Variability in Si Nanowire MOSFETs Due to the Combined Effect of Interface Roughness and Random Dopants: A Fully Three-Dimensional NEGF Simulation Study
2010 ◽
Vol 57
(7)
◽
pp. 1626-1635
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Keyword(s):
2009 ◽
Vol 56
(7)
◽
pp. 1388-1395
◽
2007 ◽
Vol 46
(4B)
◽
pp. 2112-2116
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Keyword(s):
2011 ◽
Vol 58
(5)
◽
pp. 1371-1380
◽
Keyword(s):
2008 ◽
Vol 55
(4)
◽
pp. 1094-1095
◽
Keyword(s):
Three Dimensional Simulation Study of the Magnetohydrodynamic Relaxation Process in the Solar Corona
1996 ◽
pp. 587-588
Keyword(s):