A Lifetime Prediction Method for IGBT Modules Considering the Self-accelerating Effect of Bond Wire Damage

Author(s):  
Fei Qin ◽  
Xiaorui Bie ◽  
Tong An ◽  
Jingru Dai ◽  
Yanwei Dai ◽  
...  
2021 ◽  
Vol 2021 ◽  
pp. 1-10
Author(s):  
İsmail Kıyak ◽  
Gökhan Gökmen ◽  
Gökhan Koçyiğit

Predicting the lifetime of a LED lighting system is important for the implementation of design specifications and comparative analysis of the financial competition of various illuminating systems. Most lifetime information published by LED manufacturers and standardization organizations is limited to certain temperature and current values. However, as a result of different working and ambient conditions throughout the whole operating period, significant differences in lifetimes can be observed. In this article, an advanced method of lifetime prediction is proposed considering the initial task areas and the statistical characteristics of the study values obtained in the accelerated fragmentation test. This study proposes a new method to predict the lifetime of COB LED using an artificial intelligence approach and LM-80 data. Accordingly, a database with 6000 hours of LM-80 data was created using the Neuro-Fuzzy (ANFIS) algorithm, and a highly accurate lifetime prediction method was developed. This method reveals an approximate similarity of 99.8506% with the benchmark lifetime. The proposed methodology may provide a useful guideline to lifetime predictions of LED-related products which can also be adapted to different operating conditions in a shorter time compared to conventional methods. At the same time, this method can be used in the life prediction of nanosensors and can be produced with the 3D technique.


Author(s):  
Wenzhao Liu ◽  
Dao Zhou ◽  
Francesco Iannuzzo ◽  
Michael Hartmann ◽  
Frede Blaabjerg

2019 ◽  
Vol 31 (3) ◽  
pp. 163-168 ◽  
Author(s):  
Oliver Krammer ◽  
Péter Martinek ◽  
Balazs Illes ◽  
László Jakab

Purpose This paper aims to investigate the self-alignment of 0603 size (1.5 × 0.75 mm) chip resistors, which were soldered by infrared or vapour phase soldering. The results were used for establishing an artificial neural network for predicting the component movement during the soldering. Design/methodology/approach The components were soldered onto an FR4 testboard, which was designed to facilitate the measuring of the position of the components both prior to and after the soldering. A semi-automatic placement machine misplaced the components intentionally, and the self-alignment ability was determined for soldering techniques of both infrared and vapour phase soldering. An artificial neural network-based prediction method was established, which is able to predict the position of chip resistors after soldering as a function of component misplacement prior to soldering. Findings The results showed that the component can self-align from farer distances by using vapour phase method, even from relative misplacement of 50 per cent parallel to the shorter side of the component. Components can self-align from a relative misplacement only of 30 per cent by using infrared soldering method. The established artificial neural network can predict the component self-alignment with an approximately 10-20 per cent mean absolute error. Originality/value It was proven that the vapour phase soldering method is more stable from the component’s self-alignment point of view. Furthermore, machine learning-based predictors can be applied in the field of reflow soldering technology, and artificial neural networks can predict the component self-alignment with an appropriately low error.


2008 ◽  
Vol 92 (24) ◽  
pp. 243501 ◽  
Author(s):  
Jone F. Chen ◽  
Kuen-Shiuan Tian ◽  
Shiang-Yu Chen ◽  
J. R. Lee ◽  
Kuo-Ming Wu ◽  
...  

Author(s):  
Shuai Lin ◽  
Xiaochun Fang ◽  
Fei Lin ◽  
Zhongping Yang ◽  
Xiaofan Wang ◽  
...  

2017 ◽  
Vol 32 (11) ◽  
pp. 8718-8727 ◽  
Author(s):  
Xiaohui Qu ◽  
Huai Wang ◽  
Xiaoqing Zhan ◽  
Frede Blaabjerg ◽  
Henry Shu-Hung Chung

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