An analysis of interface trap charges to improve the reliability of a charge-plasma-based nanotube tunnel FET

Author(s):  
Anju Gedam ◽  
Bibhudendra Acharya ◽  
Guru Prasad Mishra
2017 ◽  
Vol 17 (1) ◽  
pp. 245-252 ◽  
Author(s):  
Pulimamidi Venkatesh ◽  
Kaushal Nigam ◽  
Sunil Pandey ◽  
Dheeraj Sharma ◽  
Pravin N. Kondekar

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