A study of the increased effects of hot-carrier stress on NMOSFETs at low temperature
1989 ◽
Vol 36
(11)
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pp. 2603
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Keyword(s):
2020 ◽
Vol 41
(1)
◽
pp. 54-57
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Keyword(s):
1988 ◽
Vol 49
(C4)
◽
pp. C4-779-C4-782
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Keyword(s):
2017 ◽
Vol 74
◽
pp. 74-80
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2002 ◽
Vol 17
(5)
◽
pp. 487-492
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1992 ◽
Vol 39
(7)
◽
pp. 1774-1776
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Keyword(s):