LiveBusTrack : High-frequency location update information system for shuttle/bus riders

Objective: To identify notified cases of repeated violence against older adults and its association with the characteristics of the victims, of the aggressor, and the aggression. Materials and methods: A cross-sectional study was conducted based on data recorded in the Information System for Notifiable Health Problems on interpersonal repeated violence perpetrated against older adults between 2011 and 2018 in Espírito Santo, Brazil. The data were analyzed employing Poisson multiple regression with robust variance. Results: The frequency of repeated violence was 50.1 % (95 % CI: 47.7-52.6). Being 80 years old or more, presenting disabilities or disorders, and having suffered violence by partners and/or children were associated with this condition in both genders. In aged men, violence was more frequently perpetrated by two or more aggressors and during the day, whereas aged women were more frequently assaulted in urban areas. Conclusion: The high frequency of repeated violence and the associations with the characteristics studied reflect the need for care to older adults with disabilities or disorders and the possible signs of burden in family caregivers that may result in situations of violence. Actions aimed at early detection and adequate assistance to the victims and to the aggressors are important to avoid the chronicity of the condition.

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Online Staypoint Detection in High-Frequency Location Update Streams

2021 22nd IEEE International Conference on Mobile Data Management (MDM) ◽

10.1109/mdm52706.2021.00027 ◽

2021 ◽

Author(s):

Golnaz Elmamooz ◽

Marco Grawunder ◽

Aboubakr Benabbas ◽

Daniela Nicklas

Keyword(s):

High Frequency ◽

Location Update

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The Optimal Location Update Strategy of Cellular Network Based Traffic Information System

2006 IEEE Intelligent Transportation Systems Conference ◽

10.1109/itsc.2006.1706750 ◽

2006 ◽

Cited By ~ 6

Author(s):

M. Hsiao ◽

S.K.J. Chang

Keyword(s):

Information System ◽

Cellular Network ◽

Optimal Location ◽

Traffic Information ◽

Location Update ◽

Update Strategy

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What are the causes of death of patients with tuberculosis? Multiple causes of death in a cohort of cases and a research proposal of presumed causes

International Journal for Population Data Science ◽

10.23889/ijpds.v1i1.97 ◽

2017 ◽

Vol 1 (1) ◽

Author(s):

Marli Rocha ◽

Rejane Pinheiro ◽

Gisele Oliveira ◽

Fernanda Aguiar ◽

Valéria Saraceni

Keyword(s):

Information System ◽

Record Linkage ◽

High Frequency ◽

Causes Of Death ◽

Research Proposal ◽

Multiple Causes Of Death ◽

Notifiable Diseases ◽

Probabilistic Record Linkage ◽

Multiple Causes

ABSTRACT ObjetctiveThe objective of this study was to analyze the multiple causes of death in a cohort of patients with tuberculosis (TB) and to introduce an investigation proposal death for TB from a list of presumable causes. ApproachWe performed a probabilistic record linkage with the databases of the Information System for Notifiable Diseases (SINAN) 2006 and the Mortality Information System (SIM) 2006-2008. The underline cause and the association causes of death were analysed by sex, age and time from TB diagnostic to death. ResultsThere were 825 deaths, of which 23% for death for TB, deaths due to TB with 16% and 61% without mention of TB. Two hundred and fifteen (42.7%) deaths occurred within the period of treatment, whose profile differed from the pattern of causes when TB was an associated cause, with high frequency of re- spiratory diseases, AIDS and ill-defined causes. We elaborated a proposal for correction of associated causes of death and an investigation proposal death for TB from a list of presumable causes. According to the proposal, 26 deaths could have modified the underlying cause. ConclusionThis study highlights the importance of record linkage to TB surveillance and improvement of information the SIM and SINAN.

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The Microstructure of Steatite (Protoenstatite)

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100118102 ◽

1985 ◽

Vol 43 ◽

pp. 236-237

Author(s):

W. E. Lee ◽

A. H. Heuer

Keyword(s):

High Frequency ◽

Glass Ceramics ◽

Magnesium Silicate ◽

Beam Current ◽

Glassy Matrix ◽

Angle Of Incidence ◽

X Ray ◽

Mechanical And Electrical Properties ◽

Argon Ions ◽

High Temperature Polymorph

IntroductionTraditional steatite ceramics, made by firing (vitrifying) hydrous magnesium silicate, have long been used as insulators for high frequency applications due to their excellent mechanical and electrical properties. Early x-ray and optical analysis of steatites showed that they were composed largely of protoenstatite (MgSiO3) in a glassy matrix. Recent studies of enstatite-containing glass ceramics have revived interest in the polymorphism of enstatite. Three polymorphs exist, two with orthorhombic and one with monoclinic symmetry (ortho, proto and clino enstatite, respectively). Steatite ceramics are of particular interest a they contain the normally unstable high-temperature polymorph, protoenstatite.Experimental3mm diameter discs cut from steatite rods (∼10” long and 0.5” dia.) were ground, polished, dimpled, and ion-thinned to electron transparency using 6KV Argon ions at a beam current of 1 x 10-3 A and a 12° angle of incidence. The discs were coated with carbon prior to TEM examination to minimize charging effects.

