Active electro-optical system with dynamic spectral processing of optical radiation

2019 ◽  
Author(s):  
L. F. Kupchenko ◽  
O. A. Goorin ◽  
V. D. Karlov ◽  
A. V. Ponomar ◽  
A. S. Rybiak ◽  
...  
Keyword(s):  
Optical System ◽  
Optical Radiation ◽  
Spectral Processing

scholarly journals Aсtive electro-optical system of targets detection with dynamic spectral processing of optical radiation

2021 ◽  
Vol 24 (02) ◽  
pp. 218-226
Author(s):  
L.F. Kupchenko ◽  
◽  
V.D. Karlov ◽  
A.S. Rybiak ◽  
О.А. Goorin ◽  
...  
Keyword(s):  
Optical System ◽  
Optical Radiation ◽  
Block Diagram ◽  
Imaging Spectroscopy ◽  
Optical Signal ◽  
Optical Systems ◽  
Spectral Processing ◽  
Mathematical Operation ◽  
Radiation Fields ◽  
Laser Vision

The issues discussed in this paper provide for further development of studies in the sphere of imaging spectroscopy and laser vision. In terms of forming the information fields (radiation fields), the electro-optical systems are subdivided into the passive and active ones. Passive electro-optical systems use the information fields formed by natural radiation sources, whereas the active ones suggest using artificial sources. Comparative analysis of mathematical and physical issues of designing the electro-optical systems with dynamic spectral processing of optical radiation of the passive and active types has been performed. It has been shown that the controlled dynamic spectral processing of optical radiation can be implemented within the passive and active electro-optical systems on the basis of the same algorithm that represents operation of the optical processor performing the mathematical operation of dot product. The authors have developed the block diagram of an active electro-optical system with dynamic spectral processing. The algorithm for optimal detection of optical signals has been developed using basics of the signal detection theory. Mathematical modeling of target detection against an inhomogeneous background has been performed. It has been shown that the optimal dynamic spectral processing of optical radiation in active electro-optical system enables to separate the desired optical signal by suppressing the background signal.

scholarly journals Generalized algorithm for finding the catacaustics of an optical system

2020 ◽  
pp. 40-48
Author(s):  
Evgenii Vladimirovich Lyubchinov
Keyword(s):  
Optical System ◽  
Computer Aided Design ◽  
Optical Radiation ◽  
Optical Systems ◽  
Direct Light ◽  
Geometric Objects ◽  
Design Systems ◽  
Aided Design ◽  
Applied Fields ◽  
Scattered Beam

The author of the work has proposed an algorithm for determining catacaustics in a “source-reflector” optical system on a plane. Katakaustika is called the envelope of reflected rays from a given curve and the study of catacaustics in the design of optical systems is one of the main tasks. The paper gives examples of solving this problem and presents the corresponding visualization. Particular attention is paid to problems where the source and reflector are curved, because these tasks in the scientific literature have not been previously considered. The presented algorithm is based on the cyclographic projection of the spatial curve of the line and its optical property. It is versatile and suitable for all tasks where the source of optical radiation is given in the form of a central (point), parallel or scattered beam of direct (light rays). The main advantage of the algorithm is that in the end it turns out analytical, i.e. exact solution to the problem of determining catacaustics. The results of the study can be used in applied fields of geometric optics, as well as in various computer-aided design systems specializing in modeling lighting of geometric objects.

scholarly journals Features of modulation of high-power laser radiation for optical space control systems

2021 ◽  
Vol 2086 (1) ◽  
pp. 012050
Author(s):  
S A Rodin ◽  
B K Reznikov ◽  
V V Davydov ◽  
V Yu Rud
Keyword(s):  
Laser Radiation ◽  
Control Systems ◽  
Optical System ◽  
Optical Radiation ◽  
Fiber Optic ◽  
Communication Channels ◽  
High Power Laser ◽  
Power Laser ◽  
Fundamental Limitations ◽  
High Power Laser Radiation

Abstract In this work we justify the necessity of using shutter-type modulators to create laser radiation with the required parameters in fiber-optic systems.This is necessary to detect the fact of making changes in the optical system (unauthorized connection with the restoration of the function of communication channels). We have developed a shutter-type optical radiation modulator design. This modulator design has no fundamental limitations on the power of laser radiation, which is used to solve various problems. The investigation results of different work regime to the modulator are presented.

scholarly journals OPTOELECTRONIC DEVICE FOR MEASURING THE POWER OF LASER RADIATION

2021 ◽  
Vol 3 ◽  
pp. 286-290
Author(s):  
Dimcho Pulov ◽  
Tsanko Karadzhov
Keyword(s):  
Signal Processing ◽  
Laser Radiation ◽  
Optical System ◽  
Radiation Source ◽  
Optical Radiation ◽  
Optoelectronic Device ◽  
Processing Unit ◽  
Electronic Signal Processing ◽  
Electronic Signal ◽  
Signal Processing Unit

A device for measuring the power of the laser radiation.has been designed. The device consists of transmitter and receiving part. The transmitter includes optical radiation source and optical system for collimation of radiation. The receiver part consists of silicon photodiodes, electronic signal processing unit   and  unit for measurements. 

