New investigation of hot carrier degradation of RF small-signal parameters in high-k/metal gate nMOSFETs

2011 ◽  
Author(s):  
Hyun Chul Sagong ◽  
Chang Yong Kang ◽  
Chang-Woo Sohn ◽  
Min Sang Park ◽  
Do-Young Choi ◽  
...  
Keyword(s):  
Small Signal ◽  
Metal Gate ◽  
Hot Carrier ◽  
Signal Parameters ◽  
High K ◽  
Hot Carrier Degradation

New Investigation of Hot-Carrier Degradation on RF Small-Signal Parameter and Performance in High-$k$/Metal-Gate nMOSFETs

2011 ◽  
Vol 32 (12) ◽  
pp. 1668-1670
Author(s):  
Hyun Chul Sagong ◽  
Chang Yong Kang ◽  
Chang-Woo Sohn ◽  
Do-Young Choi ◽  
Eui-Young Jeong ◽  
...  
Keyword(s):  
Small Signal ◽  
Signal Parameter ◽  
Metal Gate ◽  
Hot Carrier ◽  
High K ◽  
And Performance ◽  
Hot Carrier Degradation

Channel Hot-Carrier degradation in short channel devices with high-k/metal gate stacks

2009 ◽  
Author(s):  
E. Amat ◽  
T. Kauerauf ◽  
R. Degraeve ◽  
R. Rodriguez ◽  
M. Nafria ◽  
...  
Keyword(s):  
Gate Stacks ◽  
Metal Gate ◽  
Short Channel ◽  
Hot Carrier ◽  
High K ◽  
Hot Carrier Degradation

Channel Hot-Carrier degradation under static stress in short channel transistors with high-k/metal gate stacks

2008 ◽  
Author(s):  
E. Amat ◽  
T. Kauerauf ◽  
R. Degraeve ◽  
A. De Keersgieter ◽  
R. Rodriguez ◽  
...  
Keyword(s):  
Static Stress ◽  
Gate Stacks ◽  
Metal Gate ◽  
Short Channel ◽  
Hot Carrier ◽  
High K ◽  
Hot Carrier Degradation

Channel Hot-Carrier Degradation in Short-Channel Transistors With High- $k$/Metal Gate Stacks

2009 ◽  
Vol 9 (3) ◽  
pp. 425-430 ◽  
Author(s):  
E. Amat ◽  
T. Kauerauf ◽  
R. Degraeve ◽  
A. De Keersgieter ◽  
R. Rodriguez ◽  
...  
Keyword(s):  
Gate Stacks ◽  
Metal Gate ◽  
Short Channel ◽  
Hot Carrier ◽  
High K ◽  
Hot Carrier Degradation

Intrinsic hot-carrier degradation of nMOSFETs by decoupling PBTI component in 28nm high-k/metal gate stacks

2012 ◽  
Author(s):  
Nathan Hui-Hsin Hsu ◽  
Jian-Wen You ◽  
Huan-Chi Ma ◽  
Shih-Ching Lee ◽  
Eliot Chen ◽  
...  
Keyword(s):  
Gate Stacks ◽  
Metal Gate ◽  
Hot Carrier ◽  
High K ◽  
Hot Carrier Degradation

PBTI-Associated High-Temperature Hot Carrier Degradation of nMOSFETs With Metal-Gate/High- $k$ Dielectrics

2008 ◽  
Vol 29 (4) ◽  
pp. 389-391 ◽  
Author(s):  
Kyong Taek Lee ◽  
Chang Yong Kang ◽  
Ook Sang Yoo ◽  
Rino Choi ◽  
Byoung Hun Lee ◽  
...  
Keyword(s):  
High Temperature ◽  
Metal Gate ◽  
Hot Carrier ◽  
High K ◽  
Hot Carrier Degradation

Tradeoff Between Hot Carrier and Negative Bias Temperature Degradations in High-Performance $\hbox{Si}_{1 - x}\hbox{Ge}_{x}$ pMOSFETs With High-$k$/Metal Gate Stacks

2010 ◽  
Author(s):  
Won-Ho Choi ◽  
Chang-Young Kang ◽  
Jung-Woo Oh ◽  
Byoung-Hun Lee ◽  
Prashant Majhi ◽  
...  
Keyword(s):  
High Performance ◽  
Negative Bias ◽  
Gate Stacks ◽  
Metal Gate ◽  
Hot Carrier ◽  
High K

Enhanced degradation of n-MOSFETs with high-k/metal gate stacks under channel hot-carrier/gate-induced drain leakage alternating stress

2012 ◽  
Vol 52 (9-10) ◽  
pp. 1901-1904 ◽  
Author(s):  
Dongwoo Kim ◽  
Seonhaeng Lee ◽  
Cheolgyu Kim ◽  
Chiho Lee ◽  
Jeongsoo Park ◽  
...  
Keyword(s):  
Gate Stacks ◽  
Metal Gate ◽  
Hot Carrier ◽  
High K ◽  
Enhanced Degradation
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