Charge-Based Model for the Drain-Current Variability in Organic Thin-Film Transistors Due to Carrier-Number and Correlated- Mobility Fluctuation
2020 ◽
Vol 67
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pp. 4667-4671
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pp. 559-563
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pp. 145106
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pp. 4423-4431
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2020 ◽
Vol 67
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pp. 5091-5096
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Vol 91
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pp. 1360-1366
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