A high-accuracy visual marker based on a microlens array

Author(s):  
Hideyuki Tanaka ◽  
Yasushi Sumi ◽  
Yoshio Matsumoto
Sensors ◽  
2019 ◽  
Vol 19 (18) ◽  
pp. 3922 ◽  
Author(s):  
Li ◽  
Yuan ◽  
Gao ◽  
Tan

Microlens array (MLA) errors in plenoptic cameras can cause the confusion or mismatching of 4D spatio-angular information in the image space, significantly affecting the accuracy and efficiency of target reconstruction. In this paper, we present a high-accuracy correction method for light fields distorted by MLA errors. Subpixel feature points are extracted from the microlens subimages of a raw image to obtain correction matrices and perform registration of the corresponding subimages at a subpixel level. The proposed method is applied for correcting MLA errors of two different categories in light-field images, namely form errors and orientation errors. Experimental results show that the proposed method can rectify the geometric and intensity distortions of raw images accurately and improve the quality of light-field refocusing. Qualitative and quantitative comparisons between images before and after correction verify the performance of our method in terms of accuracy, stability, and adaptability.


Author(s):  
M. Nishigaki ◽  
S. Katagiri ◽  
H. Kimura ◽  
B. Tadano

The high voltage electron microscope has many advantageous features in comparison with the ordinary electron microscope. They are a higher penetrating efficiency of the electron, low chromatic aberration, high accuracy of the selected area diffraction and so on. Thus, the high voltage electron microscope becomes an indispensable instrument for the metallurgical, polymer and biological specimen studies. The application of the instrument involves today not only basic research but routine survey in the various fields. Particularly for the latter purpose, the performance, maintenance and reliability of the microscope should be same as those of commercial ones. The authors completed a 500 kV electron microscope in 1964 and a 1,000 kV one in 1966 taking these points into consideration. The construction of our 1,000 kV electron microscope is described below.


The paper describes the main trends in the development of BIM technologies in the field of restoration and reconstruction of historical and cultural heritage buildings. The practical part of the paper presents the experience in using information modeling technologies when restoring the building, where the VI Congress of the Chinese Communist Party in Moscow took place. The use of laser scanning technologies made it possible to reproduce with high accuracy in the information model the original appearance of the building using Autodesk RevitR software. It is shown, how the use of information modeling technologies affects the duration of restoration process, taking into account the calculation of the structural scheme and bearing structures of the building, ensuring the identity of the decoration and the effective organization of electromechanical installation. Operating in a single BIM information environment makes it possible to continuously obtain reliable information on the project, which provides more effective information interaction and communication of participants compared to using traditional design methods.


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