Emitter layer design for high-speed InP HBTs with high reliability

2007 ◽  
Author(s):  
Norihide Kashio ◽  
Kenji Kurishima ◽  
Yoshino K. Fukai ◽  
Shoji Yamahata ◽  
Yasuyuki Miyamoto
Keyword(s):  
High Speed ◽  
High Reliability ◽  
Emitter Layer

scholarly journals Research on Performance Test System of Space Harmonic Reducer in High Vacuum and Low Temperature Environment

Machines ◽  
2020 ◽  
Vol 9 (1) ◽  
pp. 1
Author(s):  
Jing Wang ◽  
Zhihua Wan ◽  
Zhurong Dong ◽  
Zhengguo Li
Keyword(s):  
Low Temperature ◽  
High Speed ◽  
Performance Test ◽  
High Reliability ◽  
High Vacuum ◽  
Test System ◽  
Low Noise ◽  
Speed Ratio ◽  
Space Harmonic ◽  
Temperature Environment

The harmonic reducer, with its advantages of high precision, low noise, light weight, and high speed ratio, has been widely used in aerospace solar wing deployment mechanisms, antenna pointing mechanisms, robot joints, and other precision transmission fields. Accurately predicting the performance of the harmonic reducer under various application conditions is of great significance to the high reliability and long life of the harmonic reducer. In this paper, a set of automatic harmonic reducer performance test systems is designed. By using the CANOpen bus interface to control the servo motor as the drive motor, through accurately controlling the motor speed and rotation angle, collecting the angle, torque, and current in real time, the life cycle test of space harmonic reducer was carried out in high vacuum and low temperature environment on the ground. Then, the collected data were automatically analyzed and calculated. The test data of the transmission accuracy, backlash, and transmission efficiency of the space harmonic reducer were obtained. It is proven by experiments that the performance data of the harmonic reducer in space work can be more accurately obtained by using the test system mentioned in this paper, which is convenient for further research on related lubricating materials.

scholarly journals Broadband Wireless Channel in Composite High-Speed Railway Scenario: Measurements, Simulation, and Analysis

2017 ◽  
Vol 2017 ◽  
pp. 1-15 ◽  
Author(s):  
Jianwen Ding ◽  
Lei Zhang ◽  
Jingya Yang ◽  
Bin Sun ◽  
Jiying Huang
Keyword(s):  
Ray Tracing ◽  
Communication Systems ◽  
High Speed ◽  
Channel Model ◽  
High Reliability ◽  
Rapid Development ◽  
Path Loss ◽  
Wireless Channel ◽  
Delay Spread ◽  
High Speed Railway

The rapid development of high-speed railway (HSR) and train-ground communications with high reliability, safety, and capacity promotes the evolution of railway dedicated mobile communication systems from Global System for Mobile Communications-Railway (GSM-R) to Long Term Evolution-Railway (LTE-R). The main challenges for LTE-R network planning are the rapidly time-varying channel and high mobility, because HSR lines consist of a variety of complex terrains, especially the composite scenarios where tunnels, cuttings, and viaducts are connected together within a short distance. Existing researches mainly focus on the path loss and delay spread for the individual HSR scenarios. In this paper, the broadband measurements are performed using a channel sounder at 950 MHz and 2150 MHz in a typical HSR composite scenario. Based on the measurements, the pivotal characteristics are analyzed for path loss exponent, power delay profile, and tap delay line model. Then, the deterministic channel model in which the 3D ray-tracing algorithm is applied in the composite scenario is presented and validated by the measurement data. Based on the ray-tracing simulations, statistical analysis of channel characteristics in delay and Doppler domain is carried out for the HSR composite scenario. The research results can be useful for radio interface design and optimization of LTE-R system.

Aluminum Reflow Sputtering

MRS Bulletin ◽  
1995 ◽  
Vol 20 (11) ◽  
pp. 53-56 ◽  
Author(s):  
Kuniko Kikuta
Keyword(s):  
Integrated Circuit ◽  
High Speed ◽  
Lower Cost ◽  
High Reliability ◽  
Device Fabrication ◽  
Damascene Process ◽  
Aspect Ratios ◽  
Multi Level ◽  
Poor Adhesion ◽  
Lower Resistivity

The scaling of integrated-circuit device dimensions in the horizontal direction has caused an increase in aspect ratios of contact holes and vias without a corresponding scaledown in vertical dimensions. Conventional sputtering has become unreliable for handling higher aspect-ratio via/contact holes because of its poor step coverage. Several studies have attempted to overcome this problem by using W-CVD and reflow technology. The W-CVD is used for practical device fabrications. However, this technique has several problems such as poor adhesion to SiO2, poor W surface morphology, greater resistivity than Al, and the need of an etch-back process.Al reflow technology using a conventional DC magnetron sputtering system can simplify device-fabrication processes and achieve high reliability without Al/W interfaces. In particular, the Al reflow technology is profitable for multi-level interconnections in combination with a damascene process by using Al chemical mechanical polishing (CMP). These interconnections are necessary for miniaturized and high-speed devices because they provide lower resistivity than W and simplify fabrication processes, resulting in lower cost.This article describes recent Al reflow sputtering technologies as well as application of via and interconnect metallization.

