Global rigidity constraints in image displacement fields

2002 ◽  
Author(s):  
C. Fermuller ◽  
Y. Aloimonos
Keyword(s):  
Displacement Fields ◽  
Global Rigidity ◽  
Image Displacement

Simulation and Contrast Analysis of tem Images of Cracks

1990 ◽  
Vol 48 (1) ◽  
pp. 578-579
Author(s):  
D. Goyal ◽  
A. H. King
Keyword(s):  
Displacement Vector ◽  
Crack Tip ◽  
Perfect Crystal ◽  
Operating Conditions ◽  
Displacement Fields ◽  
Fringe Contrast ◽  
Orthogonal Geometry ◽  
Moire Fringe ◽  
Moiré Fringe

TEM images of cracks have been found to give rise to a moiré fringe type of contrast. It is apparent that the moire fringe contrast is observed because of the presence of a fault in a perfect crystal, and is characteristic of the fault geometry and the diffracting conditions in the TEM. Various studies have reported that the moire fringe contrast observed due to the presence of a crack in an otherwise perfect crystal is distinctive of the mode of crack. This paper describes a technique to study the geometry and mode of the cracks by comparing the images they produce in the TEM because of the effect that their displacement fields have on the diffraction of electrons by the crystal (containing a crack) with the corresponding theoretical images. In order to formulate a means of matching experimental images with theoretical ones, displacement fields of dislocations present (if any) in the vicinity of the crack are not considered, only the effect of the displacement field of the crack is considered.The theoretical images are obtained using a computer program based on the two beam approximation of the dynamical theory of diffraction contrast for an imperfect crystal. The procedures for the determination of the various parameters involved in these computations have been well documented. There are three basic modes of crack. Preliminary studies were carried out considering the simplest form of crack geometries, i. e., mode I, II, III and the mixed modes, with orthogonal crack geometries. It was found that the contrast obtained from each mode is very distinct. The effect of variation of operating conditions such as diffracting vector (), the deviation parameter (ω), the electron beam direction () and the displacement vector were studied. It has been found that any small change in the above parameters can result in a drastic change in the contrast. The most important parameter for the matching of the theoretical and the experimental images was found to be the determination of the geometry of the crack under consideration. In order to be able to simulate the crack image shown in Figure 1, the crack geometry was modified from a orthogonal geometry to one with a crack tip inclined to the original crack front. The variation in the crack tip direction resulted in the variation of the displacement vector also. Figure 1 is a cross-sectional micrograph of a silicon wafer with a chromium film on top, showing a crack in the silicon.

Recent Progress and Plans in Computer-Controlled High Resolution Electron Microscopy

1990 ◽  
Vol 48 (1) ◽  
pp. 154-155
Author(s):  
W.J. de Ruijter ◽  
Peter Rez ◽  
David J. Smith
Keyword(s):  
Electron Microscopy ◽  
Digital Processing ◽  
High Resolution Electron Microscopy ◽  
Objective Lens ◽  
Linear Filter ◽  
Contrast Transfer Function ◽  
Image Displacement ◽  
Spatially Resolved ◽  
Wide Range ◽  
On Line

Digital computers are becoming widely recognized as standard accessories for electron microscopy. Due to instrumental innovations the emphasis in digital processing is shifting from off-line manipulation of electron micrographs to on-line image acquisition, analysis and microscope control. An on-line computer leads to better utilization of the instrument and, moreover, the flexibility of software control creates the possibility of a wide range of novel experiments, for example, based on temporal and spatially resolved acquisition of images or microdiffraction patterns. The instrumental resolution in electron microscopy is often restricted by a combination of specimen movement, radiation damage and improper microscope adjustment (where the settings of focus, objective lens stigmatism and especially beam alignment are most critical). We are investigating the possibility of proper microscope alignment based on computer induced tilt of the electron beam. Image details corresponding to specimen spacings larger than ∼20Å are produced mainly through amplitude contrast; an analysis based on geometric optics indicates that beam tilt causes a simple image displacement. Higher resolution detail is characterized by wave propagation through the optical system of the microscope and we find that beam tilt results in a dispersive image displacement, i.e. the displacement varies with spacing. This approach is valid for weak phase objects (such as amorphous thin films), where transfer is simply described by a linear filter (phase contrast transfer function) and for crystalline materials, where imaging is described in terms of dynamical scattering and non-linear imaging theory. In both cases beam tilt introduces image artefacts.

scholarly journals Surface contact behavior of functionally graded thermoelectric materials indented by a conducting punch

2021 ◽  
Author(s):  
Xiaojuan Tian ◽  
Yueting Zhou ◽  
Lihua Wang ◽  
Shenghu Ding
Keyword(s):  
Thermoelectric Materials ◽  
Singular Integral Equations ◽  
Damage Mechanism ◽  
Functionally Graded ◽  
Deep Insight ◽  
Displacement Fields ◽  
Thermoelectric Effects ◽  
Homogeneous Solutions ◽  
The Fourier Transform ◽  
Insight Into

