Tailored focal length of the sub-wavelength slit-groove-based metamaterials in THz regime

2008 ◽  
Author(s):  
Kwangchil Lee ◽  
Kyoungsik Kim
Keyword(s):  
Focal Length ◽  
Sub Wavelength

scholarly journals Acoustic Focusing with Intensity Modulation Based on Sub-Wavelength Waveguide Array

Crystals ◽  
2021 ◽  
Vol 11 (12) ◽  
pp. 1461
Author(s):  
Mingran Zhang ◽  
Guangrui Gu
Keyword(s):  
Focal Length ◽  
Intensity Modulation ◽  
Waveguide Array ◽  
Refractive Index Modulation ◽  
Destructive Testing ◽  
Equivalent Impedance ◽  
Coding Method ◽  
Acoustic Focusing ◽  
Arbitrary Amplitude ◽  
Sub Wavelength

Acoustic focusing with intensity modulation plays an important role in biomedical and life sciences. In this work, we propose a new approach for simultaneous phase and amplitude manipulation in sub-wavelength coupled resonant units, which has not been reported so far. Based on the equivalent impedance and refractive index modulation induced by the change of geometry, arbitrary amplitude response from 0 to 1 and phase shift from 0 to 2π is realized. Thus, the acoustic focusing with intensity modulation can be achieved via waveguide array. Herein, the focal length can be adjusted by alternating the length of supercell, and the whole system can work in a broadband of 0.872f0–1.075f0. By introducing the coding method, the thermal viscosity loss is reduced, and the wavefront modulation can be more accurate. Compared with previous works, our approach has the advantages of simple design and broadband response, which may have promising applications in acoustic communication, non-destructive testing, and acoustic holography.

scholarly journals A Microlens Super-Surface Film with Regular Graded Circular Hole-Like Subwavelength Structures for Highly Focusing Strength

Coatings ◽  
2019 ◽  
Vol 9 (12) ◽  
pp. 776
Author(s):  
Jinshuang Wu ◽  
Leimengting Zhang ◽  
Yahong Li ◽  
Yixin Zhang ◽  
Bowei Yang ◽  
...  
Keyword(s):  
Circular Hole ◽  
Focal Length ◽  
Surface Film ◽  
Subwavelength Structures ◽  
Lens Array ◽  
Direct Laser ◽  
Short Focal Length ◽  
Micro Lens Array ◽  
Micro Lens ◽  
Sub Wavelength

Using the fact that a sub-wavelength structure exhibits the same thermal expansion coefficient as a micro-lens array, we design a micro-lens super-surface film with regular circular hole-like subwavelength structures to realize the high performances of central highly focusing strength and short focal length. In addition, based on the Fresnel—Kirchhoff diffraction theory, the influences of subwavelength structural period and height on the focusing performance of a micro-lens are analyzed. Furthermore, the finite-difference time-domain method is utilized to optimize the structural parameters. Via direct laser writing and an inductively coupled plasma process, we fabricated a square micro-lens array consisting of a 1000 × 1000 micro-lens unit with a sub-wavelength structure, and the optical focusing performance was measured in the visible light band. Finally, the experimental results indicate that the focal length is decreased to 15 μm, the focal spot central energy is increased by 7.3%, and the light transmission, enhanced via inserting sub-wavelength structures, corresponds to 3%. This proves that the designed micro-lens array with a regular-graded circular hole-like subwavelength structure can achieve central high focusing and a short focal length. This has applications in several fields of wavefront detection and light field imaging systems.

Design of All-Dielectric Long-wave infrared Wide-angle Metalens

2021 ◽  
Author(s):  
Ning Zhang ◽  
Qingzhi Li ◽  
Jun Chen ◽  
Feng Tang ◽  
Jingjun Wu ◽  
...  
Keyword(s):  
Focal Length ◽  
Low Cost ◽  
Numerical Aperture ◽  
Single Layer ◽  
Industrial Processing ◽  
Monochromatic Imaging ◽  
Long Wave ◽  
Wavelength Scale ◽  
Long Wave Infrared ◽  
Sub Wavelength

Abstract Optical metasurfaces are two-dimensional arrays of nano-scatterers that modify optical wavefronts at subwavelength spatial resolution. They achieve the effect of focusing through phase control under a sub-wavelength scale, named metalens. They are poised to revolutionize optics by enabling complex low-cost systems. However, there are monochromatic severe aberrations in the metasurfaces. In this paper,the long-wave infrared optical system coma is eliminated through a single-layer metasurface. By changing the phase function,this metalens have a numerical aperture of 0.89,a focal length of 150 μm,and a field of view of 120° (0.4@60lp/mm) that enables diffraction-limited monochromatic imaging along the focal plane at a wavelength of 10.6μm. And the designed metasurface maintains a favorable MTF value at different angles. This equipment can be widely used in imaging and industrial processing.

