  
Author(s):  
W.N. Schreiner ◽  
R. Jenkins ◽  
P.F. Dismore
Keyword(s):  
Diffraction Data ◽  
Round Robin ◽  
Data Sets ◽  
X Ray Diffraction ◽  
Diffraction Intensity ◽  
Generic Type ◽  
X Ray ◽  
The Past ◽  
Instrument Sensitivity

During the course of the past ten years the International Centre for Diffraction Data has sponsored a number of “Round Robin” tests to evaluate the quality of experimental X-ray diffraction data [1-5]. The latest of this series, called the Instrument Parameter Round Robin, was designed to evaluate, among other things, relative angularly-dependent sensitivity differences between diffractometers. Previous experiments have indicated that even perfectly aligned diffractometers of the same generic type, do not necessarily give the same set of relative intensities. One objective of the round robin was to quantify the magnitude of the experimental differences between data sets, and to demonstrate a means for external calibration of diffractometers, so that digitized diffraction intensity data obtained from different instruments could be directly compared.

Preparation and Crystal Structures of the Isotypic Compounds CdXO4 · 2 HgO (X = S, Se)

2004 ◽  
Vol 59 (3) ◽  
pp. 281-285 ◽  
Author(s):  
Matthias Weil
Keyword(s):  
Single Crystals ◽  
Crystal Structures ◽  
Diffraction Data ◽  
Building Blocks ◽  
Data Sets ◽  
X Ray Diffraction ◽  
Hydrothermal Conditions ◽  
Space Group ◽  
X Ray ◽  
Structure Factors

Colourless single crystals of the compounds CdXO4 · 2 HgO (X = S, Se) were obtained under hydrothermal conditions (250 °C, 5 d), starting from stoichiometric amounts of HgO, CdSO4 ·7H2O and CdSeO4 ·2H2O, respectively. The crystal structures were determined from X-ray diffraction data sets. The CdXO4 · 2HgO compounds crystallise isotypically with two formula units in space group P1̅ (# 2) [CdSO4 · 2HgO (CdSeO4 · 2HgO): a = 6.793(2) (6.9097(5)) Å , b = 7.205(2) (7.1786(6)) Å , c=7.359(2) (7.4556(6)) Å ,α =73.224(6) (74.586(2))°, β =66.505(6) (68.229(1))°, γ =63.054(5) (63.886(1))°, 1670 (1786) structure factors, 92 parameters, R[F2 > 2σ(F2)] = 0.0379 (0.0244)] and are made up from zig-zag [O-Hg-O]∞ chains with very short bonds of d̅(Hg-O) 2.025 Å , distorted [CdO6] octahedra (d̅(Cd-O)= 2.297 Å ), and XO4 tetrahedra (d̅(S-O)= 1.458 Å , d̅(Se-O)= 1.633 Å ) as the main building blocks. The CdXO4 ·2HgO compounds reveal no structural relationship with the corresponding HgXO4 ·2HgO phases

scholarly journals Poisson errors and adaptive rebinning in X-ray powder diffraction data

2018 ◽  
Vol 33 (4) ◽  
pp. 266-269 ◽  
Author(s):  
Marcus H. Mendenhall
Keyword(s):  
Powder Diffraction ◽  
Diffraction Data ◽  
Data Sets ◽  
Powder Diffraction Data ◽  
Data Set ◽  
X Ray ◽  
Short Summary ◽  
Correct Assignment ◽  
Wide Range ◽  
Diffraction Patterns

This work provides a short summary of techniques for formally-correct handling of statistical uncertainties in Poisson-statistics dominated data, with emphasis on X-ray powder diffraction patterns. Correct assignment of uncertainties for low counts is documented. Further, we describe a technique for adaptively rebinning such data sets to provide more uniform statistics across a pattern with a wide range of count rates, from a few (or no) counts in a background bin to on-peak regions with many counts. This permits better plotting of data and analysis of a smaller number of points in a fitting package, without significant degradation of the information content of the data set. Examples of the effect of this on a diffraction data set are given.

On the quality of the continuous rotation electron diffraction data for accurate atomic structure determination of inorganic compounds

2018 ◽  
Vol 51 (4) ◽  
pp. 1094-1101 ◽  
Author(s):  
Yunchen Wang ◽  
Taimin Yang ◽  
Hongyi Xu ◽  
Xiaodong Zou ◽  
Wei Wan
Keyword(s):  
Electron Diffraction ◽  
Single Crystal ◽  
Diffraction Data ◽  
Structural Models ◽  
Electron Diffraction Data ◽  
Data Sets ◽  
X Ray Diffraction ◽  
X Ray ◽  
Continuous Rotation

The continuous rotation electron diffraction (cRED) method has the capability of providing fast three-dimensional electron diffraction data collection on existing and future transmission electron microscopes; unknown structures could be potentially solved and refined using cRED data collected from nano- and submicrometre-sized crystals. However, structure refinements of cRED data using SHELXL often lead to relatively high R1 values when compared with those refined against single-crystal X-ray diffraction data. It is therefore necessary to analyse the quality of the structural models refined against cRED data. In this work, multiple cRED data sets collected from different crystals of an oxofluoride (FeSeO3F) and a zeolite (ZSM-5) with known structures are used to assess the data consistency and quality and, more importantly, the accuracy of the structural models refined against these data sets. An evaluation of the precision and consistency of the cRED data by examination of the statistics obtained from the data processing software DIALS is presented. It is shown that, despite the high R1 values caused by dynamical scattering and other factors, the refined atomic positions obtained from the cRED data collected for different crystals are consistent with those of the reference models refined against single-crystal X-ray diffraction data. The results serve as a reference for the quality of the cRED data and the achievable accuracy of the structural parameters.

Sign in / Sign up

Export Citation Format

Share Document