Unified STIL Flow: A Test Pattern Validation Approach for Compressed Scan Designs
1991 ◽
Vol 138
(2)
◽
pp. 179
◽
2015 ◽
Vol 42
(4)
◽
pp. 30-32
Keyword(s):
International Journal of Advanced Research in Electrical Electronics and Instrumentation Engineering
◽
2014 ◽
Vol 03
(08)
◽
pp. 11487-11495
Keyword(s):
2016 ◽
Vol E99.A
(12)
◽
pp. 2320-2327
2021 ◽
Vol 29
(3)
◽
pp. 544-557
Keyword(s):