Resolution Attainable With the Present Day STEM

1973 ◽  
Vol 31 ◽  
pp. 230-231 ◽  
Author(s):  
J. S. Wall ◽  
J. P. Langmore ◽  
H. Isaacson ◽  
A. V. Crewe
Keyword(s):  
Spherical Aberration ◽  
Focal Length ◽  
Incident Beam ◽  
Scanning Transmission Electron Microscope ◽  
Aperture Size ◽  
Magnetic Lens ◽  
Peak Intensity ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Half Angle

The scanning transmission electron microscope (STEM) constructed by the authors employs a field emission gun and a 1.15 mm focal length magnetic lens to produce a probe on the specimen. The aperture size is chosen to allow one wavelength of spherical aberration at the edge of the objective aperture. Under these conditions the profile of the focused spot is expected to be similar to an Airy intensity distribution with the first zero at the same point but with a peak intensity 80 per cent of that which would be obtained If the lens had no aberration. This condition is attained when the half angle that the incident beam subtends at the specimen, 𝛂 = (4𝛌/Cs)¼

The Reduction of Chromatic Aberrations Due to Instrumental Instabilities

1971 ◽  
Vol 29 ◽  
pp. 14-15
Author(s):  
J. S. Lally ◽  
R. Evans
Keyword(s):  
Electron Microscope ◽  
High Voltage ◽  
Focal Length ◽  
Chromatic Aberration ◽  
Objective Lens ◽  
Usual Practice ◽  
Voltage Electron ◽  
Short Focal Length ◽  
Chromatic Aberrations ◽  
Electron Microscopes

One of the instrumental factors often limiting the resolution of the electron microscope is image defocussing due to changes in accelerating voltage or objective lens current. This factor is particularly important in high voltage electron microscopes both because of the higher voltages and lens currents required but also because of the inherently longer focal lengths, i.e. 6 mm in contrast to 1.5-2.2 mm for modern short focal length objectives.The usual practice in commercial electron microscopes is to design separately stabilized accelerating voltage and lens supplies. In this case chromatic aberration in the image is caused by the random and independent fluctuations of both the high voltage and objective lens current.

A Superconducting Microscope

1971 ◽  
Vol 29 ◽  
pp. 10-11 ◽  
Author(s):  
R. E. Worsham ◽  
J. E. Mann ◽  
E. G. Richardson
Keyword(s):  
Liquid Helium ◽  
Focal Length ◽  
Vacuum System ◽  
Objective Lens ◽  
Electrical Instability ◽  
Radiation Shields ◽  
And Control ◽  
Thermal Oscillations ◽  
Flux Pump

This superconducting microscope, Figure 1, was first operated in May, 1970. The column, which started life as a Siemens Elmiskop I, was modified by removing the objective and intermediate lenses, the specimen chamber, and the complete vacuum system. The large cryostat contains the objective lens and stage. They are attached to the bottom of the 7-liter helium vessel and are surrounded by two vapor-cooled radiation shields.In the initial operational period 5-mm and 2-mm focal length objective lens pole pieces were used giving magnification up to 45000X. Without a stigmator and precision ground pole pieces, a resolution of about 50-100Å was achieved. The boil-off rate of the liquid helium was reduced to 0.2-0.3ℓ/hour after elimination of thermal oscillations in the cryostat. The calculated boil-off was 0.2ℓ/hour. No effect caused by mechanical or electrical instability was found. Both 4.2°K and 1.7-1.9°K operation were routine. Flux pump excitation and control of the lens were quite smooth, simple, and, apparently highly stable. Alignment of the objective lens proved quite awkward, however, with the long-thin epoxy glass posts used for supporting the lens.

