DiSC: A New Diagnosis Method for Multiple Scan Chain Failures

2010 ◽  
Vol 29 (12) ◽  
pp. 2051-2055 ◽  
Author(s):  
Sunghoon Chun ◽  
Alex Orailoglu
Keyword(s):  
Multiple Scan ◽  
Diagnosis Method ◽  
Scan Chain ◽  
New Diagnosis

scholarly journals URINARY MICROPARTICLES AS A NEW DIAGNOSIS METHOD FOR ACUTE KIDNEY GRAFT REJECTION.

2004 ◽  
Vol 78 ◽  
pp. 286
Author(s):  
T Dervaux ◽  
B Hugel ◽  
S Caillard ◽  
B Ellero ◽  
T Hannedouche ◽  
...  
Keyword(s):  
Graft Rejection ◽  
Kidney Graft ◽  
Diagnosis Method ◽  
New Diagnosis

A SAT-Based Pattern Generation Method for Diagnosis Multiple Scan Chain Faults

2011 ◽  
Vol 301-303 ◽  
pp. 989-994
Author(s):  
Fei Wang ◽  
Da Wang ◽  
Hai Gang Yang
Keyword(s):  
Failure Analysis ◽  
Design For Testability ◽  
Pattern Generation ◽  
Diagnostic Process ◽  
High Quality ◽  
Analysis Process ◽  
Short Period ◽  
Multiple Scan ◽  
Scan Chain ◽  
Scan Chain Design

Scan chain design is a widely used design-for-testability (DFT) technique to improve test and diagnosis quality. However, failures on scan chain itself account for up to 30% of chip failures. To diagnose root causes of scan chain failures in a short period is vital to failure analysis process and yield improvements. As the conventional diagnosis process usually runs on the faulty free scan chain, scan chain faults may disable the diagnostic process, leaving large failure area to time-consuming failure analysis. In this paper, a SAT-based technique is proposed to generate patterns to diagnose scan chain faults. The proposed work can efficiently generate high quality diagnostic patterns to achieve high diagnosis resolution. Moreover, the computation overhead of proving equivalent faults is reduced. Experimental results on ISCAS’89 benchmark circuits show that the proposed method can reduce the number of diagnostic patterns while achieving high diagnosis resolution.

The simple optical methods for early diagnosis of selected benign and malignant brain tumors of human

2018 ◽  
Vol 27 (03) ◽  
pp. 1850033 ◽  
Author(s):  
M. Hosseinzadeh ◽  
S. Salmani ◽  
M. H. Majles Ara ◽  
S. Mohajer
Keyword(s):  
Brain Tumors ◽  
Human Brain ◽  
Brain Tissue ◽  
Optical Density ◽  
Nonlinear Behavior ◽  
Optical Methods ◽  
Positive Sign ◽  
Human Brain Tissue ◽  
Diagnosis Method ◽  
New Diagnosis

The optical properties of benign and malignant human brain tumors were investigated to provide a new diagnosis method. We studied various samples of adult human brain tissue (male and female) in two linear (by Optical density) and nonlinear (by Z-scan method) regimes. The obtained experimental results show that optical density for malignant is more than benign tissues and the nonlinear behavior of benign and malignant tissues are completely different because the nonlinear refractive index had a negative sign for benign tumor and a positive sign for malignant tumor. Results can be used for diagnosis between benign and malignant brain tissue.

scholarly journals Scan-Chain-Fault Diagnosis Using Regressions in Cryptographic Chips for Wireless Sensor Networks

Sensors ◽  
2020 ◽  
Vol 20 (17) ◽  
pp. 4771
Author(s):  
Hyunyul Lim ◽  
Minho Cheong ◽  
Sungho Kang
Keyword(s):  
Wireless Sensor Networks ◽  
Sensor Networks ◽  
Large Scale ◽  
Vlsi Circuits ◽  
Wireless Sensor ◽  
Large Scale Integration ◽  
Diagnosis Method ◽  
Diagnosis Accuracy ◽  
Scan Chain ◽  
Scale Integration

Scan structures, which are widely used in cryptographic circuits for wireless sensor networks applications, are essential for testing very-large-scale integration (VLSI) circuits. Faults in cryptographic circuits can be effectively screened out by improving testability and test coverage using a scan structure. Additionally, scan testing contributes to yield improvement by identifying fault locations. However, faults in circuits cannot be tested when a fault occurs in the scan structure. Moreover, various defects occurring early in the manufacturing process are expressed as faults of scan chains. Therefore, scan-chain diagnosis is crucial. However, it is difficult to obtain a sufficiently high diagnosis resolution and accuracy through the conventional scan-chain diagnosis. Therefore, this article proposes a novel scan-chain diagnosis method using regression and fan-in and fan-out filters that require shorter training and diagnosis times than existing scan-chain diagnoses do. The fan-in and fan-out filters, generated using a circuit logic structure, can highlight important features and remove unnecessary features from raw failure vectors, thereby converting the raw failure vectors to fan-in and fan-out vectors without compromising the diagnosis accuracy. Experimental results confirm that the proposed scan-chain-diagnosis method can efficiently provide higher resolutions and accuracies with shorter training and diagnosis times.

Diagnosis of Multiple Scan Chain Faults

2005 ◽  
Author(s):  
Chia Ling Kong ◽  
Mohammed R. Islam
Keyword(s):  
Product Design ◽  
Frequent Occurrence ◽  
Multiple Defects ◽  
Multiple Scan ◽  
Chain Defects ◽  
Logic State ◽  
Scan Chain

Abstract Precise isolation and resolution of scan chain defects are more critical than ever due to increased reliance on scan-based design to achieve desired test content. At the same time, its diagnosis is becoming more difficult as product design increases in complexity alongside shrinking fabrication processes. In this paper, we present a new scan chain diagnosis procedure that is centered on Load Pass Unload Fail/Load Fail Unload Pass (LPUF/LFUP) and Scan Shift Logic State Mapping (SSLSM) techniques to isolate both stuck-at and timing scan chain faults without the design overhead and defect assumptions of previously proposed methods. More importantly, this procedure is extended to analyze scan chain with multiple defects, which is becoming a more frequent occurrence as process scales down in size.

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