The INCLUSIVE System: A General Framework for Adaptive Industrial Automation

2020 ◽  
pp. 1-14
Author(s):  
Valeria Villani ◽  
Lorenzo Sabattini ◽  
Paulina Baranska ◽  
Enrico Callegati ◽  
Julia N. Czerniak ◽  
...  
Keyword(s):  
General Framework ◽  
Industrial Automation ◽  
System A ◽  
Inclusive System

Simple Systems

2017 ◽  
Author(s):  
Jochen Rau
Keyword(s):  
Magnetic Field ◽  
Low Temperatures ◽  
General Framework ◽  
Gibbs State ◽  
Macroscopic System ◽  
Basic Model ◽  
System A ◽  
Paramagnetic Salt ◽  
High And Low Temperatures ◽  
Simple Systems

Even though the general framework of statistical mechanics is ultimately targeted at the description of macroscopic systems, it is illustrative to apply it first to some simple systems: a harmonic oscillator, a rotor, and a spin in a magnetic field. These applications serve to illustrate how a key function associated with the Gibbs state, the so-called partition function, is calculated in practice, how the entropy function is obtained via a Legendre transformation, and how such systems behave in the limits of high and low temperatures. After discussing these simple systems, this chapter considers a first example where multiple constituents are assembled into a macroscopic system: a basic model of a paramagnetic salt. It also investigates the size of energy fluctuations and how—in the case of the paramagnet—these fluctuations scale with the number of constituents.

scholarly journals In Situ Holothurian Noncontact Counting System: A General Framework for Holothurian Counting

IEEE Access ◽  
2020 ◽  
Vol 8 ◽  
pp. 210041-210053
Author(s):  
Xinliang Zhang ◽  
Huimin Zeng ◽  
Xiang Liu ◽  
Zhibin Yu ◽  
Haiyong Zheng ◽  
...  
Keyword(s):  
General Framework ◽  
Counting System ◽  
System A

scholarly journals Imperfect maintenance in a generalized competing risks framework

2006 ◽  
Vol 43 (03) ◽  
pp. 825-839 ◽  
Author(s):  
Laurent Doyen ◽  
Olivier Gaudoin
Keyword(s):  
Competing Risks ◽  
Preventive Maintenance ◽  
General Framework ◽  
Imperfect Maintenance ◽  
Repairable Systems ◽  
New Class ◽  
Virtual Age ◽  
System A ◽  
Age Model ◽  
The One

In this paper we present a general framework for the modelling of the process of corrective and condition-based preventive maintenance actions for complex repairable systems. A new class of models is proposed, the generalized virtual age models. On the one hand, these models generalize Kijima's virtual age models to the case where both preventive and corrective maintenances are present. On the other hand, they generalize the usual competing risks models to imperfect maintenance actions which do not renew the system. A generalized virtual age model is defined by both a sequence of effective ages which characterizes the effects of both types of maintenance according to a classical virtual age model, and a usual competing risks model which characterizes the dependency between the two types of maintenance. Several particular cases of the general model are derived.

scholarly journals Imperfect maintenance in a generalized competing risks framework

2006 ◽  
Vol 43 (3) ◽  
pp. 825-839 ◽  
Author(s):  
Laurent Doyen ◽  
Olivier Gaudoin
Keyword(s):  
Competing Risks ◽  
Preventive Maintenance ◽  
General Framework ◽  
Imperfect Maintenance ◽  
Repairable Systems ◽  
New Class ◽  
Virtual Age ◽  
System A ◽  
Age Model ◽  
The One

In this paper we present a general framework for the modelling of the process of corrective and condition-based preventive maintenance actions for complex repairable systems. A new class of models is proposed, the generalized virtual age models. On the one hand, these models generalize Kijima's virtual age models to the case where both preventive and corrective maintenances are present. On the other hand, they generalize the usual competing risks models to imperfect maintenance actions which do not renew the system. A generalized virtual age model is defined by both a sequence of effective ages which characterizes the effects of both types of maintenance according to a classical virtual age model, and a usual competing risks model which characterizes the dependency between the two types of maintenance. Several particular cases of the general model are derived.

New Design for a Differentially Pumped Hydration Chamber for a Siemens IA

1971 ◽  
Vol 29 ◽  
pp. 44-45
Author(s):  
R. C. Moretz ◽  
G. G. Hausner ◽  
D. F. Parsons
Keyword(s):  
Electron Microscopy ◽  
Water Vapor ◽  
Electron Diffraction ◽  
Water Vapor Pressure ◽  
Biological Materials ◽  
Thin Membrane ◽  
Reliable System ◽  
System A ◽  
Water Films ◽  
Aperture Opening

Electron microscopy and diffraction of biological materials in the hydrated state requires the construction of a chamber in which the water vapor pressure can be maintained at saturation for a given specimen temperature, while minimally affecting the normal vacuum of the remainder of the microscope column. Initial studies with chambers closed by thin membrane windows showed that at the film thicknesses required for electron diffraction at 100 KV the window failure rate was too high to give a reliable system. A single stage, differentially pumped specimen hydration chamber was constructed, consisting of two apertures (70-100μ), which eliminated the necessity of thin membrane windows. This system was used to obtain electron diffraction and electron microscopy of water droplets and thin water films. However, a period of dehydration occurred during initial pumping of the microscope column. Although rehydration occurred within five minutes, biological materials were irreversibly damaged. Another limitation of this system was that the specimen grid was clamped between the apertures, thus limiting the yield of view to the aperture opening.

High-resolution electron microscopy of Cu2O surfaces

1986 ◽  
Vol 44 ◽  
pp. 396-397
Author(s):  
V. Castano ◽  
W. Krakow
Keyword(s):  
High Resolution ◽  
Natural Extension ◽  
High Resolution Electron Microscopy ◽  
Point Of View ◽  
Initial Oxidation ◽  
System A ◽  
Resolution Electron ◽  
Surface Reconstructions ◽  
Atomic Surface ◽  
Au Thin Films

In non-UHV microscope environments atomic surface structure has been observed for flat-on for various orientations of Au thin films and edge-on for columns of atoms in small particles. The problem of oxidation of surfaces has only recently been reported from the point of view of high resolution microscopy revealing surface reconstructions for the Ag2O system. A natural extension of these initial oxidation studies is to explore other materials areas which are technologically more significant such as that of Cu2O, which will now be described.

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