Comparison of transients and FFT Memory Sense Amplifiers for semiconductor memories using 0.3μm CMOS technology

Author(s):  
Rahul Sharma ◽  
Ankita Mowar ◽  
Ayoush Johari
Author(s):  
Alok Kumar Mishra ◽  
◽  
Urvashi Chopra ◽  
Vaithiyanathan Dhandapani ◽  
◽  
...  

To read the data from the memory in each of the devices is crucial. In the modern-day VLSI, world need high-speed devices to satisfy the demand for application such as the Internet of Things (IoT) and System on Chip (Soc). We have implemented the different types of existing sense amplifiers to investigate the working and application point of view. Every sense amplifier has its own advantage. Each of the sense amplifiers is focusing basically on the charging and discharging of Bit Line (BL), Bit Line Bar (BLB) in case of Voltage sense and Data Line (DL), Data Line Bar (DLB) in case of current sense. The waveform of the Voltage sense and current sense clearly shown. Performance comparison based on Sensing Delay, Power, and Supply variation at UMC 65nm CMOS technology node using CADENCE Virtuoso tool.


2013 ◽  
Vol 7 (3) ◽  
pp. 615-619
Author(s):  
Sunil Kumar ◽  
Arun Kr. Chatterjee

A comparative study of different types of sense amplifiers [1] using 0.18um technology is presented. The sense amplifiers under considerations are used in SRAM and DRAM cells.The sensing delay of different types of sense amplifiers  are evaluated with respect to variation of bitline capacitance. Comparative results are also provided for the variation in delay with respect to power supply. Extensive results based on 0.18um CMOS technology using CADENCE Spectre simulation tools are presented for different architectures of sense amplifiers. From these results it has been proven that if the output of sense amplifier is isolated from the bitline parasitic capacitance then the sensing delay of sense amplifier reduces.


Author(s):  
F. Lalchhandama ◽  
Mukesh Sahani ◽  
Vompolu Mohan Srinivas ◽  
Indranil Sengupta ◽  
Kamalika Datta

Memristors can be used to build nonvolatile memory systems with in-memory computing (IMC) capabilities. A number of prior works demonstrate the design of an IMC-capable memory macro using a memristor crossbar. However, read disturbance limits the use of such memory systems built using a 0-transistor, 1-RRAM (0T1R) structure that suffers from the sneak path problem. In this paper, we introduce a scheme for both memory and logic operations using the 1-transistor, 1-RRAM (1T1R) memristor crossbar, which effectively mitigates the read disturbance problem. The memory array is designed using nMOS transistors and the VTEAM memristor model. The peripheral circuitry like decoders, voltage multiplexers, and sense amplifiers is designed using a 45[Formula: see text]nm CMOS technology node. We introduce a mapping technique to realize arbitrary logic functions using Majority (MAJ) gate operations in the 1T1R crossbar. Through extensive experimentation on benchmark functions, it has been found that the proposed mapping method gives an improvement of 65% or more in terms of the number of time steps required, and 59% or more in terms of energy consumption as compared to some of the recent methods.


2002 ◽  
Vol 149 (3) ◽  
pp. 154-158 ◽  
Author(s):  
A. Chrisanthopoulos ◽  
Y. Tsiatouhas ◽  
Y. Moisiadis ◽  
A. Arapoyanni

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-41-C4-44
Author(s):  
G. J.T. DAVIDS ◽  
P. B. HARTOG ◽  
J. W. SLOTBOOM ◽  
G. STREUTKER ◽  
A. G. van der SIJDE ◽  
...  
Keyword(s):  

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-13-C4-22
Author(s):  
F. NEPPL ◽  
H.-J. PFLEIDERER
Keyword(s):  

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-421-C4-424 ◽  
Author(s):  
A. STRABONI ◽  
M. BERENGUER ◽  
B. VUILLERMOZ ◽  
P. DEBENEST ◽  
A. VERNA ◽  
...  

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