AbstractThe contact problem for thermoelectric materials with functionally graded properties is considered. The material properties, such as the electric conductivity, the thermal conductivity, the shear modulus, and the thermal expansion coefficient, vary in an exponential function. Using the Fourier transform technique, the electro-thermo-elastic problems are transformed into three sets of singular integral equations which are solved numerically in terms of the unknown normal electric current density, the normal energy flux, and the contact pressure. Meanwhile, the complex homogeneous solutions of the displacement fields caused by the gradient parameters are simplified with the help of Euler’s formula. After addressing the non-linearity excited by thermoelectric effects, the particular solutions of the displacement fields can be assessed. The effects of various combinations of material gradient parameters and thermoelectric loads on the contact behaviors of thermoelectric materials are presented. The results give a deep insight into the contact damage mechanism of functionally graded thermoelectric materials (FGTEMs).

scholarly journals Photogrammetric Process to Monitor Stress Fields Inside Structural Systems

Sensors ◽  
2021 ◽  
Vol 21 (12) ◽  
pp. 4023
Author(s):  
Leonardo M. Honório ◽  
Milena F. Pinto ◽  
Maicon J. Hillesheim ◽  
Francisco C. de Araújo ◽  
Alexandre B. Santos ◽  
...  
Keyword(s):  
Boundary Element ◽  
Real Time ◽  
Stress Fields ◽  
Structural Systems ◽  
Unknown Boundary ◽  
Stress Distributions ◽  
Displacement Fields ◽  
Time Stress ◽  
Beam Surface ◽  
Measured Displacement

This research employs displacement fields photogrammetrically captured on the surface of a solid or structure to estimate real-time stress distributions it undergoes during a given loading period. The displacement fields are determined based on a series of images taken from the solid surface while it experiences deformation. Image displacements are used to estimate the deformations in the plane of the beam surface, and Poisson’s Method is subsequently applied to reconstruct these surfaces, at a given time, by extracting triangular meshes from the corresponding points clouds. With the aid of the measured displacement fields, the Boundary Element Method (BEM) is considered to evaluate stress values throughout the solid. Herein, the unknown boundary forces must be additionally calculated. As the photogrammetrically reconstructed deformed surfaces may be defined by several million points, the boundary displacement values of boundary-element models having a convenient number of nodes are determined based on an optimized displacement surface that best fits the real measured data. The results showed the effectiveness and potential application of the proposed methodology in several tasks to determine real-time stress distributions in structures.

scholarly journals A higher-order parametric nonlinear reduced-order model for imperfect structures using Neumann expansion

2021 ◽  
Author(s):  
J. Marconi ◽  
P. Tiso ◽  
D. E. Quadrelli ◽  
F. Braghin
Keyword(s):  
Reduced Order Model ◽  
Galerkin Projection ◽  
Order Model ◽  
Displacement Fields ◽  
Reduced Order ◽  
Total Displacement ◽  
Elastic Forces ◽  
Strain Formulation ◽  
The One ◽  
Definition Of

AbstractWe present an enhanced version of the parametric nonlinear reduced-order model for shape imperfections in structural dynamics we studied in a previous work. In this model, the total displacement is split between the one due to the presence of a shape defect and the one due to the motion of the structure. This allows to expand the two fields independently using different bases. The defected geometry is described by some user-defined displacement fields which can be embedded in the strain formulation. This way, a polynomial function of both the defect field and actual displacement field provides the nonlinear internal elastic forces. The latter can be thus expressed using tensors, and owning the reduction in size of the model given by a Galerkin projection, high simulation speedups can be achieved. We show that the adopted deformation framework, exploiting Neumann expansion in the definition of the strains, leads to better accuracy as compared to the previous work. Two numerical examples of a clamped beam and a MEMS gyroscope finally demonstrate the benefits of the method in terms of speed and increased accuracy.

scholarly journals New insights on homogenization for hexagonal-shaped composites as Cosserat continua

Meccanica ◽  
2021 ◽  
Author(s):  
Marco Colatosti ◽  
Nicholas Fantuzzi ◽  
Patrizia Trovalusci ◽  
Renato Masiani
Keyword(s):  
Continuum Theory ◽  
Representative Elementary Volume ◽  
Elementary Volume ◽  
Displacement Fields ◽  
Micropolar Continuum ◽  
Rigid Particles ◽  
Hexagonal Shape ◽  
Classical Models ◽  
Elastic Interfaces ◽  
Cosserat Continua

AbstractIn this work, particle composite materials with different kind of microstructures are analyzed. Such materials are described as made of rigid particles and elastic interfaces. Rigid particles of arbitrary hexagonal shape are considered and their geometry is described by a limited set of parameters. Three different textures are analyzed and static analyses are performed for a comparison among the solutions of discrete, micropolar (Cosserat) and classical models. In particular, the displacements of the discrete model are compared to the displacement fields of equivalent micropolar and classical continua realized through a homogenization technique, starting from the representative elementary volume detected with a numeric approach. The performed analyses show the effectiveness of adopting the micropolar continuum theory for describing such materials.

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