Fast path selection for testing of small delay defects considering path correlations

2010 28th VLSI Test Symposium (VTS) ◽

10.1109/vts.2010.5469628 ◽

2010 ◽

Cited By ~ 7

Author(s):

Zijian He ◽

Tao Lv ◽

Huawei Li ◽

Xiaowei Li

Keyword(s):

Path Selection ◽

Small Delay Defects ◽

Small Delay ◽

Selection For ◽

Delay Defects

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Graph partition based path selection for testing of small delay defects

2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC) ◽

10.1109/aspdac.2010.5419831 ◽

2010 ◽

Cited By ~ 1

Author(s):

Zijian He ◽

Tao Lv ◽

Huawei Li ◽

Xiaowei Li

Keyword(s):

Path Selection ◽

Graph Partition ◽

Small Delay Defects ◽

Small Delay ◽

Selection For ◽

Delay Defects

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Interconnect-Aware and Layout-Oriented Test-Pattern Selection for Small-Delay Defects

2008 IEEE International Test Conference ◽

10.1109/test.2008.4700627 ◽

2008 ◽

Cited By ~ 33

Author(s):

M. Yilmaz ◽

K. Chakrabarty ◽

M. Tehranipoor

Keyword(s):

Test Pattern ◽

Pattern Selection ◽

Small Delay Defects ◽

Small Delay ◽

Selection For ◽

Delay Defects ◽

Test Pattern Selection

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A heuristic path selection method for small delay defects test

2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ◽

10.1109/dft.2014.6962082 ◽

2014 ◽

Cited By ~ 1

Author(s):

Paniz Foroutan ◽

Mehdi Kamal ◽

Zainalabedin Navabi

Keyword(s):

Selection Method ◽

Path Selection ◽

Small Delay Defects ◽

Small Delay ◽

Delay Defects

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High-quality pattern selection for screening small-delay defects considering process variations and crosstalk

2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) ◽

10.1109/date.2010.5457036 ◽

2010 ◽

Cited By ~ 10

Author(s):

Ke Peng ◽

Mahmut Yilmaz ◽

Mohammad Tehranipoor ◽

Krishnendu Chakrabarty

Keyword(s):

Process Variations ◽

Pattern Selection ◽

High Quality ◽

Small Delay Defects ◽

Small Delay ◽

Selection For ◽

Delay Defects

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Test compaction for small-delay defects using an effective path selection scheme

ACM Transactions on Design Automation of Electronic Systems ◽

10.1145/2491477.2491488 ◽

2013 ◽

Vol 18 (3) ◽

pp. 1-23 ◽

Cited By ~ 12

Author(s):

Dong Xiang ◽

Jianbo Li ◽

Krishnendu Chakrabarty ◽

Xijiang Lin

Keyword(s):

Path Selection ◽

Selection Scheme ◽

Test Compaction ◽

Small Delay Defects ◽

Small Delay ◽

Delay Defects ◽

Effective Path

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Impact of Hazards on Pattern Selection for Small Delay Defects

2009 15th IEEE Pacific Rim International Symposium on Dependable Computing ◽

10.1109/prdc.2009.17 ◽

2009 ◽

Cited By ~ 2

Author(s):

Jie Wang ◽

Huawei Li ◽

Yinghua Min ◽

Xiaowei Li ◽

Huaguo Liang

Keyword(s):

Pattern Selection ◽

Small Delay Defects ◽

Small Delay ◽

Selection For ◽

Delay Defects

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Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep Submicrometer Integrated Circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2010.2043591 ◽

2010 ◽

Vol 29 (5) ◽

pp. 760-773 ◽

Cited By ~ 41

Author(s):

Mahmut Yilmaz ◽

Krishnendu Chakrabarty ◽

Mohammad Tehranipoor

Keyword(s):

Integrated Circuits ◽

Test Pattern ◽

Pattern Selection ◽

Small Delay Defects ◽

Small Delay ◽

Deep Submicrometer ◽

Selection For ◽

Delay Defects ◽

Test Pattern Selection

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Test-Pattern Grading and Pattern Selection for Small-Delay Defects

26th IEEE VLSI Test Symposium (vts 2008) ◽

10.1109/vts.2008.32 ◽

2008 ◽

Cited By ~ 51

Author(s):

Mahmut Yilmaz ◽

Krishnendu Chakrabarty ◽

Mohammad Tehranipoor

Keyword(s):

Test Pattern ◽

Pattern Selection ◽

Small Delay Defects ◽

Pattern Grading ◽

Small Delay ◽

Selection For ◽

Delay Defects

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Tolerance to Small Delay Defects by Adaptive Clock Stretching

13th IEEE International On-Line Testing Symposium (IOLTS 2007) ◽

10.1109/iolts.2007.67 ◽

2007 ◽

Cited By ~ 4

Author(s):

Swaroop Ghosh ◽

Patrick N Dai ◽

Swarup Bhunia ◽

Kaushik Roy

Keyword(s):

Small Delay Defects ◽

Small Delay ◽

Delay Defects

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A Novel Test Generation Method for Small-Delay Defects with User-Defined Fault Model

2019 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) ◽

10.1109/vlsi-dat.2019.8741773 ◽

2019 ◽

Author(s):

Chao-Jun Shang ◽

Cheng-Hung Wu ◽

Kuen-Jong Lee ◽

Yu-Hsiang Chen

Keyword(s):

Test Generation ◽

Fault Model ◽

Small Delay Defects ◽

Small Delay ◽

Delay Defects

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