An analysis of interface trap charges to improve the reliability of a charge-plasma-based nanotube tunnel FET
2019 ◽
Vol 66
(10)
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pp. 4453-4460
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2017 ◽
Vol 17
(1)
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pp. 245-252
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2019 ◽
Vol 102
◽
pp. 1-8
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2017 ◽
Vol 64
(4)
◽
pp. 1482-1488
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2020 ◽
Vol 49
(4)
◽
pp. 2349-2357
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Keyword(s):
2019 ◽
Vol 66
(6)
◽
pp. 2837-2843
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Keyword(s):