Analytical Modeling of the Suspended-Gate FET and Design Insights for Digital Logic

2007 ◽  
Author(s):  
K. Akarvardar ◽  
C. Eggimann ◽  
D. Tsamados ◽  
Y. Chauhan ◽  
G. C. Wan ◽  
...  
Keyword(s):  
Analytical Modeling ◽  
Digital Logic

Digital Logic Design

2009 ◽  
Author(s):  
Guy Even ◽  
Moti Medina
Keyword(s):  
Digital Logic ◽  
Logic Design

Improvement of Single-Electron Digital Logic Gates by Utilizing Input Discretizers

2016 ◽  
Vol E99.C (2) ◽  
pp. 285-292 ◽  
Author(s):  
Tran THI THU HUONG ◽  
Hiroshi SHIMADA ◽  
Yoshinao MIZUGAKI
Keyword(s):  
Logic Gates ◽  
Single Electron ◽  
Digital Logic

ANALYTICAL MODELING OF NEEDLE TEMPERATURE IN AN INDUSTRIAL SEWING MACHINE

2018 ◽  
Vol 49 (5) ◽  
pp. 385-394 ◽  
Author(s):  
Najlawi Bilel ◽  
Nejlaoui Mohamed
Keyword(s):  
Analytical Modeling ◽  
Sewing Machine

DIGITALIZATION OF LABOR MIGRATION PROCESSES IN UZBEKISTAN. WORLD EXPERIENCE

2020 ◽  
Vol 4 (3) ◽  
pp. 29-39
Author(s):  
Sulkhiya Gazieva ◽  
Keyword(s):  
Labor Market ◽  
Technological Change ◽  
Labor Migration ◽  
Smart Phone ◽  
Logic Circuits ◽  
Digital Logic ◽  
The Internet ◽  
The Future

The future of labor market depends upon several factors, long-term innovation and the demographic developments. However, one of the main drivers of technological change in the future is digitalization and central to this development is the production and use of digital logic circuits and its derived technologies, including the computer,the smart phone and the Internet. Especially, smart automation will perhaps not cause e.g.regarding industries, occupations, skills, tasks and duties

Combine Micro-Probing and OBIRCH to Catch Non-Recognizable Fault in RF and Mixed-Mode Integrated Circuits

2007 ◽  
Author(s):  
Cha-Ming Shen ◽  
Yen-Long Chang ◽  
Lian-Fon Wen ◽  
Tan-Chen Chuang ◽  
Shi-Chen Lin ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Radio Frequency ◽  
Failure Analysis ◽  
Case Studies ◽  
Mixed Mode ◽  
Failure Mechanisms ◽  
Deep Submicron ◽  
Digital Logic ◽  
Successful Approach ◽  
Cmos Processes

Abstract Highly-integrated radio frequency and mixed-mode devices that are manufactured in deep-submicron or more advanced CMOS processes are becoming more complex to analyze. The increased complexity presents us with many eccentric failure mechanisms that are uniquely different from traditional failure mechanisms found during failure analysis on digital logic applications. This paper presents a novel methodology to overcome the difficulties and discusses two case studies which demonstrate the application of the methodology. Through the case studies, the methodology was proven to be a successful approach. It is also proved how this methodology would work for such non-recognizable failures.

Transonic Cascade Measurements to Support Analytical Modeling

2005 ◽  
Author(s):  
Paul A. Durbin ◽  
John K. Eaton ◽  
Greg Laskowski ◽  
Amanda Vicharelli
Keyword(s):  
Analytical Modeling ◽  
Transonic Cascade

Analytical Modeling & Simulation of OFF-State Leakage Current for Lightly Doped MOSFETs

2017 ◽  
Vol 9 (6) ◽  
pp. 06009-1-06009-4 ◽  
Author(s):  
Nitin Sachdeva ◽  
◽  
Munish Vashishath ◽  
P. K. Bansal ◽  
◽  
...  
Keyword(s):  
Leakage Current ◽  
Analytical Modeling ◽  
Modeling Simulation
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