Improvements in the electron probe forming capabilities and x-ray hole counts in the Philips TEM

1983 ◽  
Vol 41 ◽  
pp. 376-377
Author(s):  
Richard L. McConville
Keyword(s):  
Field Strength ◽  
Electron Probe ◽  
Spherical Aberration ◽  
Focal Length ◽  
Objective Lens ◽  
Parallel Beam ◽  
Tilt Axis ◽  
X Ray ◽  
Small Probe ◽  
Specimen Height

A second generation twin lens has been developed. This symmetrical lens with a wider bore, yet superior values of chromatic and spherical aberration for a given focal length, retains both eucentric ± 60° tilt movement and 20°x ray detector take-off angle at 90° to the tilt axis. Adjust able tilt axis height, as well as specimen height, now ensures almost invariant objective lens strengths for both TEM (parallel beam conditions) and STEM or nano probe (focused small probe) modes.These modes are selected through use of an auxiliary lens situ ated above the objective. When this lens is on the specimen is illuminated with a parallel beam of electrons, and when it is off the specimen is illuminated with a focused probe of dimensions governed by the excitation of the condenser 1 lens. Thus TEM/STEM operation is controlled by a lens which is independent of the objective lens field strength.

Comparison of Deterministic and Linear Cosine Spatial Filtering of Transmission Electron Micrographs

1972 ◽  
Vol 30 ◽  
pp. 596-597
Author(s):  
David A. Ansley
Keyword(s):  
Spherical Aberration ◽  
Focal Length ◽  
Chromatic Aberration ◽  
Spatial Filter ◽  
Operating Conditions ◽  
Objective Lens ◽  
List Type ◽  
Spatial Filters ◽  
Transmission Electron ◽  
Wide Range

The coherence of the electron flux of a transmission electron microscope (TEM) limits the direct application of deconvolution techniques which have been used successfully on unmanned spacecraft programs. The theory assumes noncoherent illumination. Deconvolution of a TEM micrograph will, therefore, in general produce spurious detail rather than improved resolution.A primary goal of our research is to study the performance of several types of linear spatial filters as a function of specimen contrast, phase, and coherence. We have, therefore, developed a one-dimensional analysis and plotting program to simulate a wide 'range of operating conditions of the TEM, including adjustment of the:(1) Specimen amplitude, phase, and separation(2) Illumination wavelength, half-angle, and tilt(3) Objective lens focal length and aperture width(4) Spherical aberration, defocus, and chromatic aberration focus shift(5) Detector gamma, additive, and multiplicative noise constants(6) Type of spatial filter: linear cosine, linear sine, or deterministic

A High Resolution Scanning Microscope

1968 ◽  
Vol 26 ◽  
pp. 356-357
Author(s):  
A. V. Crewe ◽  
J. Wall ◽  
L. M. Welter
Keyword(s):  
High Resolution ◽  
Field Emission ◽  
Spherical Aberration ◽  
Focal Length ◽  
Spot Size ◽  
Emission Source ◽  
Field Of View ◽  
Scanning Microscope ◽  
Magnetic Lens ◽  
High Quality

A scanning microscope using a field emission source has been described elsewhere. This microscope has now been improved by replacing the single magnetic lens with a high quality lens of the type described by Ruska. This lens has a focal length of 1 mm and a spherical aberration coefficient of 0.5 mm. The final spot size, and therefore the microscope resolution, is limited by the aberration of this lens to about 6 Å.The lens has been constructed very carefully, maintaining a tolerance of + 1 μ on all critical surfaces. The gun is prealigned on the lens to form a compact unit. The only mechanical adjustments are those which control the specimen and the tip positions. The microscope can be used in two modes. With the lens off and the gun focused on the specimen, the resolution is 250 Å over an undistorted field of view of 2 mm. With the lens on,the resolution is 20 Å or better over a field of view of 40 microns. The magnification can be accurately varied by attenuating the raster current.

Theory and Errors in Stereo Electron Microscopy

1968 ◽  
Vol 26 ◽  
pp. 336-337
Author(s):  
J. M. Pankratz
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Plane Wave ◽  
Focal Length ◽  
Foil Thickness ◽  
Points Of Interest ◽  
Transmission Electron ◽  
Vertical Spacing ◽  
Illuminating System

It is often desirable in transmission electron microscopy to know the vertical spacing of points of interest within a specimen. However, in order to measure a stereo effect, one must have two pictures of the same area taken from different angles, and one must have also a formula for converting measured differences between corresponding points (parallax) into a height differential.Assume (a) that the impinging beam of electrons can be considered as a plane wave and (b) that the magnification is the same at the top and bottom of the specimen. The first assumption is good when the illuminating system is overfocused. The second assumption (the so-called “perspective error”) is good when the focal length is large (3 x 107Å) in relation to foil thickness (∼103 Å).

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