Multiple CMOS Intersection Measuring System Modeling and Analysis

2012 ◽  
Vol 614-615 ◽  
pp. 1299-1302
Author(s):  
Ming Jing Li ◽  
Yu Bing Dong ◽  
Guang Liang Cheng
Keyword(s):  
High Speed ◽  
High Performance ◽  
High Reliability ◽  
System Modeling ◽  
Position Effect ◽  
Field Of View ◽  
Measuring System ◽  
Price Ratio ◽  
Matlab Simulation ◽  
Modeling And Analysis

Multiple high speed CMOS cameras composing intersection system to splice large effect field of view(EFV). The key problem of system is how to locate multiple CMOS cameras in suitable position. Effect field of view was determined according to size, quantity and dispersion area of objects, so to determine camera position located on below, both sides and ahead to moving targets. This paper analyzes effect splicing field of view, operating range etc through establishing mathematical model and MATLAB simulation. Location method of system has advantage of flexibility splicing, convenient adjustment, high reliability and high performance-price ratio.

Research on Reconfigurable High-Speed Serial Bus Used in High-Reliability Embedded Computer

2010 ◽  
Vol 20-23 ◽  
pp. 774-778
Author(s):  
Rui Ding ◽  
Yong Qin Hu ◽  
Wei Gong Zhang ◽  
Bo Yang
Keyword(s):  
Computer System ◽  
High Speed ◽  
Communication Protocol ◽  
High Reliability ◽  
Dynamic Reconfiguration ◽  
System A ◽  
Embedded Computer ◽  
Key Points ◽  
Application Scope

The characteristics and limitations of the buses, which are widely used nowadays, are analyzed in this paper. Because these buses don’t adapt to the high-reliability embedded computer system, a novel bus is proposed which is characterized by its high-reliability. And its capacity is reached through its unique datum’s dynamic reconfiguration mechanism. The basic architecture and communication protocol are presented in this paper. And then the key points during realization of this bus are discussed. Finally, the probably application scope and prospects are indicated.

Research and Application on a Multi Head Conjugate Disc Indexing Cam Mechanism

2012 ◽  
Vol 184-185 ◽  
pp. 384-388
Author(s):  
Bing Tian Gao
Keyword(s):  
High Speed ◽  
Production Efficiency ◽  
High Reliability ◽  
Low Cost ◽  
Domestic Industry ◽  
Cam Mechanism ◽  
Technical Performance ◽  
Working Performance ◽  
Research Achievement ◽  
Indexing Mechanism

In order to realize the technical performance of high speed, high precision, high stability and high reliability for conjugated indexing mechanism with periodic intermittent rotary motion, a two cams structure has been designed, and its geometry size and profile curve was carefully determined. Also the calculation formula of the contour curve for CAM was deduced. Research achievement has been applied to new equipment of enterprise development, the working performance is stable and reliable, the production efficiency raised by 30% compared to the domestic industry. The mechanism has characteristics of simplified structure, improved transmission performance and low cost.

Design and Characteristics of Microfocus X-ray Source with Sealed Tube and Transmissive Target on Diamond Window

2021 ◽  
Vol 79 (6) ◽  
pp. 631-640
Author(s):  
Takaaki Tsunoda ◽  
Takeo Tsukamoto ◽  
Yoichi Ando ◽  
Yasuhiro Hamamoto ◽  
Yoichi Ikarashi ◽  
...  
Keyword(s):  
Power Density ◽  
High Power ◽  
High Speed ◽  
Electronic Device ◽  
High Reliability ◽  
Electronic Devices ◽  
Lithium Ion ◽  
High Power Density ◽  
High Magnification ◽  
X Ray

Electronic devices such as medical instruments implanted in the human body and electronic control units installed in automobiles have a large impact on human life. The electronic circuits in these devices require highly reliable operation. Radiographic testing has recently been in strong demand as a nondestructive way to help ensure high reliability. Companies that use high-density micrometer-scale circuits or lithium-ion batteries require high speed and high magnification inspection of all parts. The authors have developed a new X-ray source supporting these requirements. The X-ray source has a sealed tube with a transmissive target on a diamond window that offers advantages over X-ray sources having a sealed tube with a reflective target. The X-ray source provides high-power-density X-ray with no anode degradation and a longer shelf life. In this paper, the authors will summarize X-ray source classification relevant to electronic device inspection and will detail X-ray source performance requirements and challenges. The paper will also elaborate on technologies employed in the X-ray source including tube design implementations for high-power-density X-ray, high resolution, and high magnification simultaneously; reduced system downtime for automated X-ray inspection; and reduced dosages utilizing quick X-ray on-and-off emission control for protection of sensitive electronic devices.

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