Hot carrier stress degradation modes in p-type high voltage LDMOS transistors

2009 ◽  
Author(s):  
H. Enichlmair ◽  
J. M. Park ◽  
S. Carniello ◽  
B. Loeffler ◽  
R. Minixhofer ◽  
...  
Keyword(s):  
High Voltage ◽  
Hot Carrier ◽  
Hot Carrier Stress ◽  
Stress Degradation ◽  
P Type ◽  
Degradation Modes

TCAD simulation of hot-carrier stress degradation in split-gate n-channel STI-LDMOS transistors

2020 ◽  
Vol 109 ◽  
pp. 113643
Author(s):  
Federico Giuliano ◽  
Paolo Magnone ◽  
Simone Pistollato ◽  
Andrea Natale Tallarico ◽  
Susanna Reggiani ◽  
...  
Keyword(s):  
Hot Carrier ◽  
Hot Carrier Stress ◽  
Stress Degradation ◽  
Tcad Simulation

Abnormal Relationship Between Hot Carrier Stress Degradation and Body Current in High-k Metal Gate in the 14-nm Node

2019 ◽  
Vol 40 (4) ◽  
pp. 498-501
Author(s):  
Kai-Chun Chang ◽  
Jih-Chien Liao ◽  
Ting-Chang Chang ◽  
Chien-Hung Yeh ◽  
Chien-Yu Lin ◽  
...  
Keyword(s):  
Metal Gate ◽  
Hot Carrier ◽  
High K ◽  
Hot Carrier Stress ◽  
Stress Degradation

Hot-Carrier-Induced Degradation in P-type High-Voltage DEMOS Transistors

2008 ◽  
Author(s):  
J. F. Chen ◽  
J. R. Lee ◽  
S. Y. Chen ◽  
K. S. Tian ◽  
K. M. Wu ◽  
...  
Keyword(s):  
High Voltage ◽  
Hot Carrier ◽  
P Type

Mechanisms of Hot-Carrier-Induced Threshold-Voltage Shift in High-Voltage p-Type LDMOS Transistors

2009 ◽  
Vol 56 (12) ◽  
pp. 3203-3206 ◽  
Author(s):  
Jone F. Chen ◽  
Kuen-Shiuan Tian ◽  
Shiang-Yu Chen ◽  
Kuo-Ming Wu ◽  
J. R. Shih ◽  
...  
Keyword(s):  
High Voltage ◽  
Threshold Voltage ◽  
Threshold Voltage Shift ◽  
Voltage Shift ◽  
Hot Carrier ◽  
P Type

Inhibiting the Kink Effect and Hot-Carrier Stress Degradation Using Dual-Gate Low-Temperature Poly-Si TFTs

2020 ◽  
Vol 41 (1) ◽  
pp. 54-57 ◽  
Author(s):  
Hong-Chih Chen ◽  
Hong-Yi Tu ◽  
Hui-Chun Huang ◽  
Wei-Chih Lai ◽  
Ting-Chang Chang ◽  
...  
Keyword(s):  
Low Temperature ◽  
Hot Carrier ◽  
Kink Effect ◽  
Hot Carrier Stress ◽  
Stress Degradation ◽  
Dual Gate

Interface Traps Analysis in p-Type Poly-Si TFTs Under Hot Carrier Stress Using the Charge Pumping Method

2017 ◽  
Vol 17 (10) ◽  
pp. 7101-7106 ◽  
Author(s):  
Sangsub Kim ◽  
Pyungho Choi ◽  
Hyunki Kim ◽  
Soonkon Kim ◽  
Junyong Shin ◽  
...  
Keyword(s):  
Interface Traps ◽  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Stress ◽  
P Type
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