scholarly journals Sleep Transistors to Improve the Process Variability and Soft Error Susceptibility

Author(s):  
Alexandra L. Zimpeck ◽  
Cristina Meinhardt ◽  
Laurent Artola ◽  
Guillaume Hubert ◽  
Fernanda L. Kastensmidt ◽  
...  
2012 ◽  
Vol 59 (6) ◽  
pp. 2914-2919 ◽  
Author(s):  
G. Gasiot ◽  
A. Castelnovo ◽  
M. Glorieux ◽  
F. Abouzeid ◽  
S. Clerc ◽  
...  

TAPPI Journal ◽  
2018 ◽  
Vol 17 (05) ◽  
pp. 295-305
Author(s):  
Wesley Gilbert ◽  
Ivan Trush ◽  
Bruce Allison ◽  
Randy Reimer ◽  
Howard Mason

Normal practice in continuous digester operation is to set the production rate through the chip meter speed. This speed is seldom, if ever, adjusted except to change production, and most of the other digester inputs are ratioed to it. The inherent assumption is that constant chip meter speed equates to constant dry mass flow of chips. This is seldom, if ever, true. As a result, the actual production rate, effective alkali (EA)-to-wood and liquor-to-wood ratios may vary substantially from assumed values. This increases process variability and decreases profits. In this report, a new continuous digester production rate control strategy is developed that addresses this shortcoming. A new noncontacting near infrared–based chip moisture sensor is combined with the existing weightometer signal to estimate the actual dry chip mass feedrate entering the digester. The estimated feedrate is then used to implement a novel feedback control strategy that adjusts the chip meter speed to maintain the dry chip feedrate at the target value. The report details the results of applying the new measurements and control strategy to a dual vessel continuous digester.


2021 ◽  
Author(s):  
Alexandra Zimpeck ◽  
Cristina Meinhardt ◽  
Laurent Artola ◽  
Ricardo Reis

2020 ◽  
Vol 114 ◽  
pp. 113856
Author(s):  
Germán León ◽  
José M. Badía ◽  
Jose A. Belloch ◽  
Almudena Lindoso ◽  
Luis Entrena

Electronics ◽  
2021 ◽  
Vol 10 (13) ◽  
pp. 1572
Author(s):  
Ehab A. Hamed ◽  
Inhee Lee

In the previous three decades, many Radiation-Hardened-by-Design (RHBD) Flip-Flops (FFs) have been designed and improved to be immune to Single Event Upsets (SEUs). Their specifications are enhanced regarding soft error tolerance, area overhead, power consumption, and delay. In this review, previously presented RHBD FFs are classified into three categories with an overview of each category. Six well-known RHBD FFs architectures are simulated using a 180 nm CMOS process to show a fair comparison between them while the conventional Transmission Gate Flip-Flop (TGFF) is used as a reference design for this comparison. The results of the comparison are analyzed to give some important highlights about each design.


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