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Test pattern selection to optimize delay test quality with a limited size of test set
2010 15th IEEE European Test Symposium
◽
10.1109/etsym.2010.5512733
◽
2010
◽
Cited By ~ 1
Author(s):
Michiko Inoue
◽
Akira Taketani
◽
Tomokazu Yoneda
◽
Hiroshi Iwata
◽
Hideo Fujiwara
Keyword(s):
Test Pattern
◽
Pattern Selection
◽
Delay Test
◽
Test Quality
◽
Test Set
◽
Limited Size
◽
Test Pattern Selection
Download Full-text
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Test Pattern Selection for Defect-Aware Test
2011 Asian Test Symposium
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10.1109/ats.2011.24
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2011
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Author(s):
Yoshinobu Higami
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Hiroshi Furutani
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Takao Sakai
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Shuichi Kameyama
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Hiroshi Takahashi
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Interconnect-Aware and Layout-Oriented Test-Pattern Selection for Small-Delay Defects
2008 IEEE International Test Conference
◽
10.1109/test.2008.4700627
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2008
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Author(s):
M. Yilmaz
◽
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Small Delay Defects
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Small Delay
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An optimal test pattern selection method to improve the defect coverage
IEEE International Conference on Test, 2005.
◽
10.1109/test.2005.1584039
◽
2006
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Author(s):
Yuxin Tian
◽
M.R. Grimailay
◽
Weiping Shi
◽
M.R. Mercer
Keyword(s):
Test Pattern
◽
Selection Method
◽
Pattern Selection
◽
Defect Coverage
◽
Optimal Test
◽
Test Pattern Selection
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Physically-awareN-detect test pattern selection
2008 Design, Automation and Test in Europe
◽
10.1145/1403375.1403528
◽
2008
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Cited By ~ 3
Author(s):
Yen-Tzu Lin
◽
Osei Poku
◽
Naresh K. Bhatti
◽
R. D. (Shawn) Blanton
Keyword(s):
Test Pattern
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Pattern Selection
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Test Pattern Selection
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Test Pattern Selection and Compaction for Sequential Circuits in an HDL Environment
2010 19th IEEE Asian Test Symposium
◽
10.1109/ats.2010.85
◽
2010
◽
Cited By ~ 7
Author(s):
M. H. Haghbayan
◽
S. Karamati
◽
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◽
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Keyword(s):
Test Pattern
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Sequential Circuits
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Pattern Selection
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A test pattern selection method for dynamic burn-in of logic circuits based on ATPG technique
2013 IEEE 10th International Conference on ASIC
◽
10.1109/asicon.2013.6811958
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2013
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Cited By ~ 1
Author(s):
Xuan Yang
◽
Xiaole Cui
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Chao Wang
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Keyword(s):
Test Pattern
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Selection Method
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Pattern Selection
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Test Pattern Selection
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A test pattern selection method for a joint bounded-distance and encoding-based decoding algorithm of binary codes [Transactions Letters
IEEE Transactions on Communications
◽
10.1109/tcomm.2010.06.0801652
◽
2010
◽
Vol 58
(6)
◽
pp. 1601-1604
Author(s):
Hitoshi Tokushige
◽
Marc C. Foss
◽
Tadao Kasami
Keyword(s):
Test Pattern
◽
Selection Method
◽
Binary Codes
◽
Pattern Selection
◽
Decoding Algorithm
◽
Bounded Distance
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Test Pattern Selection
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On Achieving Maximal Chain Diagnosis Resolution through Test Pattern Selection
2016 IEEE 25th Asian Test Symposium (ATS)
◽
10.1109/ats.2016.22
◽
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◽
Cited By ~ 2
Author(s):
Xijiang Lin
◽
Sudhakar M. Reddy
◽
Wu-Tung Cheng
Keyword(s):
Test Pattern
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Maximal Chain
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Pattern Selection
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Test Pattern Selection
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On High-Quality Test Pattern Selection and Manipulation
2011 Sixteenth IEEE European Test Symposium
◽
10.1109/ets.2011.49
◽
2011
◽
Author(s):
Feng Yuan
◽
Xiao Liu
◽
Qiang Xu
Keyword(s):
Test Pattern
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Pattern Selection
◽
Quality Test
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High Quality
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Test Pattern Selection
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Test Pattern Selection and Customization Targeting Reduced Dynamic and Leakage Power Consumption
2009 Asian Test Symposium
◽
10.1109/ats.2009.35
◽
2009
◽
Cited By ~ 2
Author(s):
Subhadip Kundu
◽
Krishna Kumar S.
◽
Santanu Chattopadhyay
Keyword(s):
Power Consumption
◽
Test Pattern
◽
Leakage Power
◽
Pattern Selection
◽
Test Pattern Selection
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Reduced Dynamic
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