Hot Carrier Degradation in Cryo-CMOS

2020 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps45951.2020.9129312 ◽

2020 ◽

Author(s):

W. Chakraborty ◽

U. Sharma ◽

S. Datta ◽

S. Mahapatra

Keyword(s):

Hot Carrier ◽

Hot Carrier Degradation

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Liquid-helium temperature hot-carrier degradation of Si p-channel MOSTs

IEE Proceedings G Circuits Devices and Systems ◽

10.1049/ip-g-2.1993.0069 ◽

1993 ◽

Vol 140 (6) ◽

pp. 431 ◽

Author(s):

E. Simoen ◽

C. Claeys

Keyword(s):

Liquid Helium ◽

Liquid Helium Temperature ◽

Helium Temperature ◽

Hot Carrier ◽

Hot Carrier Degradation

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ANALYSIS OF HOT CARRIER DEGRADATION IN AC STRESSED N-CHANNEL MOS TRANSISTORS USING THE CHARGE PUMPING TECHNIQUE

Le Journal de Physique Colloques ◽

10.1051/jphyscol:19884136 ◽

1988 ◽

Vol 49 (C4) ◽

pp. C4-651-C4-655 ◽

Author(s):

R. BELLENS ◽

P. HEREMANS ◽

G. GROESENEKEN ◽

H. E. MAES

Keyword(s):

Mos Transistors ◽

Charge Pumping ◽

Hot Carrier ◽

Hot Carrier Degradation

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THE IMPACT OF DIFFERENT HOT-CARRIER-DEGRADATION COMPONENTS ON THE OPTIMIZATION OF SUBMICRON n-CHANNEL LDD TRANSISTORS

Le Journal de Physique Colloques ◽

10.1051/jphyscol:19884165 ◽

1988 ◽

Vol 49 (C4) ◽

pp. C4-787-C4-790

Author(s):

P. T.J. BIERMANS ◽

T. POORTER ◽

H. J.H. MERKS-EPPINGBROEK

Keyword(s):

Hot Carrier ◽

Hot Carrier Degradation

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Localizing Hot-Carrier Degradation in Silicon Trench MOSFETs

IEEE Transactions on Electron Devices ◽

10.1109/ted.2021.3060697 ◽

2021 ◽

Vol 68 (4) ◽

pp. 1804-1809

Author(s):

Bernhard Ruch ◽

Gregor Pobegen ◽

Tibor Grasser

Keyword(s):

Hot Carrier ◽

Hot Carrier Degradation

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Hot-carrier degradation of p-MOSFET's in analog operation: the relevance of the channel-length-independent drain conductance degradation

International Technical Digest on Electron Devices Meeting ◽

10.1109/iedm.1992.307417 ◽

1992 ◽

Author(s):

Thewes ◽

Brox ◽

Tempel ◽

Weber ◽

Goser

Keyword(s):

Channel Length ◽

Hot Carrier ◽

Drain Conductance ◽

Hot Carrier Degradation

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Early stage hot carrier degradation of state-of-the-art LDD N-MOSFETs

2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059) ◽

10.1109/relphy.2000.843899 ◽

2002 ◽

Author(s):

S.K. Manhas ◽

M.M. de Souza ◽

A.S. Gates ◽

S.C. Chetlur ◽

E.M. Sankara Narayanan

Keyword(s):

State Of The Art ◽

Early Stage ◽

Hot Carrier ◽

Hot Carrier Degradation

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DRAM standby current failure: the influence of hot carrier degradation on voltage level-up shifter circuit

IEEE International Integrated Reliability Workshop Final Report, 2004 ◽

10.1109/irws.2004.1422767 ◽

2005 ◽

Author(s):

K.J. Lee ◽

J.Y. Seo ◽

J.W. Jung ◽

G.J. Jung ◽

J.R. Lee ◽

...

Keyword(s):

Voltage Level ◽

Hot Carrier ◽

Hot Carrier Degradation

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Investigation of hot carrier degradation in asymmetric nDeMOS transistors

Microelectronics Reliability ◽

10.1016/j.microrel.2007.12.003 ◽

2008 ◽

Vol 48 (4) ◽

pp. 508-513 ◽

Author(s):

Qingxue Wang ◽

Lanxia Sun ◽

Andrew Yap

Keyword(s):

Hot Carrier ◽

Hot Carrier Degradation

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Role of e-e scattering in the enhancement of channel hot carrier degradation of deep sub-micron NMOSFETs at high V/sub GS/ conditions

2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) ◽

10.1109/relphy.2001.922933 ◽

2002 ◽

Author(s):

S.E. Rauch ◽

G. La Rosa ◽

F.J. Guarin

Keyword(s):

Hot Carrier ◽

Hot Carrier Degradation

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Hot carrier degradation in MOSFETs: a charge pumping study

Semiconductor Science and Technology ◽

10.1088/0268-1242/8/4/012 ◽

1993 ◽

Vol 8 (4) ◽

pp. 549-554 ◽

Author(s):

N C Das ◽

V Nathan

Keyword(s):

Charge Pumping ◽

Hot Carrier ◽

A Charge ◽

Hot Carrier Degradation

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