Redesign of a Lowenergy Probe Head

Author(s):  
Y.-N. Rao ◽  
G.H. Mackenzie ◽  
T. Ries
Keyword(s):  
Author(s):  
Chunlei Wu ◽  
Suying Yao

Abstract Lock-in IR-OBIRCH analysis, as a kind of static thermal laser stimulation (S-TLS) technique, is very effective to isolate a fault for the parametric failure cases. However, its capability is limited to localize a defect when the IC is operated under a defined operating condition. Whereas the dynamic thermal laser stimulation (D-TLS) technique is good at locating a fault while the IC is operated under some functions to activate the failure. In this paper, a novel method is presented to realize DTLS just by Lock-in IR-OBIRCH assisted with a Current Detection Probe Head. Two cases are studied to demonstrate the effectiveness of this method.


Author(s):  
Hung-Sung Lin ◽  
Mong-Sheng Wu

Abstract The use of a scanning probe microscope (SPM), such as a conductive atomic force microscope (C-AFM) has been widely reported as a method of failure analysis in nanometer scale science and technology [1-6]. A beam bounce technique is usually used to enable the probe head to measure extremely small movements of the cantilever as it is moved across the surface of the sample. However, the laser beam used for a beam bounce also gives rise to the photoelectric effect while we are measuring the electrical characteristics of a device, such as a pn junction. In this paper, the photocurrent for a device caused by photon illumination was quantitatively evaluated. In addition, this paper also presents an example of an application of the C-AFM as a tool for the failure analysis of trap defects by taking advantage of the photoelectric effect.


2016 ◽  
Vol 6 (5) ◽  
pp. 144 ◽  
Author(s):  
Adam Gąska ◽  
Piotr Gąska ◽  
Maciej Gruza

2021 ◽  
Author(s):  
Krzysztof Stepien ◽  
Urszula Kmiecik-Sołtysiak ◽  
Anna Zawada-Tomkiewicz ◽  
Uros Zuperl

Abstract One of the most universal measuring techniques in contemporary industry is a coordinate measuring technique. This paper focuses on a problem of measurements of form deviations with the use of coordinate measuring machines (CMMs). Nowadays, such measurements are usually carried out using a scanning probe-heads. The paper discusses the problem of measurements of roundness deviations by a scanning probe-head. Authors conducted an experiment aiming at the study of the influence of the number of probing points and the scanning speed on parameters of roundness error. The results were compared to the reference values obtained from the radius change instrument for highly accurate roundness and cylindricity measurements. The paper presents the introduction to the problem, the methodology of the study, the results of the experiment, discussion and final conclusions including the plan of further research.


1998 ◽  
Vol 52 (4) ◽  
pp. 477-487 ◽  
Author(s):  
Alian Wang ◽  
Larry A. Haskin ◽  
Enriqueta Cortez

Raman spectroscopy has the potential to provide definitive identification and detailed characterization of the minerals that comprise rocks and soils on planetary surfaces. We have designed a probe head for Raman spectroscopy that is suitable for use on a spectrometer deployed by a rover or a lander on the surface of a planet such as Mars, the Moon, or an asteroid. The probe head is lightweight, low power, rugged, and simple. It is based on a tiny distributed feedback diode laser and volume holographic components. A protective shell surrounds the probe head and serves as a mechanical stop for the mechanical arm of a planetary rover or lander during placement of the probe head onto the surface of a rock or soil. Pressing the shell against the rough surface of a target rock or soil also places the sampling objective of the probe head in rough focus, and the probe head is designed to be tolerant of focusing errors of ∼5 mm. A breadboard version of the probe head gave spectra of high quality on clean crystals of diamond, sulfur, calcite, quartz, and olivine. The results are qualitatively comparable to those obtained by using a conventional micro-Raman spectrometer on fine-grained travertine and on difficult specimens of basaltic lavas and impactites whose original mineralogy had been altered by reaction with water and air.


2014 ◽  
Vol 53 (45) ◽  
pp. 17589-17596 ◽  
Author(s):  
Andreas Scheithauer ◽  
Alexander Brächer ◽  
Thomas Grützner ◽  
Daniel Zollinger ◽  
Werner R. Thiel ◽  
...  

1994 ◽  
Vol 49 (1-2) ◽  
pp. 42-46 ◽  
Author(s):  
Michał Ostafin ◽  
Mariusz Maćkowiak ◽  
Marek Bojarski

Abstract A complete N Q R probe-head system operating in the frequency ranges 0.5 -150 and 150- 300 MHz is described. The head is particularly suited for NQR experiments carried out at a remote location, for example in a low-temperature cryostat or high-pressure chamber. Moreover, the head system includes a microprocessor-controller for automated tuning of the probe to the operating frequency of the associated NQR spectrometer. The controller can be easily interfaced to a PC via standard serial port.


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