A Field Emission System For Transmission Electron Microscopy

1973 ◽  
Vol 31 ◽  
pp. 298-299
Author(s):  
Michel Troyonal ◽  
Huei Pei Kuoal ◽  
Benjamin M. Siegelal
Keyword(s):  
Electron Microscope ◽  
Field Emission ◽  
Optical System ◽  
High Vacuum ◽  
Ultra High Vacuum ◽  
Objective Lens ◽  
Electron Optical System ◽  
Cross Sectional ◽  
Transmission Electron ◽  
Emission System

A field emission system for our experimental ultra high vacuum electron microscope has been designed, constructed and tested. The electron optical system is based on the prototype whose performance has already been reported. A cross-sectional schematic illustrating the field emission source, preaccelerator lens and accelerator is given in Fig. 1. This field emission system is designed to be used with an electron microscope operated at 100-150kV in the conventional transmission mode. The electron optical system used to control the imaging of the field emission beam on the specimen consists of a weak condenser lens and the pre-field of a strong objective lens. The pre-accelerator lens is an einzel lens and is operated together with the accelerator in the constant angular magnification mode (CAM).

Information and estimation in image processing

1987 ◽  
Vol 45 ◽  
pp. 14-17
Author(s):  
B. Roy Frieden
Keyword(s):  
Image Processing ◽  
Optical System ◽  
Large Amplitude ◽  
Communication Theory ◽  
Image Data ◽  
Direct Approach ◽  
Ill Posed

Despite the skill and determination of electro-optical system designers, the images acquired using their best designs often suffer from blur and noise. The aim of an “image enhancer” such as myself is to improve these poor images, usually by digital means, such that they better resemble the true, “optical object,” input to the system. This problem is notoriously “ill-posed,” i.e. any direct approach at inversion of the image data suffers strongly from the presence of even a small amount of noise in the data. In fact, the fluctuations engendered in neighboring output values tend to be strongly negative-correlated, so that the output spatially oscillates up and down, with large amplitude, about the true object. What can be done about this situation? As we shall see, various concepts taken from statistical communication theory have proven to be of real use in attacking this problem. We offer below a brief summary of these concepts.

Atomic Resolution in Crystal Aperture Stem

1990 ◽  
Vol 48 (1) ◽  
pp. 236-237
Author(s):  
J T Fourie
Keyword(s):  
Optical System ◽  
Spherical Aberration ◽  
Three Dimensional ◽  
Transmission Function ◽  
Optical Systems ◽  
Bragg Angle ◽  
Electron Optical System ◽  
Intimate Contact ◽  
Diffraction Effects ◽  
Design Aspect

The attempts at improvement of electron optical systems to date, have largely been directed towards the design aspect of magnetic lenses and towards the establishment of ideal lens combinations. In the present work the emphasis has been placed on the utilization of a unique three-dimensional crystal objective aperture within a standard electron optical system with the aim to reduce the spherical aberration without introducing diffraction effects. A brief summary of this work together with a description of results obtained recently, will be given.The concept of utilizing a crystal as aperture in an electron optical system was introduced by Fourie who employed a {111} crystal foil as a collector aperture, by mounting the sample directly on top of the foil and in intimate contact with the foil. In the present work the sample was mounted on the bottom of the foil so that the crystal would function as an objective or probe forming aperture. The transmission function of such a crystal aperture depends on the thickness, t, and the orientation of the foil. The expression for calculating the transmission function was derived by Hashimoto, Howie and Whelan on the basis of the electron equivalent of the Borrmann anomalous absorption effect in crystals. In Fig. 1 the functions for a g220 diffraction vector and t = 0.53 and 1.0 μm are shown. Here n= Θ‒ΘB, where Θ is the angle between the incident ray and the (hkl) planes, and ΘB is the Bragg angle.

STEM and ELS Observation of Early Oxide Formation on the Surface of Cr Thin Films

1980 ◽  
Vol 38 ◽  
pp. 412-413
Author(s):  
Fumio Watari ◽  
J. M. Cowley
Keyword(s):  
Thin Films ◽  
Optical System ◽  
Room Temperature ◽  
Oxide Formation ◽  
Initial Nucleation ◽  
Diffraction Patterns ◽  
Relationship Of ◽  
Multiple Twinning ◽  
Moderately High Temperature

STEM coupled with the optical system was used for the investigation of the early oxidation on the surface of Cr. Cr thin films (30 – 1000Å) were prepared by evaporation onto the polished or air-cleaved NaCl substrates at room temperature and 45°C in a vacuum of 10−6 Torr with an evaporation speed 0.3Å/sec. Rather thick specimens (200 – 1000Å) with various preferred orientations were used for the investigation of the oxidation at moderately high temperature (600 − 1100°C). Selected area diffraction patterns in these specimens are usually very much complicated by the existence of the different kinds of oxides and their multiple twinning. The determination of the epitaxial orientation relationship of the oxides formed on the Cr surface was made possible by intensive use of the optical system and microdiffraction techniques. Prior to the formation of the known rhombohedral Cr2O3, a thin spinel oxide, probably analogous to γ -Al203 or γ -Fe203, was formed. Fig. 1a shows the distinct epitaxial growth of the spinel (001) as well as the rhombohedral (125) on the well-oriented Cr(001) surface. In the case of the Cr specimen with the (001) preferred orientation (Fig. 1b), the rings explainable by spinel structure appeared as well as the well defined epitaxial spots of the spinel (001). The microdif fraction from 20A areas (Fig. 2a) clearly shows the same pattern as Fig. Ia with the weaker oxide spots among the more intense Cr spots, indicating that the thickness of the oxide is much less than that of Cr. The rhombohedral Cr2O3 was nucleated preferably at the Cr(011) sites provided by the polycrystalline nature of the present specimens with the relation Cr2O3 (001)//Cr(011), and by further oxidation it grew into full coverage of the rest of the Cr surface with the orientation determined by the initial nucleation.

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