Improved Subthreshold and Output Characteristics of Source-Pocket Si Tunnel FET by the Application of Laser Annealing

2013 ◽  
Vol 60 (1) ◽  
pp. 92-96 ◽  
Author(s):  
Hsu-Yu Chang ◽  
Bruce Adams ◽  
Po-Yen Chien ◽  
Jiping Li ◽  
Jason C. S. Woo
2019 ◽  
Vol 11 (12) ◽  
pp. 1225-1230
Author(s):  
Suman Lata Tripathi

Low voltage application of Tunnel FET with steep subthreshold slope, has potential to replace its MOSFET counterpart for future scaling due to thermal limits imposed on nano-level transistors. Longer channel region increases the tunneling area results in increasing tunneling current and decreasing miller capacitance to improve device switching performance for digital application. A new pocket tunnel junction-less UTFET (JLUTFET) exploits increased channel length with U shape and high ON current capability of junction-less transistor provide better device performance in subthreshold region showing improvement in ION/IOFF(∼109) as compared to other similar conventional TFET and vertical TFET structures. The proposed nJLUTFET also shows lower drain induced barrier lowering (<20 mV/V) and near to ideal subthreshold slope (∼66 mV/decade). The temperature analysis plays a vital role to decide a stable ON and OFF-state performance of transistors. So, the proposed pocket JLUTFET is investigated for temperature variations (ranging 250–400 K) to characterize the performance such as transfer characteristics, Output characteristics and ION/IOFF ratio. The proposed n-channel JLUTFET has been designed on visual TCAD 2D/3D device simulator.


2019 ◽  
Vol 40 (6) ◽  
pp. 1001-1004 ◽  
Author(s):  
Yunhe Guan ◽  
Zunchao Li ◽  
Hamilton Carrillo-Nunez ◽  
Yefei Zhang ◽  
Vihar P. Georgiev ◽  
...  

1988 ◽  
Vol 49 (C8) ◽  
pp. C8-1325-C8-1326
Author(s):  
P. Sánchez ◽  
M. C. Sánchez ◽  
E. López ◽  
M. García ◽  
C. Aroca

1993 ◽  
Vol 113 (6) ◽  
pp. 753-759 ◽  
Author(s):  
Kuniho Tanaka ◽  
Etsuo Sakoguchi ◽  
Eiji Yamada

2012 ◽  
Vol 132 (9) ◽  
pp. 922-930 ◽  
Author(s):  
Hirofumi Aoki ◽  
Tadashi Fukami ◽  
Kazuo Shima ◽  
Toshihiro Tsuda ◽  
Mitsuhiro Kawamura

2016 ◽  
Vol 136 (12) ◽  
pp. 493-498 ◽  
Author(s):  
Junko Kazusa ◽  
Kazuhiro Koga ◽  
Norio Umeyama ◽  
Fumito Imura ◽  
Daiji Noda ◽  
...  

1980 ◽  
Vol 3 ◽  
Author(s):  
M. Van Rossum ◽  
I. Dezsi ◽  
G. Langouche ◽  
J. De Bruyn ◽  
R. Coussement

ABSTRACTThe laser annealing behaviour of Te-implanted GaAs, GaSb, GaP and InP has been studied by Mössbauer Spectroscopy. The spectra of the as-implanted samples are characterized by a quadrupole split multiplet, showing that the Te ions come to rest at non-substitutional lattice sites. The laser annealing is shown to shift the implanted impurities towards substitutional positions. The efficiency of the laser annealing procedure is very similar for all lattices under study.


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