Effect of Light Irradiation on Carrier Mobility of n- and p-type Si substrates for Solar Cell Application

Author(s):  
Atsuhiko Fukuyama ◽  
Shuya Tategami ◽  
Kenjiro Takauchi ◽  
Naoki Matsuda ◽  
Tsubasa Nakamura ◽  
...  
Solar RRL ◽  
2017 ◽  
Vol 1 (2) ◽  
pp. 1600007 ◽  
Author(s):  
Tristan Carrere ◽  
Delfina Muñoz ◽  
Marianne Coig ◽  
Christophe Longeaud ◽  
Jean-Paul Kleider

2011 ◽  
Vol 11 (1) ◽  
pp. S34-S38 ◽  
Author(s):  
Hwan Soo Jang ◽  
Byeong-Yun Oh ◽  
Ho-Jin Choi ◽  
Seong-Ho Baek ◽  
Seong Been Kim ◽  
...  

2008 ◽  
Author(s):  
Andrew Melton ◽  
Hongbo Yu ◽  
Omkar Jani ◽  
Balakrishnam R. Jampana ◽  
Shen-Jie Wang ◽  
...  

2019 ◽  
Vol 8 (1) ◽  
pp. 28-33
Author(s):  
M. A. Jafarov ◽  
E. F. Nasirov ◽  
S. A. Jahangirova ◽  
R. Mammadov

 Nanostructure CZTS thin film was fabricated by electrodeposition technique. To manufacture the heterojunctions, p-type c-Si wafers of (100) orientation were used as a substrate.  Before anodization, the surface of the c-Si substrates were etched in an aqueous solution of HF and further washed in distilled water (at temperature of 80°С and ethyl alcohol and then dried in air. The current-voltage characteristics of the CZTS /PS solar cell under dark conditions show that forward bias current variation approximately exponentially with voltage bias. The capacitance for Nano- CZTS /PS Solar Cell decreases with the increase of the reverse bias voltage and with the increasing of etching time of nPS layers. That heterojunctions demonstrate good photo-response in the wavelength range of 510 - 650 nm.


2000 ◽  
Vol 266-269 ◽  
pp. 171-175 ◽  
Author(s):  
Toshiaki Sasaki ◽  
Shinji Fujikake ◽  
Katsuya Tabuchi ◽  
Takashi Yoshida ◽  
Toshio Hama ◽  
...  

2013 ◽  
Vol 16 (1) ◽  
pp. 101-111
Author(s):  
Chien Mau Dang ◽  
Tung Thanh Bui ◽  
Hung Thanh Le ◽  
Vu Ngoc Hoang ◽  
Linh Ngoc Tran ◽  
...  

In the heterojunction with intrinsic thin-layer (HIT) solar cell structure studied in this work, an intrinsic amorphous silicon (a-Si) layer followed by a n-type amorphous silicon was deposited on a p-type Czochralski (CZ) monocrystalline silicon (c-Si) wafer by plasma enhanced chemical vapor deposition (PECVD) method to form an heterojunction device. Then, indium tin oxide (ITO) layer was formed by DC magnetron sputtering as the top electrode and the anti-reflection coating layer. In order to obtain the high efficiency heterojunction structure, two important aspects were focused: improving the passivation properties of a-Si/c-Si heterojunction and reducing the light absorption and the sheet resistance of ITO layers. It was found that hydrogenated amorphous silicon (a- Si:H) layers can be grown at low substrate temperature, about 200°C. High-quality ITO layers with the sheet resistance less than 15 ohm/sq and the transmittance of about 70%, can be deposited at relatively low DC power (50W).


2017 ◽  
Vol 13 (4) ◽  
pp. 49-54
Author(s):  
Sooyoung Park ◽  
Gyungbae Shim ◽  
Sanguk Han ◽  
Shihyun Ahn ◽  
Cheolmin Park ◽  
...  

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