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A test pattern selection method for dynamic burn-in of logic circuits based on ATPG technique
2013 IEEE 10th International Conference on ASIC
◽
10.1109/asicon.2013.6811958
◽
2013
◽
Cited By ~ 1
Author(s):
Xuan Yang
◽
Xiaole Cui
◽
Chao Wang
◽
Chung-Len Lee
Keyword(s):
Test Pattern
◽
Selection Method
◽
Logic Circuits
◽
Pattern Selection
◽
Test Pattern Selection
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Cited By
References
An optimal test pattern selection method to improve the defect coverage
IEEE International Conference on Test, 2005.
◽
10.1109/test.2005.1584039
◽
2006
◽
Author(s):
Yuxin Tian
◽
M.R. Grimailay
◽
Weiping Shi
◽
M.R. Mercer
Keyword(s):
Test Pattern
◽
Selection Method
◽
Pattern Selection
◽
Defect Coverage
◽
Optimal Test
◽
Test Pattern Selection
Download Full-text
A test pattern selection method for a joint bounded-distance and encoding-based decoding algorithm of binary codes [Transactions Letters
IEEE Transactions on Communications
◽
10.1109/tcomm.2010.06.0801652
◽
2010
◽
Vol 58
(6)
◽
pp. 1601-1604
Author(s):
Hitoshi Tokushige
◽
Marc C. Foss
◽
Tadao Kasami
Keyword(s):
Test Pattern
◽
Selection Method
◽
Binary Codes
◽
Pattern Selection
◽
Decoding Algorithm
◽
Bounded Distance
◽
Test Pattern Selection
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The new test pattern selection method for OPC model calibration, based on the process of clustering in a hybrid space
10.1117/12.953827
◽
2012
◽
Cited By ~ 10
Author(s):
Dmitry Vengertsev
◽
Kihyun Kim
◽
Seung-Hune Yang
◽
Seongbo Shim
◽
Seongho Moon
◽
...
Keyword(s):
Model Calibration
◽
Test Pattern
◽
Selection Method
◽
Pattern Selection
◽
Hybrid Space
◽
Test Pattern Selection
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Test Pattern Selection for Defect-Aware Test
2011 Asian Test Symposium
◽
10.1109/ats.2011.24
◽
2011
◽
Cited By ~ 2
Author(s):
Yoshinobu Higami
◽
Hiroshi Furutani
◽
Takao Sakai
◽
Shuichi Kameyama
◽
Hiroshi Takahashi
Keyword(s):
Test Pattern
◽
Pattern Selection
◽
Selection For
◽
Test Pattern Selection
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Interconnect-Aware and Layout-Oriented Test-Pattern Selection for Small-Delay Defects
2008 IEEE International Test Conference
◽
10.1109/test.2008.4700627
◽
2008
◽
Cited By ~ 33
Author(s):
M. Yilmaz
◽
K. Chakrabarty
◽
M. Tehranipoor
Keyword(s):
Test Pattern
◽
Pattern Selection
◽
Small Delay Defects
◽
Small Delay
◽
Selection For
◽
Delay Defects
◽
Test Pattern Selection
Download Full-text
Physically-awareN-detect test pattern selection
2008 Design, Automation and Test in Europe
◽
10.1145/1403375.1403528
◽
2008
◽
Cited By ~ 3
Author(s):
Yen-Tzu Lin
◽
Osei Poku
◽
Naresh K. Bhatti
◽
R. D. (Shawn) Blanton
Keyword(s):
Test Pattern
◽
Pattern Selection
◽
Test Pattern Selection
Download Full-text
Test Pattern Selection and Compaction for Sequential Circuits in an HDL Environment
2010 19th IEEE Asian Test Symposium
◽
10.1109/ats.2010.85
◽
2010
◽
Cited By ~ 7
Author(s):
M. H. Haghbayan
◽
S. Karamati
◽
F. Javaheri
◽
Z. Navabi
Keyword(s):
Test Pattern
◽
Sequential Circuits
◽
Pattern Selection
◽
Test Pattern Selection
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An Efficient Test Pattern Selection Method for Improving Defect Coverage with Reduced Test Data Volume and Test Application Time
2006 15th Asian Test Symposium
◽
10.1109/ats.2006.260952
◽
2006
◽
Cited By ~ 12
Author(s):
Zhanglei Wang
◽
Krishnendu Chakrabarty
Keyword(s):
Test Data
◽
Test Pattern
◽
Selection Method
◽
Pattern Selection
◽
Defect Coverage
◽
Application Time
◽
Test Application Time
◽
Efficient Test
◽
Test Application
◽
Data Volume
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Test pattern selection to optimize delay test quality with a limited size of test set
2010 15th IEEE European Test Symposium
◽
10.1109/etsym.2010.5512733
◽
2010
◽
Cited By ~ 1
Author(s):
Michiko Inoue
◽
Akira Taketani
◽
Tomokazu Yoneda
◽
Hiroshi Iwata
◽
Hideo Fujiwara
Keyword(s):
Test Pattern
◽
Pattern Selection
◽
Delay Test
◽
Test Quality
◽
Test Set
◽
Limited Size
◽
Test Pattern Selection
Download Full-text
On Achieving Maximal Chain Diagnosis Resolution through Test Pattern Selection
2016 IEEE 25th Asian Test Symposium (ATS)
◽
10.1109/ats.2016.22
◽
2016
◽
Cited By ~ 2
Author(s):
Xijiang Lin
◽
Sudhakar M. Reddy
◽
Wu-Tung Cheng
Keyword(s):
Test Pattern
◽
Maximal Chain
◽
Pattern Selection
◽
Test Pattern Selection
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