Effects of localized interface defects caused by hot-carrier stress in n-channel MOSFETs at low temperature

1988 ◽  
Vol 9 (9) ◽  
pp. 479-481 ◽  
Author(s):  
C. Nguyen-Duc ◽  
S. Cristoloveanu ◽  
G. Reimbold
Keyword(s):  
Low Temperature ◽  
Hot Carrier ◽  
Interface Defects ◽  
Hot Carrier Stress

Inhibiting the Kink Effect and Hot-Carrier Stress Degradation Using Dual-Gate Low-Temperature Poly-Si TFTs

2020 ◽  
Vol 41 (1) ◽  
pp. 54-57 ◽  
Author(s):  
Hong-Chih Chen ◽  
Hong-Yi Tu ◽  
Hui-Chun Huang ◽  
Wei-Chih Lai ◽  
Ting-Chang Chang ◽  
...  
Keyword(s):  
Low Temperature ◽  
Hot Carrier ◽  
Kink Effect ◽  
Hot Carrier Stress ◽  
Stress Degradation ◽  
Dual Gate

P-6: A Design Robust Against Hot-carrier Stress for Low-temperature Poly-Si TFT LCDs Fabricated using a 450°C Process

2002 ◽  
Vol 33 (1) ◽  
pp. 220 ◽  
Author(s):  
Takeo Shiba ◽  
Toshihiko Itoga ◽  
Yoshiaki Toyota ◽  
Makoto Ohkura ◽  
Toshio Miyazawa ◽  
...  
Keyword(s):  
Low Temperature ◽  
Hot Carrier ◽  
Hot Carrier Stress

HOT CARRIER STRESS INDUCED CHANGES IN MOST TRANSCONDUCTANCE STRUCTURE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-779-C4-782 ◽  
Author(s):  
C. BERGONZONI ◽  
R. BENECCHI ◽  
P. CAPRARA
Keyword(s):  
Hot Carrier ◽  
Hot Carrier Stress ◽  
Induced Changes

Degradation induced by TID radiation and hot-carrier stress in 130-nm short channel PDSOI NMOSFETs

2017 ◽  
Vol 74 ◽  
pp. 74-80 ◽  
Author(s):  
Lihua Dai ◽  
Xiaonian Liu ◽  
Mengying Zhang ◽  
Leqing Zhang ◽  
Zhiyuan Hu ◽  
...  
Keyword(s):  
Short Channel ◽  
Hot Carrier ◽  
Hot Carrier Stress
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