Effects of Confinement and Surface Reconstruction on the Lattice Dynamics and Thermal Transport Properties of Thin Films

Author(s):  
Joseph E. Turney ◽  
A. J. H. McGaughey ◽  
C. H. Amon

Phonon transport in argon and silicon thin films is examined using harmonic lattice dynamics theory and the Lennard-Jones and Stillinger-Weber potentials. Film thicknesses ranging from 0.8 to 33.5 nm for argon and 0.4 to 8.6 nm for silicon are examined at a temperature of 0 K. Both reconstructed films and films built using the bulk unit cell are considered. Phonon dispersion curves for the in-plane direction and the density of states are computed from lattice dynamics and compared to predictions for a bulk system. The results from the lattice dynamics calculations are used to predict the thermal conductivities of the bulk and thin film structures.

Author(s):  
Bruce L. Davis ◽  
Mehmet Su ◽  
Ihab El-Kady ◽  
Mahmoud I. Hussein

Thin films composed of dielectric materials are attracting growing interest in the solid state physics and nanoscale heat transfer communities. This is primarily due to their unique thermal and electronic properties and their extensive use as components in optoelectronic, and potentially in thermoelectric, devices. In this paper, an elaborate study is presented on silicon thin films ranging from a few nanometers in thickness to very thick bulk-like thicknesses. Full lattice dynamics calculations are performed incorporating the entire film cross section and the relaxation of the free surfaces. The phonon properties emerging from these calculations are then incorporated into Holland-Callaway models to predict the thermal conductivity and other phonon transport properties. A rigorous curve fitting process to a limited set of available experimental data is carried out to obtain the scattering lifetimes. Our results demonstrate the importance of proper consideration of the full thin-film dispersion description and provide insights into the relationship between thermal conductivity, film thickness and temperature.


2000 ◽  
Vol 609 ◽  
Author(s):  
DJ. Santjojo ◽  
J.C.L. Cornish ◽  
M.O.G. Talukder

ABSTRACTNon-infrared-active hydrogen bonding species were investigated by analyzing the infrared spectra and the calibrated temperature desorption spectroscopy (CTDS) spectra of hydrogen released during degassing of hydrogenated amorphous silicon thin films. Samples were degassed gradually using a linear temperature ramp (0.5°C/s). Each stage corresponds to a temperature at which the hydrogen effusion peaks can be found (~ 340°C, ~ 500°C and ~ 610°C). Differences in the amounts of hydrogen obtained from the FTIR spectra and the CTDS measurement correspond to the non-infrared-active, occluded hydrogen.


1975 ◽  
Vol 53 (16) ◽  
pp. 1507-1512 ◽  
Author(s):  
V. K. Jindal

The phonon dispersion curves for sodium and potassium have been calculated using the one OPW (orthogonalized plane wave) bare electron matrix elements and the dielectric function of Vashishta and Singwi. Results are compared with experimental results as well as with similar calculations using the dielectric function of Geldart and Taylor. It is found that the screening function of Vashishta and Singwi gives at least as good an agreement with experimental values as obtained from the screening function of Geldart and Taylor. The interionic potentials for these metals have also been calculated and compared with similar calculations done previously. The reason for the appreciable difference between the potentials is discussed.


1998 ◽  
Vol 76 (2) ◽  
pp. 143-151
Author(s):  
J S Ononiwu

A phenomenological one-parameter model potential that includes sp-d hybridization and core--core exchange contributions is used to calculate the phonon dispersion curves in the lattice dynamics of the body-centered cubic alkaline-earth metal, barium. There is good overall agreement between theory and experiment, and in particular, in the [xi00] direction we obtained frequencies of the transverse dispersion curves that are lower than those of the longitudinal dispersion curves along the [100] symmetry direction thereby restoring the normal ordering of the branches.PACS Nos.: 63.20D


2015 ◽  
Vol 3 (2) ◽  
pp. 239-242 ◽  
Author(s):  
Sung Jin Park ◽  
Hyeon Mo Cho ◽  
Myong Euy Lee ◽  
Miyoung Kim ◽  
Kwenwoo Han ◽  
...  

Silicon thin films that fulfil the needs of current semiconductor lithography were prepared from a new class of polycyclosilane–polysiloxane hybrid materials.


2007 ◽  
Vol 280-283 ◽  
pp. 1147-1148 ◽  
Author(s):  
Hai Feng Li ◽  
Yong Huang ◽  
Zhi Jian Wan ◽  
Hou Xing Zhang ◽  
Li Ming Zhang ◽  
...  

The thin-film of silicon deposited by RTCVD on pressureless sintered SiC substrate with the size of 30mm×20mm, which is cleaned by ultrasonic method and chemical treatment. The crystal size of silicon columnar grain can reach 190 µm and its preferred orientation is [111] after ZMR process.


Sign in / Sign up

Export Citation Format

Share Document