Numerical Simulation of N+ Source Pocket PIN-GAA-Tunnel FET: Impact of Interface Trap Charges and Temperature
2017 ◽
Vol 64
(4)
◽
pp. 1482-1488
◽
2017 ◽
Vol 17
(1)
◽
pp. 245-252
◽
2019 ◽
Vol 102
◽
pp. 1-8
◽
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