Commercial Production of Low-k PZT film using Sputtering Method

Author(s):  
Mario Kiuchi ◽  
Ryoma Miyake ◽  
Shinya Yoshida ◽  
Shuji Tanaka ◽  
Tsuyoshi Takemoto ◽  
...  
Keyword(s):  
Pzt Film ◽  
Author(s):  
Mario Kiuchi ◽  
Ryoma Miyake ◽  
Shinya Yoshida ◽  
Shuji Tanaka ◽  
Tsuyoshi Takemoto ◽  
...  
Keyword(s):  
Pzt Film ◽  

Author(s):  
Avril V. Somlyo ◽  
H. Shuman ◽  
A.P. Somlyo

This is a preliminary report of electron probe analysis of rabbit portal-anterior mesenteric vein (PAMV) smooth muscle cryosectioned without fixation or cryoprotection. The instrumentation and method of electron probe quantitation used (1) and our initial results with cardiac (2) and skeletal (3) muscle have been presented elsewhere.In preparations depolarized with high K (K2SO4) solution, significant calcium peaks were detected over the sarcoplasmic reticulum (Fig 1 and 2) and the continuous perinuclear space. In some of the fibers there were also significant (up to 200 mM/kg dry wt) calcium peaks over the mitochondria. However, in smooth muscle that was not depolarized, high mitochondrial Ca was found in fibers that also contained elevated Na and low K (Fig 3). Therefore, the possibility that these Ca-loaded mitochondria are indicative of cell damage remains to be ruled out.


1909 ◽  
Vol 67 (1736supp) ◽  
pp. 233-234
Author(s):  
Alfred Gradenwitz

EDIS ◽  
2017 ◽  
Vol 2017 (6) ◽  
Author(s):  
Rebecca L. Wente ◽  
Samuel F. Hutton ◽  
Scott Adkins ◽  
William Turechek ◽  
Joseph E. Funderburk

Authors describe performance of Tospovirus-resistant tomato varieties under commercial production settings in Dade County, FL. Virus resistance has become important for this area since the emergence of two new tomato-infecting tospoviruses. Knowledge of availability and performance of resistant varieties will help growers who are looking for alternative varieties.


2017 ◽  
Vol 17 (1) ◽  
pp. 15-18
Author(s):  
Donnie Lalfakzuala Kawlni ◽  
Chhungpuii Khawlhring

Broccoli (Brassica oleracea var. italica), a popular vegetable crop, has one of the most exacting climatic and cultural requirements, which limit its commercial production to a few favored locations. A field experiment was conducted at Mizoram University, Tanhril, Mizoram during winter of 2013/2014 to find out the effect of time of sowing on plant performance and yield of broccoli. Six sowing time was done viz. 17 October (T1), 24 October (T2), 31 October (T3), 7 November (T4), 14 November (T5) and 21 November (T6) with plant spacing of 45cm x 45cm. Yield and yield contributing characters were significantly influenced by the planting time. Highest average weight of marketable curd per plant (199.20 g) was obtained from T2, whereas lowest average weight obtained from T6 (75 g). The influence of planting time also showed significant difference on the calculated yield (tonnes per hectare) of broccoli, in which T2 showed highest marketable yield of 9.83 t/ha.


2010 ◽  
Vol 130 (4) ◽  
pp. 319-324
Author(s):  
Kouichiro Mizuno ◽  
Hirotake Sugawara ◽  
Akihiro Murayama
Keyword(s):  

2016 ◽  
Vol 136 (12) ◽  
pp. 493-498 ◽  
Author(s):  
Junko Kazusa ◽  
Kazuhiro Koga ◽  
Norio Umeyama ◽  
Fumito Imura ◽  
Daiji Noda ◽  
...  

2003 ◽  
Vol 766 ◽  
Author(s):  
Ahila Krishnamoorthy ◽  
N.Y. Huang ◽  
Shu-Yunn Chong

AbstractBlack DiamondTM. (BD) is one of the primary candidates for use in copper-low k integration. Although BD is SiO2 based, it is vastly different from oxide in terms of dielectric strength and reliability. One of the main reliability concerns is the drift of copper ions under electric field to the surrounding dielectric layer and this is evaluated by voltage ramp (V-ramp) and time dependent dielectric breakdown (TDDB). Metal 1 and Metal 2 intralevel comb structures with different metal widths and spaces were chosen for dielectric breakdown studies. Breakdown field of individual test structures were obtained from V-ramp tests in the temperature range of 30 to 150°C. TDDB was performed in the field range 0.5 – 2 MV/cm. From the leakage between combs at the same level (either metal 1 or metal 2) Cu drift through SiC/BD or SiN/BD interface was characterized. It was found that Cu/barrier and barrier/low k interfaces functioned as easy paths for copper drift thereby shorting the lines. Cu/SiC was found to provide a better interface than Cu/SiN.


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