A test pattern selection method for a joint bounded-distance and encoding-based decoding algorithm of binary codes [Transactions Letters

Hitoshi Tokushige; Marc C. Foss; Tadao Kasami

doi:10.1109/tcomm.2010.06.0801652

A test pattern selection method for a joint bounded-distance and encoding-based decoding algorithm of binary codes [Transactions Letters

IEEE Transactions on Communications ◽

10.1109/tcomm.2010.06.0801652 ◽

2010 ◽

Vol 58 (6) ◽

pp. 1601-1604

Author(s):

Hitoshi Tokushige ◽

Marc C. Foss ◽

Tadao Kasami

Keyword(s):

Test Pattern ◽

Selection Method ◽

Binary Codes ◽

Pattern Selection ◽

Decoding Algorithm ◽

Bounded Distance ◽

Test Pattern Selection

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An optimal test pattern selection method to improve the defect coverage

IEEE International Conference on Test, 2005. ◽

10.1109/test.2005.1584039 ◽

2006 ◽

Author(s):

Yuxin Tian ◽

M.R. Grimailay ◽

Weiping Shi ◽

M.R. Mercer

Keyword(s):

Test Pattern ◽

Selection Method ◽

Pattern Selection ◽

Defect Coverage ◽

Optimal Test ◽

Test Pattern Selection

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A test pattern selection method for dynamic burn-in of logic circuits based on ATPG technique

2013 IEEE 10th International Conference on ASIC ◽

10.1109/asicon.2013.6811958 ◽

2013 ◽

Cited By ~ 1

Author(s):

Xuan Yang ◽

Xiaole Cui ◽

Chao Wang ◽

Chung-Len Lee

Keyword(s):

Test Pattern ◽

Selection Method ◽

Logic Circuits ◽

Pattern Selection ◽

Test Pattern Selection

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The new test pattern selection method for OPC model calibration, based on the process of clustering in a hybrid space

10.1117/12.953827 ◽

2012 ◽

Cited By ~ 10

Author(s):

Dmitry Vengertsev ◽

Kihyun Kim ◽

Seung-Hune Yang ◽

Seongbo Shim ◽

Seongho Moon ◽

...

Keyword(s):

Model Calibration ◽

Test Pattern ◽

Selection Method ◽

Pattern Selection ◽

Hybrid Space ◽

Test Pattern Selection

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Test Pattern Selection for Defect-Aware Test

2011 Asian Test Symposium ◽

10.1109/ats.2011.24 ◽

2011 ◽

Cited By ~ 2

Author(s):

Yoshinobu Higami ◽

Hiroshi Furutani ◽

Takao Sakai ◽

Shuichi Kameyama ◽

Hiroshi Takahashi

Keyword(s):

Test Pattern ◽

Pattern Selection ◽

Selection For ◽

Test Pattern Selection

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Interconnect-Aware and Layout-Oriented Test-Pattern Selection for Small-Delay Defects

2008 IEEE International Test Conference ◽

10.1109/test.2008.4700627 ◽

2008 ◽

Cited By ~ 33

Author(s):

M. Yilmaz ◽

K. Chakrabarty ◽

M. Tehranipoor

Keyword(s):

Test Pattern ◽

Pattern Selection ◽

Small Delay Defects ◽

Small Delay ◽

Selection For ◽

Delay Defects ◽

Test Pattern Selection

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Selection Method of Test Patterns in Soft-Input and Output Iterative Bounded Distance Decoding Algorithm

Coding, Cryptography and Combinatorics ◽

10.1007/978-3-0348-7865-4_23 ◽

2004 ◽

pp. 331-343

Author(s):

Hitoshi Tokushige ◽

Jun Asatani ◽

Marc P. C. Fossorier ◽

Tadao Kasami

Keyword(s):

Selection Method ◽

Decoding Algorithm ◽

Input And Output ◽

Bounded Distance

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Physically-awareN-detect test pattern selection

2008 Design, Automation and Test in Europe ◽

10.1145/1403375.1403528 ◽

2008 ◽

Cited By ~ 3

Author(s):

Yen-Tzu Lin ◽

Osei Poku ◽

Naresh K. Bhatti ◽

R. D. (Shawn) Blanton

Keyword(s):

Test Pattern ◽

Pattern Selection ◽

Test Pattern Selection

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Test Pattern Selection and Compaction for Sequential Circuits in an HDL Environment

2010 19th IEEE Asian Test Symposium ◽

10.1109/ats.2010.85 ◽

2010 ◽

Cited By ~ 7

Author(s):

M. H. Haghbayan ◽

S. Karamati ◽

F. Javaheri ◽

Z. Navabi

Keyword(s):

Test Pattern ◽

Sequential Circuits ◽

Pattern Selection ◽

Test Pattern Selection

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An Efficient Test Pattern Selection Method for Improving Defect Coverage with Reduced Test Data Volume and Test Application Time

2006 15th Asian Test Symposium ◽

10.1109/ats.2006.260952 ◽

2006 ◽

Cited By ~ 12

Author(s):

Zhanglei Wang ◽

Krishnendu Chakrabarty

Keyword(s):

Test Data ◽

Test Pattern ◽

Selection Method ◽

Pattern Selection ◽

Defect Coverage ◽

Application Time ◽

Test Application Time ◽

Efficient Test ◽

Test Application ◽

Data Volume

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Test pattern selection to optimize delay test quality with a limited size of test set

2010 15th IEEE European Test Symposium ◽

10.1109/etsym.2010.5512733 ◽

2010 ◽

Cited By ~ 1

Author(s):

Michiko Inoue ◽

Akira Taketani ◽

Tomokazu Yoneda ◽

Hiroshi Iwata ◽

Hideo Fujiwara

Keyword(s):

Test Pattern ◽

Pattern Selection ◽

Delay Test ◽

Test Quality ◽

Test Set ◽

Limited Size ◽

Test Pattern Selection

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