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Simulations of high-resolution images of amorphous silicon films

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010014419x ◽

1986 ◽

Vol 44 ◽

pp. 544-545

Author(s):

G. Y. Fan ◽

J. M. Cowley

Keyword(s):

Electron Microscope ◽

High Frequency ◽

Fourier Transformation ◽

Amorphous Materials ◽

Low Frequency ◽

Chromatic Aberration ◽

Structure Information ◽

Frequency Components ◽

High Resolution Images ◽

Spatial Frequency Spectrum

It is well known that the structure information on the specimen is not always faithfully transferred through the electron microscope. Firstly, the spatial frequency spectrum is modulated by the transfer function (TF) at the focal plane. Secondly, the spectrum suffers high frequency cut-off by the aperture (or effectively damping terms such as chromatic aberration). While these do not have essential effect on imaging crystal periodicity as long as the low order Bragg spots are inside the aperture, although the contrast may be reversed, they may change the appearance of images of amorphous materials completely. Because the spectrum of amorphous materials is continuous, modulation of it emphasizes some components while weakening others. Especially the cut-off of high frequency components, which contribute to amorphous image just as strongly as low frequency components can have a fundamental effect. This can be illustrated through computer simulation. Imaging of a whitenoise object with an electron microscope without TF limitation gives Fig. 1a, which is obtained by Fourier transformation of a constant amplitude combined with random phases generated by computer.

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SEM image sharpness analysis

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100163174 ◽

1996 ◽

Vol 54 ◽

pp. 142-143

Author(s):

M. T. Postek ◽

A. E. Vladar

Keyword(s):

High Frequency ◽

Low Frequency ◽

Quantitative Information ◽

Primary Electron ◽

Image Sharpness ◽

Critical Dimensions ◽

Sem Image ◽

Frequency Changes ◽

Electron Microscopes ◽

Scanning Electron

Fully automated or semi-automated scanning electron microscopes (SEM) are now commonly used in semiconductor production and other forms of manufacturing. The industry requires that an automated instrument must be routinely capable of 5 nm resolution (or better) at 1.0 kV accelerating voltage for the measurement of nominal 0.25-0.35 micrometer semiconductor critical dimensions. Testing and proving that the instrument is performing at this level on a day-by-day basis is an industry need and concern which has been the object of a study at NIST and the fundamentals and results are discussed in this paper.In scanning electron microscopy, two of the most important instrument parameters are the size and shape of the primary electron beam and any image taken in a scanning electron microscope is the result of the sample and electron probe interaction. The low frequency changes in the video signal, collected from the sample, contains information about the larger features and the high frequency changes carry information of finer details. The sharper the image, the larger the number of high frequency components making up that image. Fast Fourier Transform (FFT) analysis of an SEM image can be employed to provide qualitiative and ultimately quantitative information regarding the SEM image quality.

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Real Ear Sound Pressure Levels Developed by Three Portable Stereo System Earphones

American Journal of Audiology ◽

10.1044/1059-0889.0104.52 ◽

1992 ◽

Vol 1 (4) ◽

pp. 52-55 ◽

Cited By ~ 4

Author(s):

Gail L. MacLean ◽

Andrew Stuart ◽

Robert Stenstrom

Keyword(s):

High Frequency ◽

Sound Pressure ◽

Low Frequency ◽

Test System ◽

Output Frequency ◽

Frequency Effects ◽

Adult Men ◽

Frequency Responses ◽

Significant Difference ◽

Sound Pressure Levels

Differences in real ear sound pressure levels (SPLs) with three portable stereo system (PSS) earphones (supraaural [Sony Model MDR-44], semiaural [Sony Model MDR-A15L], and insert [Sony Model MDR-E225]) were investigated. Twelve adult men served as subjects. Frequency response, high frequency average (HFA) output, peak output, peak output frequency, and overall RMS output for each PSS earphone were obtained with a probe tube microphone system (Fonix 6500 Hearing Aid Test System). Results indicated a significant difference in mean RMS outputs with nonsignificant differences in mean HFA outputs, peak outputs, and peak output frequencies among PSS earphones. Differences in mean overall RMS outputs were attributed to differences in low-frequency effects that were observed among the frequency responses of the three PSS earphones. It is suggested that one cannot assume equivalent real ear SPLs, with equivalent inputs, among different styles of PSS earphones.

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